Semiconductor die, semiconductor package and substrate dicing method
US-2024421000-A1 · Dec 19, 2024 · US
US9685378B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9685378-B2 |
| Application number | US-201615264031-A |
| Country | US |
| Kind code | B2 |
| Filing date | Sep 13, 2016 |
| Priority date | Sep 14, 2015 |
| Publication date | Jun 20, 2017 |
| Grant date | Jun 20, 2017 |
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Official abstract text for this publication.
Disclosed herein is a method of dividing rectangular plate-shaped workpieces into individual device chips including a detecting step wherein an annular frame to which a plurality of rectangular plate-shaped workpieces are stuck is held on a chuck table and the positions and angles of the projected dicing lines on each of the plate-shaped workpieces are detected, and a dividing step wherein a laser beam having a wavelength which is absorbable by the plate-shaped workpieces is applied from a laser beam applying unit to the plate-shaped workpieces while the chuck table and the laser beam applying unit are being relatively processing-fed and finely adjusted for each of the plate-shaped workpieces on the basis of the positions and angles detected in the detecting step, thereby dividing the plate-shaped workpieces into a plurality of device chips along the projected dicing lines.
Opening claim text (preview).
What is claimed is: 1. A method of dividing rectangular plate-shaped workpieces into individual device chips, each of the plate-shaped workpieces having a plurality of devices formed in areas demarcated by projected dicing lines and arranged in at least one array, the method comprising: a plate-shaped workpiece sticking step of sticking an adhesive tape to an annular frame having an opening and sticking the rectangular plate-shaped workpieces to a surface of the adhesive tape in such a pattern that the plate-shaped workpieces have shorter sides spaced from each other by predetermined distances in aligned arrays within the opening; a detecting step, after performing the plate-shaped workpiece sticking step, of holding the annular frame to which the plurality of rectangular plate-shaped workpieces are stuck on a chuck table of a laser processing apparatus and detecting positions and angles of the projected dicing lines on each of the plate-shaped workpieces, with detecting means; and a dividing step, after performing the detecting step, of applying a laser beam having a wavelength which is absorbable by the plate-shaped workpieces from laser beam applying means to the plate-shaped workpieces while the chuck table and the laser beam applying means are being relatively processing-fed and finely adjusted for each of the plate-shaped workpieces on the basis of the positions and angles detected in the detecting step, thereby dividing the plate-shaped workpieces into a plurality of device chips along the projected dicing lines.
Structural properties, e.g. testing or measuring thicknesses, line widths, warpage, bond strengths or physical defects · CPC title
Cutting or separating of wafers, substrates or parts of devices · CPC title
by boring or cutting · CPC title
Semiconductor devices · CPC title
Printed circuits · CPC title
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