Plasma activated conformal dielectric film deposition

US9570274B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9570274-B2
Application numberUS-201514607997-A
CountryUS
Kind codeB2
Filing dateJan 28, 2015
Priority dateApr 15, 2010
Publication dateFeb 14, 2017
Grant dateFeb 14, 2017

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

Methods of depositing a film on a substrate surface include surface mediated reactions in which a film is grown over one or more cycles of reactant adsorption and reaction. In one aspect, the method is characterized by intermittent delivery of dopant species to the film between the cycles of adsorption and reaction.

First claim

Opening claim text (preview).

The invention claimed is: 1. A method of depositing a film on a non-planar substrate surface in a reaction chamber, the method comprising: introducing a first reactant into the reaction chamber under non-plasma conditions allowing the first reactant to adsorb onto the non-planar substrate surface; introducing a dopant containing material into the reaction chamber under non-plasma conditions; and subsequently exposing the non-planar substrate surface to plasma to form a doped film conformal to the non-planar substrate surface. 2. The method of claim 1 , wherein the first reactant is a silicon-containing reactant. 3. The method of claim 1 , wherein the dopant is selected from the group consisting of boron, phosphorous, arsenic, and gallium. 4. The method of claim 1 , further comprising, prior to exposing the non-planar substrate surface to plasma, introducing a second reactant into the reaction chamber. 5. The method of claim 4 , wherein the second reactant is an oxidant. 6. The method of claim 4 , wherein the second reactant is an nitrogen-containing reactant. 7. The method of claim 1 , wherein the doped film is a doped silicon oxide film. 8. The method of claim 1 , wherein the doped film is a doped silicon nitride film. 9. The method of claim 1 , wherein the doped film is a doped silicon carbide film. 10. The method of claim 1 , further comprising introducing a second reactant into the reaction chamber while the first reactant is adsorbed onto the non-planar substrate surface. 11. The method of claim 10 , further comprising exposing the non-planar substrate surface to plasma to drive a reaction between the first and second reactants on the substrate surface to form a portion of the film.

Assignees

Inventors

Classifications

  • characterised by the sidewall insulation · CPC title

  • comprising use of blind vias during the manufacture · CPC title

  • Apparatus for fluid treatment (H10P72/0441, H10P72/0448 take precedence) · CPC title

  • the material being a silicon nitride not containing oxygen, e.g. SixNy or SixByNz · CPC title

  • the material being a silicon oxide, e.g. SiO2 · CPC title

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What does patent US9570274B2 cover?
Methods of depositing a film on a substrate surface include surface mediated reactions in which a film is grown over one or more cycles of reactant adsorption and reaction. In one aspect, the method is characterized by intermittent delivery of dopant species to the film between the cycles of adsorption and reaction.
Who is the assignee on this patent?
Novellus Systems Inc
What technology area does this patent fall under?
Primary CPC classification H10P14/6903. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Feb 14 2017 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 12 related publications on this page (citations in our corpus or others sharing the same primary CPC).