Electrical Testing for Panel Characterization and Defect Screening
US-2024402237-A1 · Dec 5, 2024 · US
US9653527B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9653527-B2 |
| Application number | US-201514927324-A |
| Country | US |
| Kind code | B2 |
| Filing date | Oct 29, 2015 |
| Priority date | Mar 30, 2015 |
| Publication date | May 16, 2017 |
| Grant date | May 16, 2017 |
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A display apparatus comprising: a base comprising; a substrate, a plurality of pixel electrodes formed over the substrate, and a pixel definition layer formed over the plurality of pixel electrodes; and an intermediate layer formed over each of the plurality of pixel electrodes of the base. In one implementation, the base is divided into a plurality of areas which comprises a first area and a second area, wherein the intermediate layer formed over the first area of the base has a first thickness, and the intermediate layer formed over the second area of the base has a second thickness substantially different from the first thickness wherein the intermediate layer comprises a common layer and a functional layer, and wherein the common layer of the intermediate layer formed over the first area of the base has a thickness substantially different from that of the common layer of the intermediate layer formed over the second area of the base.
Opening claim text (preview).
What is claimed is: 1. A display apparatus comprising: a base comprising; a substrate, a plurality of pixel electrodes formed over the substrate, and a pixel definition layer formed over the plurality of pixel electrodes; and an intermediate layer formed over each of the plurality of pixel electrodes of the base, wherein the base is divided into a plurality of areas which comprises a first area and a second area, wherein the intermediate layer formed over the first area of the base has a first thickness, and the intermediate layer formed over the second area of the base has a second thickness substantially different from the first thickness, wherein the intermediate layer comprises a common layer and a functional layer, and wherein the common layer of the intermediate layer formed over the first area of the base has a thickness substantially different from that of the common layer of the intermediate layer formed over the second area of the base. 2. The display apparatus of claim 1 , wherein the first and second areas have first and second reflectivities, respectively, wherein the first and second reflectivities are substantially different from each other. 3. A display apparatus comprising: a base comprising; a substrate, a plurality of pixel electrodes form over the substrate, and a pixel definition layer formed over the plurality of pixel electrodes; and an intermediate layer formed over each of the plurality of pixel electrodes of the base, wherein the base is divided into a plurality of areas which comprises a first area and a second area, wherein the intermediate layer formed over the first area of the base has a first thickness, and the intermediate layer formed over the second area of the base has a second thickness substantially different from the first thickness, wherein the intermediate layer having the first thickness and the intermediate layer having the second thickness comprise a same organic emitting material. 4. The display apparatus of claim 3 , wherein the intermediate layer comprises a common layer and a functional layer, and wherein at least one of the common layer and the functional layer of the intermediate layer formed over the first area of the base has a thickness substantially different from that of at least one of the common layer and the functional layer of the intermediate layer formed over the second area of the base. 5. The display apparatus of claim 3 , wherein the first and second areas have first and second reflectivities, respectively, wherein the first and second reflectivities are substantially different from each other.
characterised by multiple measurements, corrections, marking or sorting processes · CPC title
characterised by the properties tested or measured, e.g. structural or electrical properties · CPC title
Structural properties, e.g. testing or measuring thicknesses, line widths, warpage, bond strengths or physical defects · CPC title
Cleaning or etching treatments · CPC title
Vacuum evaporation · CPC title
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