Magnetic memory element and magnetic memory device
US-9196333-B2 · Nov 24, 2015 · US
US9620708B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9620708-B2 |
| Application number | US-201615177619-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jun 9, 2016 |
| Priority date | Mar 26, 2015 |
| Publication date | Apr 11, 2017 |
| Grant date | Apr 11, 2017 |
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A magnetic material includes a cobalt layer between opposing iron layers. The iron layers include iron and are body-centered cubic (BCC), the cobalt layer comprises cobalt and is BCC or amorphous, and the magnetic material has a perpendicular magnetic anisotropy (PMA).
Opening claim text (preview).
What is claimed is: 1. A magnetic material, comprising: a cobalt layer between opposing iron layers; and a barrier layer between dusting layers arranged on the cobalt layer between opposing dusting layers; wherein the iron layers comprise iron and are body-centered cubic (BCC), the cobalt layer comprises cobalt and is BCC or amorphous, and the magnetic material has a perpendicular magnetic anisotropy (PMA). 2. The magnetic material of claim 1 , wherein the iron layer comprises an iron alloy. 3. The magnetic material of claim 1 , wherein the cobalt layer comprises a cobalt alloy. 4. A magnetic tunnel junction (MTJ) comprising the magnetic material of claim 1 . 5. The magnetic material of claim 1 , wherein iron is present in an amount of at least 50 atomic % (at. %). 6. The magnetic material of claim 1 , wherein cobalt is present in an amount of at least 30 at. %. 7. The MTJ of claim 4 , wherein magnetic material is a magnetic free layer having a variable magnetization direction. 8. A spin torque magnetic random access memory (MRAM) chip comprising the MTJ of claim 4 . 9. The MTJ of claim 7 , wherein the magnetic material is a magnetic fixed layer having an invariable magnetization direction. 10. The MTJ of claim 9 , wherein an insulating tunnel barrier layer is disposed between the magnetic free layer and the magnetic fixed layer. 11. A magnetic material, comprising: alternating layers of an iron layer and a cobalt layer; a barrier layer between dusting layers arranged on the alternating layers; wherein the iron layer comprises iron and is BCC, the cobalt layer comprises cobalt and is BCC or amorphous, and the iron and cobalt layers each have thickness of about 2 to about 10 angstroms (Å). 12. The magnetic material of claim 11 , wherein the magnetic material comprises at least three layers. 13. The magnetic material of claim 11 , wherein the magnetic material further comprises a magnesium oxide layer on a surface of the magnetic material. 14. The magnetic material of claim 11 , wherein the magnesium oxide layer contacts the iron layer.
details concerning the memory cell structure, e.g. the layers of the ferromagnetic memory cell · CPC title
the spacer being semiconducting or insulating, e.g. for spin tunnel junction [STJ] · CPC title
for applying conductive, insulating or magnetic material on a magnetic film {, specially adapted for a thin magnetic film} · CPC title
containing iron or nickel ({H01F10/126} , H01F10/13, H01F10/16 take precedence) · CPC title
Spin-exchange coupled multilayers having at least one layer with perpendicular magnetic anisotropy · CPC title
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