X-ray image acquisition system for differential phase contrast imaging of an examination object by way of phase stepping, and angiographic examination method
US-9179883-B2 · Nov 10, 2015 · US
X-ray imaging apparatus and wavefront measuring apparatus
US9107637B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9107637-B2 |
| Application number | US-201113511896-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jan 21, 2011 |
| Priority date | Jan 28, 2010 |
| Publication date | Aug 18, 2015 |
| Grant date | Aug 18, 2015 |
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Abstract
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There is provided an X-ray imaging apparatus which images a specimen. The X-ray imaging apparatus comprises: an X-ray source; a diffraction grating configured to diffract an X-ray from the X-ray source; an X-ray detector configured to detect the X-ray diffracted by the diffraction grating; and a calculator configured to calculate phase information of the specimen on the basis of an intensity distribution of the X-ray detected by the X-ray detector, wherein the calculator obtains a spatial frequency spectrum from the plural intensity distributions, and calculates the phase information from the obtained spatial frequency spectrum.
First claim
Opening claim text (preview).
The invention claimed is: 1. An X-ray imaging apparatus which images a specimen, comprising: an X-ray source; a diffraction grating configured to diffract X-rays from said X-ray source; an X-ray detector configured to detect the X-rays diffracted by said diffraction grating; and a calculator configured to calculate phase information of the specimen on the basis of an intensity distribution of the X-rays detected by said X-ray detector, wherein said X-ray detector detects a…
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Physics · mapped topic
Physics · mapped topic
Human Necessities · mapped topic
Human Necessities · mapped topic
Human Necessities · mapped topic
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- What does patent US9107637B2 cover?
- There is provided an X-ray imaging apparatus which images a specimen. The X-ray imaging apparatus comprises: an X-ray source; a diffraction grating configured to diffract an X-ray from the X-ray source; an X-ray detector configured to detect the X-ray diffracted by the diffraction grating; and a calculator configured to calculate phase information of the specimen on the basis of an intensity di…
- Who is the assignee on this patent?
- Ouchi Chidane, Kohara Naoki, Canon Kk
- What technology area does this patent fall under?
- Primary CPC classification A61B6/484. Mapped technology areas include Human Necessities.
- When was this patent published?
- Publication date Tue Aug 18 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
- What related patents are in patentsdb?
- We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).