System and method for automated RFID quality control

Patent metadata

Field	Value
Publication number	US-9569714-B2
Application number	US-201113093933-A
Country	US
Kind code	B2
Filing date	Apr 26, 2011
Priority date	Apr 26, 2011
Publication date	Feb 14, 2017
Grant date	Feb 14, 2017

Abstract

A system and method is described for an automated RFID quality control process. The method may include configuring an RFID manufacturing press with quality control specifications, manufacturing a batch of RFID inlays, executing a performance test on each RFID inlay, comparing the results of the performance test to the quality control specifications, and determining a pass or fail status for the batch of RFID inlays based on the results of the performance test. The system may include an RFID manufacturing press having at least one lane, at least one interrogator antenna, and programmable control logic for the RFID manufacturing press, wherein the programmable control logic is adapted to execute a performance test on each RFID relay of a batch of RFID relays output by the manufacturing press, compare the results of the performance test to user-configurable quality control specifications, and determine whether the batch of RFID relays meets the specifications.

First claim

What is claimed is:

1. A method for automated RFID quality control for an RFID manufacturing press having one or more lanes, comprising:
configuring the RFID manufacturing press with quality control specifications for at least one batch of RFID inlays before a series of RFID inlays are manufactured, such quality control specifications including at least one fail condition and at least of: a number of RFID inlays to be inspected in each batch, and a number of manufacturing lanes to be inspected;
configuring an interface and the interface displays at least a lane identifier, lane status, number of defective tags per lane, total yield per lane, and number of splices per lane;
and
wherein the fail conditions include: a maximum number of defective inlays that may appear in a consecutive sequence of inlays, and a yield requirement and the quality control specifications test RFID components including chips and antennas;
manufacturing the series of RFID inlays;
selecting a batch of RFID inlays from the series of RFID for evaluation of the quality control specifications;
executing a performance test on each RFID inlay of the selected batch of RFID inlays;
comparing the results of the performance test to the quality control specifications;
determining a pass or fail status for the selected batch of RFID inlays based on the results of the performance test such that the method includes a pass status indicator and a fail status indicator for each manufacturing lane;
sending the selected batch of RFID inlays having at least one of the RFID inlays of the batch of RFID inlays having the fail status to an auto editing process that is separate from the RFID manufacturing press;
removing the at least one of the RFID inlay with the fail status from the batch; and
packaging the batch of RFID inlays.

2. The method of claim 1 , further comprising recording the results of the performance test.

3. The method of claim 2 , further comprising continuously monitoring the recorded results.

4. The method of claim 1 , further comprising:
indicating the pass or fail status of the batch of RFID inlays for each lane of the RFID manufacturing press.

5. The method of claim 1 , further comprising directly packaging a batch of RFID inlays having a pass status.

6. The method of claim 1 , further comprising substituting operative RFID inlays for those inlays with a fail status based on the results of the performance test.

7. A system for automated RFID quality control, comprising:
an RFID manufacturing press having at least one lane;
at least one interrogator antenna;
an interface for inputting the quality control specifications in which the interface includes fields for entering a total number of RFID inlays from a point of quality inspection to a point of rewind in which a field is provided for the at least one lane in the RFID manufacturing press; and
programmable control logic for the RFID manufacturing press;
wherein the programmable control logic is adapted to
receive user-configurable quality control specifications for the manufacture a series of RFID inlays, such quality control specifications including at least one of: the number of RFID inlays to be inspected in each batch, a number of manufacturing lanes to be inspected, a maximum number of defective inlays that may appear in a consecutive sequence of inlays, a yield requirement, and the quality control specification test RFID components including chips and antennas,
execute a performance test on each RFID relay of the batch of RFID relays output by the RFID manufacturing press,
compare the results of the performance test to the user-configurable quality control specifications,
determine whether the batch of RFID relays meets the user-configurable quality control specifications;
indicate a pass or fail status of the RFID inlays in the batch of RFID inlays; and
removing the RFID inlays with a fail status from the batch with a splicer.

8. The system of claim 7 , wherein the programmable control logic is further adapted to record the results of the performance test.

9. The system of claim 7 , further comprising an interface for displaying the recorded results of the performance test.

10. The system of claim 7 , wherein the programmable control logic is further adapted to continuously monitor the results of the performance test.

11. The system of claim 10 , wherein the interface indicates the pass or fail status of the batch of RFID inlays for the at least one-lane of the RFID manufacturing press.

12. The method of claim 1 , wherein the configuring is completed by an operator.

13. The method of claim 1 , wherein the interface includes fields for entering a total number of RFID inlays from a point of quality inspection to a point of rewind in which a field is provided for each lane in the RFID manufacturing press.

14. The system of claim 7 , further comprising a reset wizard.

15. The system of claim 14 , wherein the reset wizard allows an operator to save recorded data to the database of the system.

16. The system of claim 7 , wherein the system is able to distinguish functionality of an RFID antenna and/or RFID chip.

Assignees

• Marcus Chris
• Armijo Edward A
• Avery Dennison Retail Information Services Llc

Inventors

• Marcus Chris
• Armijo Edward A

Classifications

• G06K19/0722 Primary

  comprising an arrangement for testing the record carrier · CPC title