Differential phase contrast X-ray imaging system and components

Patent metadata

Field	Value
Publication number	US-9557279-B2
Application number	US-201414280272-A
Country	US
Kind code	B2
Filing date	May 16, 2014
Priority date	Jul 29, 2011
Publication date	Jan 31, 2017
Grant date	Jan 31, 2017

Abstract

A differential phase contrast X-ray imaging system includes an X-ray illumination system, a beam splitter arranged in an optical path of the X-ray illumination system, and a detection system arranged in an optical path to detect X-rays after passing through the beam splitter.

First claim

We claim:

1. A method for performing differential phase contrast X-ray imaging, comprising:
providing an X-ray beam for illuminating an object to be imaged;
directing said X-ray beam to be incident upon a beam splitter, wherein said beam splitter comprises a splitter grating arranged to intercept said X-ray beam and provide an interference pattern of X-rays therefrom;
arranging said object to be imaged to intercept said interference pattern of X-rays from said beam splitter; and
detecting at least portions of said interference pattern of X-rays after passing through said object to be imaged,
wherein said detecting comprises blocking at least portions of said interference pattern of X-rays after passing through said object using an analyzer grating,
wherein said analyzer grating has a longitudinal dimension, a lateral dimension that is orthogonal to said longitudinal dimension and a transverse dimension that is orthogonal to said longitudinal and lateral dimensions, said analyzer grating comprising a pattern of optically dense regions each having a longest dimension along said longitudinal dimension and being spaced substantially parallel to each other in said lateral dimension such that there are optically rare regions between adjacent optically dense regions,
wherein each optically dense region has a depth in said transverse dimension that is smaller than a length in said longitudinal dimension,
wherein said analyzer grating is arranged with said longitudinal dimension at a shallow angle relative to incident X-rays, and
wherein said shallow angle is less than 30 degrees.

2. The method according to claim 1 , wherein each optically dense region has a depth in said transverse dimension that is smaller than a length in said longitudinal dimension by at least a factor of two.

3. The method according to claim 1 , wherein each optically dense region has a depth in said transverse dimension that is smaller than a length in said longitudinal dimension by at least a factor of ten.

4. The method according to claim 1 , wherein each optically dense region has a depth in said transverse dimension that is smaller than a length in said longitudinal dimension by at least a factor of one hundred.

5. The method according to claim 1 , wherein said shallow angle is less than 25 degrees and greater than 3 degrees.

6. The method according to claim 1 , wherein said shallow angle is less than 15 degrees and greater than 5 degrees.

7. The method according to claim 1 , wherein said splitter grating is a reflection grating.

8. The method according to claim 1 , wherein said splitter grating is a transmission grating.

9. The method according to claim 8 , wherein said splitter grating has a longitudinal dimension, a lateral dimension that is orthogonal to said longitudinal dimension and a transverse dimension that is orthogonal to said longitudinal and lateral dimensions, said splitter grating comprising a pattern of optically dense regions each having a longest dimension along said longitudinal dimension and being spaced substantially parallel to each other in said lateral dimension such that there are optically rare regions between adjacent optically dense regions,
wherein each optically dense region has a depth in said transverse dimension that is smaller than a length in said longitudinal dimension,
wherein said splitter grating is arranged with said longitudinal dimension at a shallow angle relative to said X-ray beam incident on said splitter grating, and
wherein said shallow angle is less than 30 degrees.

10. The method according to claim 1 , further comprising:
directing said X-ray beam to be incident upon a source grating,
wherein said source grating provides a plurality of substantially coherent X-ray beams; and
arranging said beam splitter to intercept said plurality of substantially coherent X-ray beams.

11. The method according to claim 1 , wherein said X-ray beam for illuminating said object to be imaged is a poly-energetic X-ray beam, further comprising:
filtering said poly-energetic X-ray beam,
wherein said filtering allows X-rays within a band of energies to pass more strongly than X-rays outside said band of energies; and
directing said filtered poly-energetic X-ray beam to be incident upon said beam splitter.

12. The method according to claim 11 , wherein said filtering said poly-energetic X-ray beam further comprises:
reflecting a first portion of said poly-energetic X-ray beam, said first portion comprising X-rays that have energies less than a lower pass-band energy;
transmitting a second portion of said poly-energetic X-ray beam;
attenuating said first portion of said poly-energetic X-ray beam;
reflecting a third portion of said second portion of said poly-energetic X-ray beam, said third portion comprising X-rays that have energies less than an upper pass-band energy;
attenuating a fourth portion of said second portion of said poly-energetic X-ray beam, said fourth portion comprising X-rays that are not reflected; and
directing said third portion of said second portion of said poly-energetic X-ray beam to be incident upon said beam splitter, wherein said third portion comprises X-rays having energies between said upper pass-band energy and said lower pass-band energy.

13. The method according to claim 12 , wherein said reflecting said first portion of said poly-energetic X-ray beam and said transmitting said second portion of said poly-energetic X-ray beam further comprises:
directing said poly-energetic X-ray beam to be incident upon a membrane X-ray mirror comprising a reflecting layer that comprises a high-Z material on a support layer that comprises a low-Z material,
wherein Z is an atomic number,
wherein said high-Z material includes atomic elements with Z at least 42, and
wherein said low-Z material includes atomic elements with Z less than 14.

14. The method according to claim 1 , wherein said splitter grating and said analyzer grating are arranged with a separation determined according to Talbot-Lau conditions.

15. The method according to claim 1 , wherein said splitter grating and said analyzer grating have grating patterns determined according to Talbot-Lau conditions.

Assignees

• Univ Johns Hopkins

Inventors

• Stutman Daniel
• Finkenthal Michael

Classifications

• G21K2207/005

  Methods and devices obtaining contrast from non-absorbing interaction of the radiation with matter, e.g. phase contrast · CPC title

• G01N2223/206

  sources operating at different energy levels · CPC title

• H05G2/001

  Production of X-ray radiation generated from plasma · CPC title

• G21K1/067

  using surface reflection, e.g. grazing incidence mirrors, gratings (multilayer mirrors G21K1/062) · CPC title

• G01N23/20075

  by measuring interferences of X-rays, e.g. Borrmann effect · CPC title