Photonic spectrometry device, corresponding method, and use of the device

US9581703B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9581703-B2
Application numberUS-201214005006-A
CountryUS
Kind codeB2
Filing dateMar 12, 2012
Priority dateMar 14, 2011
Publication dateFeb 28, 2017
Grant dateFeb 28, 2017

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  1. Title

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  2. Abstract

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  5. First independent claim

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  6. CPC / IPC classifications

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Abstract

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A photonic spectrometry device is provided. The photonic spectrometry device includes at least one sensor capable of detecting photons, at least one photon-emitting calibrating source having a reference spectral line, and processing means capable of providing, for the or each sensor, a measurement spectrum corresponding to the measurements, made by the or each sensor, of the radiation from a product during a time interval, and establishing, on the basis of the or each measurement spectrum, a net corrected spectrum according to a measured characteristic line corresponding to the or each calibrating source. The or each calibrating source is positioned outside the or each sensor.

First claim

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What is claimed is: 1. A photonic spectrometry device comprising: at least one sensor configured for detecting photons; at least two photon-emitting calibrating sources having different reference spectral lines; and a processor configured for providing, for the or each sensor a respective measurement spectrum corresponding to the measurements, made by the or each sensor, of the radiation from a product and the calibrating sources during a time interval and establishing, on the basis of the or each measurement spectrum, a corrected net spectrum by recalibrating the or each measurement spectrum so as to make, for each calibrating source, a characteristic spectral line of the respective calibrating source measured simultaneous to the measurement of the radiation from the product by the or each sensor during the time interval coincide with the reference spectral line of that calibrating source. 2. The photonic spectrometry device as recited in claim 1 wherein the processor is configured for establishing each corrected net spectrum by recalibrating the or each corresponding measurement spectrum using at least one determined recalibration affine function so as to make a measured characteristic line measured by the sensor coincide with the reference spectral line of that calibrating source for each calibrating source. 3. The photonic spectrometry device as recited in claim 1 wherein the calibrating sources are positioned outside the or each sensor. 4. The photonic spectrometry device as recited in claim 1 wherein the at least one sensor includes several identical sensors. 5. The photonic spectrometry device as recited in claim 4 wherein each sensor statistically substantially receives a same quantity of photons coming from each calibrating source for same time interval. 6. The photonic spectrometry device as recited in claim 1 further comprising a measurement pot for circulating fluid inside the pot, the pot including, outside the pot, a housing for receiving each calibrating source and a respective housing for receiving the or each sensor. 7. The photonic spectrometry device as recited in claim 1 wherein the at least two photon-emitting calibrating sources include two calibrating sources having reference spectral lines framing a characteristic spectral line of an element to be detected. 8. The photonic spectrometry device as recited in claim 7 wherein the element to be detected is uranium 235 . 9. A method of operating the photonic spectrometry device as recited in claim 1 comprising: measuring, by the photonic spectrometry device, the uranium content of hydrofluoric acid resulting from the manufacture of uranium oxide; measuring, by the photonic spectrometry device, the content level of at least one radioisotope of the effluents of a radioactive recycling facility; or measuring, by the photonic spectrometry device, before discharge, the content level of at least one radioisotope of the effluents of a radioactive material treatment plant. 10. A photonic spectrometry method comprising the following steps: establishing a measurement spectrum from measurement signals provided by a photon-sensitive sensor for a time interval in which radiation is measured for a product emitting radiation and at least two photon-emitting calibrating sources having different reference spectral lines; and establishing a corrected net spectrum by recalibrating the measurement spectrum based on at least one recalibration function determined so as, for each calibrating source, to make a characteristic spectral line of the respective calibrating source measured simultaneous to the measurement of the radiation from the product by the sensor during the time interval coincide with the reference spectral line of that calibrating source. 11. The photonic spectrometry method as recited in claim 10 wherein the radiation is measured in the presence of two calibrating sources, and each elementary spectrum is established by recalibrating the or each measurement spectrum using at least one affine function, based on the recalibration of each calibrating source. 12. The photonic spectrometry method as recited in claim 10 wherein a global spectrum is established as the summation of corrected net spectrums obtained by recalibrating the measurement spectrums established through simultaneous measurements of a same product emitting radiation during the same time interval by several identical sensors. 13. A photonic spectrometry method, comprising the following steps: simultaneously measuring the radiation in a time interval using several photon-sensitive identical sensors for a same product emitting radiation and at least one photon-emitting calibrating source shared by the sensors; establishing a respective measurement spectrum from measurement signals provided by each sensor for the time interval; and establishing a corrected net spectrum from each measurement spectrum by recalibrating each measurement spectrum using a recalibration function determined so as to make a characteristic spectral line of the at least one photon-emitting calibrating source measured simultaneous to the measurement of the radiation from the product by each sensor during the time interval coincide with the reference spectral line of the or each calibrating source. 14. The photonic spectrometry method as recited in claim 13 wherein the radiation is measured in the presence of two calibrating sources, and each elementary spectrum is established by recalibrating the or each measurement spectrum using at least one affine function, based on the recalibration of each calibrating source. 15. The photonic spectrometry method as recited in claim 13 wherein a global spectrum is established as the summation of corrected net spectrums obtained by recalibrating the measurement spectrums established through simultaneous measurements of a same product emitting radiation during the same time interval by several identical sensors.

Assignees

Inventors

Classifications

  • G01T1/36Primary

    Measuring spectral distribution of X-rays or of nuclear radiation {spectrometry (pulse selection circuits per se H03K; investigation of materials by radiation diffraction G01N23/20; spectrometer tubes H01J49/00)} · CPC title

  • G01T1/40Primary

    Stabilisation of spectrometers · CPC title

  • calibration techniques (stabilization of spectrometer G01T1/40) · CPC title

  • G01T7/00Primary

    Details of radiation-measuring instruments · CPC title

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What does patent US9581703B2 cover?
A photonic spectrometry device is provided. The photonic spectrometry device includes at least one sensor capable of detecting photons, at least one photon-emitting calibrating source having a reference spectral line, and processing means capable of providing, for the or each sensor, a measurement spectrum corresponding to the measurements, made by the or each sensor, of the radiation from a pr…
Who is the assignee on this patent?
Berruyer Eric, Areva Np
What technology area does this patent fall under?
Primary CPC classification G01T1/36. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Feb 28 2017 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).