Lighting system of a microlithographic projection exposure system and method for operating such a lighting system
US-2016357113-A1 · Dec 8, 2016 · US
US9541838B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9541838-B2 |
| Application number | US-201615011218-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jan 29, 2016 |
| Priority date | Sep 4, 2013 |
| Publication date | Jan 10, 2017 |
| Grant date | Jan 10, 2017 |
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Method of temperature compensating a focusing system in which a temperature of a thermal lens compensation plate is regulated based on an optical absorption of the thermal lens compensation plate with optical absorption being determined based at least in part on an expected end-of-lifetime value for focus lens optical absorption. A value representative of cumulative time in use of the focusing systems is determined and the temperature of the thermal lens compensation plate is increased to a temperature based at least in part on said cumulative time in use.
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What is claimed is: 1. A method of temperature compensating a focusing system, the method comprising the steps of: regulating a temperature of a thermal lens compensation plate to a first temperature, said first temperature being based on an optical absorption of said thermal lens compensation plate, said optical absorption having been determined based at least in part on an expected end-of-lifetime value for focus lens optical absorption for a final focus lens comprising part of said focusing system; determining a value representative of cumulative time in use of said focusing system; and adjusting said temperature of said thermal lens compensation plate to a second temperature higher than said first temperature, said second temperature having a value based at least in part on said cumulative time in use. 2. A method as claimed in claim 1 wherein said determining step and said adjusting step are carried out periodically. 3. A method as claimed in claim 1 wherein said determining step and said adjusting step are carried out substantially continuously.
by plasma extreme ultraviolet [EUV] sources · CPC title
Details of immersion lithography aspects, e.g. exposure media or control of immersion liquid supply (chemical composition of immersion liquids G03F7/2041) · CPC title
Temperature, e.g. temperature control of masks or workpieces via control of stage temperature · CPC title
by pulsed sources, e.g. multiplexing, pulse duration, interval control or intensity control · CPC title
Production of exposure light, i.e. light sources · CPC title
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