Photonic spectrometry device and method, method for calibrating the device, and use of the device

US9400336B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9400336-B2
Application numberUS-201214005000-A
CountryUS
Kind codeB2
Filing dateMar 12, 2012
Priority dateMar 14, 2011
Publication dateJul 26, 2016
Grant dateJul 26, 2016

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  1. Title

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  2. Abstract

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  5. First independent claim

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Abstract

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A photonic spectrometry device is provided. The photonic spectrometry device comprises several identical spectrometers each spectrometer comprising a radiation sensor and being capable of providing a measurement spectrum corresponding to the measurements of the sensor during a time interval, the spectrometers being capable of performing measurements simultaneously on one same radiation-emitting product and of providing measurement spectra for one same time interval, and a processor capable of determining a net spectrum from each of the measurement spectra provided by the spectrometers for one same time interval, and of determining a global spectrum resulting from the summation of the net spectra determined for one same time interval.

First claim

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What is claimed is: 1. A photonic spectrometry device comprising: several identical photon spectrometers, each spectrometer comprising a radiation sensor and being configured for providing a measurement spectrum corresponding to the measurements of the sensor during a time interval, the spectrometers being configured for performing measurements simultaneously on one same radiation-emitting product and of providing measurement spectra for one same time interval; and a processor configured for determining a net spectrum from each of the measurement spectra provided by the spectrometers in one same time interval, by aligning the measurement spectrum provided by each spectrometer in relation to a spectral line of a measurement spectrum of the spectrometer corresponding to at least one calibration source, and in relation to a reference line of the or of each calibration source, and of determining a global spectrum resulting from the summation of the net spectra determined for one same time interval. 2. The photonic spectrometry device as recited in claim 1 wherein each spectrometer comprises a detection module configured for converting an electric signal emitted by the sensor on detection of a photon and proportional to the energy of the detected photon, to a digital signal representing the energy of the detected photon. 3. The photonic spectrometry device as recited in claim 2 wherein each detection module is adjustable so as to adjust the digital signal provided by the detection module detection as a function of the signal emitted by the associated sensor. 4. The photonic spectrometry device as recited in claim 3 wherein each spectrometer is initially adjusted by calibrating the detection module such that the sensor/detection module pairs of the spectrometers emit substantially the same digital signal in the presence of one same radiation source. 5. The photonic spectrometry device as recited in claim 1 further comprising at least one radiation-emitting calibration source common to the spectrometers, each sensor of the spectrometers statistically receiving substantially one same quantity of photons derived from the or from each calibration source in one same time interval. 6. The photonic spectrometry device as recited in claim 5 wherein the at least one radiation-emitting calibration source common comprises at least two different calibration sources common to the spectrometers. 7. The photonic spectrometry device as recited in claim 6 wherein the at least two different calibration sources include two calibration sources having respective reference spectral lines located either side of a characteristic spectral line of an element to be detected. 8. The photonic spectrometry device as recited in claim 7 wherein the element to be detected is uranium 235. 9. The photonic spectrometry device as recited in claim 1 wherein the processor is configured for determining each net spectrum by aligning each measurement spectrum in relation to a characteristic spectral line of the measurement spectrum corresponding to the or to each calibration source and in relation to a reference line of the or of each calibration source. 10. The photonic spectrometry device as recited in claim 1 wherein the processor is configured for determining at least one alignment function to align the measurement spectra of a spectrometer using a reference measurement spectrum of the spectrometer, the or each alignment function being determined so as to cause the coinciding, for each calibration source, of a characteristic spectral line of the reference measurement spectrum with the reference spectral line of the corresponding calibration source. 11. The photonic spectrometry device as recited in claim 1 wherein the photonic spectrometry device measures gamma-rays or X-rays. 12. A method for calibrating the photonic spectrometry device as recited in claim 1 , comprising the step of: adjusting a detection module configured for converting an electric signal output from the sensor of each spectrometer to a digital signal representing the energy of each detected photon so that the spectrometers provide substantially identical spectra in the presence of one same radiation source. 13. A method of operating the photonic spectrometry device as recited in claim 1 , comprising: measuring, by the photonic spectrometry device, uranium 235 content of hydrofluoric acid resulting from the production of uranium oxide; measuring, by the photonic spectrometry device, the content of at least one radio-isotope in effluent from a plant recycling radioactive materials; or measuring, by the photonic spectrometry device, before discharge, the content of at least one radio-isotope in effluent from a plant treating radioactive materials. 14. A photonic spectrometry method comprising the steps of: providing measurement spectra using identical spectrometers, each measurement spectrum resulting from measurements performed on one same radiation-emitting product during one same time interval by a respective one of the spectrometers; determining a net spectrum from each measurement spectrum by aligning the measurement spectrum in relation to at least one spectral line of a measurement spectrum provided by the spectrometer, the or each spectral line corresponding to a calibration source and in relation to the reference line of the or of each calibration source; and determining a global spectrum resulting from the summation of the net spectra. 15. The method as recited in claim 14 wherein each net spectrum is determined from each measurement spectrum provided by a spectrometer by aligning the measurement spectrum in relation to a spectral line of the measurement spectrum provided by the spectrometer, the spectral line corresponding to at least one calibration source, and in relation to a reference line of the or of each calibration source. 16. The method as recited in claim 14 wherein at least one alignment function is determined for the alignment of the measurement spectra of a spectrometer from a reference measurement spectrum provided by the spectrometer, the or each alignment function being determined so as to cause the coinciding, for the or each calibration source, of a characteristic spectral line of the reference measurement spectrum with the reference spectral line of this calibration source.

Assignees

Inventors

Classifications

  • Stabilisation of spectrometers · CPC title

  • G01T1/362Primary

    with scintillation detectors · CPC title

  • G01T1/36Primary

    Measuring spectral distribution of X-rays or of nuclear radiation {spectrometry (pulse selection circuits per se H03K; investigation of materials by radiation diffraction G01N23/20; spectrometer tubes H01J49/00)} · CPC title

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What does patent US9400336B2 cover?
A photonic spectrometry device is provided. The photonic spectrometry device comprises several identical spectrometers each spectrometer comprising a radiation sensor and being capable of providing a measurement spectrum corresponding to the measurements of the sensor during a time interval, the spectrometers being capable of performing measurements simultaneously on one same radiation-emitting…
Who is the assignee on this patent?
Berruyer Eric, Areva Np
What technology area does this patent fall under?
Primary CPC classification G01T1/362. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Jul 26 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).