ASIC element, in particular as a component of a vertically integrated hybrid component
US-9475693-B2 · Oct 25, 2016 · US
US9559284B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9559284-B2 |
| Application number | US-201514659749-A |
| Country | US |
| Kind code | B2 |
| Filing date | Mar 17, 2015 |
| Priority date | Mar 17, 2015 |
| Publication date | Jan 31, 2017 |
| Grant date | Jan 31, 2017 |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
Silicided nanowires as nanobridges in Josephson junctions. A superconducting silicided nanowire is used as a weak-link bridge in a Josephson junction, and a fabrication process is employed to produce silicided nanowires that includes patterning two junction banks and a rough nanowire from a silicon substrate, reshaping the nanowire through hydrogen annealing, and siliciding the nanowire by introduction of a metal into the nanowire structure.
Opening claim text (preview).
What is claimed is: 1. A method for forming a superconducting weak-link junction, the method comprising: patterning a first junction bank, a second junction bank, and a rough nanowire from a silicon substrate; reshaping the nanowire through hydrogen annealing; and siliciding the nanowire by introduction of a metal into the nanowire, wherein the nanowire is at least one of shaped, sized, structured, located or connected to form a weak-link bridge between the first junction bank and the second junction bank. 2. The method of claim 1 wherein the silicidation results in a single domain of a single-crystal silicide throughout the extent of the nanowire. 3. The method of claim 1 wherein the metal is one of: cobalt, nickel, niobium, palladium, platinum, or tungsten. 4. The method of claim 1 wherein the silicidation results in formation of a nickel silicide throughout the extent of the nanowire having a one-to-one stoichiometric relationship between nickel and silicon and a chemical formula NiSi. 5. The method of claim 1 wherein the metal is applied through a lift-off deposition process. 6. The method of claim 1 wherein the silicon substrate is located on top of a sapphire substrate. 7. A method for forming a superconducting weak-link junction, the method comprising: patterning a first junction bank, a second junction bank, and a rough nanowire from a silicon substrate; reshaping the nanowire through hydrogen annealing; and siliciding the nanowire by diffusion of a metal through at least the first junction bank, wherein the nanowire is at least one of shaped, sized, structured, located or connected to form a weak-link bridge between the first junction bank and the second junction bank. 8. The method of claim 7 wherein: diffusion of the metal through the first junction bank results in silicidation of a first portion of the nanowire; and the silicidation of the first portion of the nanowire produces a single domain of a single-crystal silicide in the first portion of the nanowire. 9. The method of claim 7 wherein the silicidation results in a single domain of a single-crystal silicide throughout the extent of the nanowire. 10. The method of claim 7 wherein the reshaping produces a nanowire having a cross-sectional diameter in the range of 3 nanometers to 200 nanometers. 11. The method of claim 7 wherein the reshaping produces a nanowire having a line-edge roughness of less than 0.5 nanometers. 12. The method of claim 7 wherein the silicidation results in formation of a nickel silicide throughout the extent of the nanowire having a one-to-one stoichiometric relationship between nickel and silicon and a chemical formula NiSi.
Interconnects · CPC title
to obtain a coating with specific electrical properties · CPC title
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Related publications grouped by family.
Answers are generated from the same data shown on this page.