Pattern forming method, actinic ray-sensitive or radiation-sensitive resin composition, resist film, manufacturing method of electronic device, electronic device and compound
US-9523912-B2 · Dec 20, 2016 · US
US9580402B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9580402-B2 |
| Application number | US-201614988156-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jan 5, 2016 |
| Priority date | Jan 8, 2015 |
| Publication date | Feb 28, 2017 |
| Grant date | Feb 28, 2017 |
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A salt represented by the formula (I): wherein R 1 represents a C1 to C12 alkyl group in which a methylene group can be replaced by an oxygen atom or a carbonyl group; Q 1 and Q 2 each independently represent a fluorine atom or a C1 to C6 perfluoroalkyl group; A 1 represents a lactone ring-containing group which has 4 to 24 carbon atoms; R 2 represents an acid-labile group; and “m” represents an integer of 0 to 3.
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What is claimed is: 1. A salt represented by the formula (I): wherein R 1 each independently represents a C1 to C12 alkyl group in which a methylene group can be replaced by an oxygen atom or a carbonyl group; Q 1 and Q 2 each independently represent a fluorine atom or a C1 to C6 perfluoroalkyl group; A 1 represents a lactone ring-containing group which has 4 to 24 carbon atoms; R 2 represents an acid-labile group; and “m” represents an integer of 0 to 3. 2. The salt according to claim 1 wherein A 1 represents a group which has a norbornanelactone ring. 3. The salt according to claim 1 wherein R 2 is represented by formula (R2-1): wherein R 2a1 , R 2a2 and R 2a3 independently each represent a C1 to C8 alkyl group, a C3 to C20 alicyclic hydrocarbon group or a group composed of the alkyl group and the alicyclic hydrocarbon group, or R 2a1 and R 2a2 can be bonded each other to form a C3 to C20 divalent alicyclic hydrocarbon group together with the carbon atom bonded to R 2a1 and R 2a2 , and * represents a binding site; or formula (R2-2): wherein R 2a1′ and R 2a2′ independently each represent a hydrogen atom or a C1 to C12 hydrocarbon group, and R 2a3′ represents a C1 to C20 hydrocarbon group, or R 2a2′ and R 2a3′ can be bonded each other to form a C2 to C20 divalent heterocyclic group together with X 2a1′ and the carbon atom bonded to R 2a2′ and R 2a3′ , and a methylene group in the hydrocarbon group and the heterocyclic group can be replaced by —O— or —S—, X 2a1′ represents an oxygen atom or a sulfur atom, and * represents a binding site. 4. An acid generator which comprises the salt according to claim 1 . 5. A photoresist composition which comprises the salt according to claim 1 and a resin having an acid-labile group. 6. A photoresist composition which comprises the salt according to claim 1 and a resin having an acid-labile group, and which further comprises a salt which generates an acid weaker in acidity than an acid generated from the salt according to claim 1 . 7. A process for producing a photoresist pattern comprising the following steps (1) to (5): (1) a step of applying the photoresist composition according claim 5 on a substrate, (2) a step of forming a composition film by conducting drying, (3) a step of exposing the composition film to radiation, (4) a step of baking the exposed composition film, and (5) a step of developing the baked composition film.
containing only one sulfo group · CPC title
substituted on the ring sulfur atom · CPC title
one oxygen atom and one sulfur atom · CPC title
in the presence of a fluid, e.g. immersion; using fluid cooling means · CPC title
not condensed with other rings · CPC title
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