Apparatus and method for providing frequency domain display with visual indication of FFT window shape

Patent metadata

Field	Value
Publication number	US-9500677-B2
Application number	US-201213411328-A
Country	US
Kind code	B2
Filing date	Mar 2, 2012
Priority date	Aug 19, 2011
Publication date	Nov 22, 2016
Grant date	Nov 22, 2016

Abstract

A test and measurement instrument includes a display having a time domain graticule and a frequency domain graticule. A processor is configured to process an input signal to generate a time domain waveform for display in the time domain graticule, the input signal being correlated to a time base. The processor is also configured to process a second input signal and generate a frequency domain waveform for display in the frequency domain graticule, the second input signal being correlated to the same time base. The frequency domain waveform is correlated to a selected time period of the time base. The processor is also configured to generate a spectrum time indicator configured to graphically illustrate a transform parameter, a location and the selected time period in the time domain graticule with respect to the frequency domain waveform.

First claim

What is claimed is:

1. A test and measurement instrument, comprising:
a display having a time domain graticule and a frequency domain graticule;
a processor configured to process an input signal to display a time domain waveform of the input signal in the time domain graticule, the input signal being correlated to a time base, the processor being configured to process the input signal and display a frequency domain waveform of the input signal in the frequency domain graticule, the frequency domain waveform being correlated to a selected time period of the time base;
the processor being configured to generate a spectrum time indicator configured to graphically illustrate a fast Fourier transform (FFT) window shape of the FFT window type used to generate the frequency domain waveform and the selected time period associated with the frequency domain waveform, wherein the frequency domain waveform is a spectrum waveform;
the display being configured to display, in the time domain graticule with the time domain waveform, the FFT window shape graphically illustrating a mathematical function applied to the time domain waveform to account for discontinuities during time domain acquisition and resulting in the frequency domain waveform displayed in the frequency domain graticule.

2. The test and measurement instrument of claim 1 further comprising an input control configured to select the FFT window type based from a plurality of FFT window types.

3. The test and measurement instrument of claim 1 , wherein the spectrum time indicator has a width that indicates the selected time period of the time domain graticule with respect to the frequency domain waveform.

4. The test and measurement instrument of claim 1 , further comprising an input configured to receive the input signal.

5. The test and measurement instrument of claim 1 , further comprising a plurality of user controls.

6. A method of providing a test and measurement instrument, the method comprising:
providing a display having a time domain graticule and a frequency domain graticule;
providing a processor configured to process an input signal to display a time domain waveform of the input signal in the time domain graticule, the input signal being correlated to a time base, the processor being configured to process the input signal and display a frequency domain waveform of the input signal in the frequency domain graticule, the frequency domain waveform being correlated to a selected time period of the time base;
the processor being configured to generate a spectrum time indicator configured to graphically illustrate a fast Fourier transform (FFT) window shape of the FFT window type used to generate the frequency domain waveform and the selected time period associated with the frequency domain waveform, wherein the frequency domain waveform is a spectrum waveform,
employing the display to display, in the time domain graticule with the time domain waveform, the FFT window shape graphically illustrating a mathematical function applied to the time domain waveform to account for discontinuities during time domain acquisition and resulting in the frequency domain waveform displayed in the frequency domain graticule.

7. The method of claim 6 , further comprising receiving an input control to select the FFT window type based from a plurality of FFT window types.

8. The method of claim 6 , wherein the spectrum time indicator has a width that indicates the selected time period of the time domain waveform with respect to the frequency domain waveform.

9. A method implemented in a test and measurement instrument, the method comprising:
acquiring an input signal in a time domain as a time domain waveform, the input signal being correlated to a time base;
acquiring a selected time period of the time base associated with a frequency domain waveform of the input signal;
receiving, via controls, a fast Fourier transform (FFT) window shape;
applying a mathematical function corresponding to the FFT window shape to the time domain waveform to account for discontinuities during time domain acquisition, the application of the mathematical function resulting in the frequency domain waveform of the input signal;
displaying the frequency domain waveform of the input signal in a frequency domain graticule;
displaying the time domain waveform of the input signal in a time domain graticule;
generating a spectrum time indicator configured to graphically illustrate the FFT window shape used to generate the frequency domain waveform and the selected time period associated with the frequency domain waveform, wherein the frequency domain waveform is a spectrum waveform;
displaying, in the time domain graticule with the time domain waveform, the FFT window shape to graphically illustrate the mathematical function applied to the time domain waveform resulting in the frequency domain waveform displayed in the frequency domain graticule.

10. The method of claim 9 , further comprising displaying a center frequency indicator in the time domain graticule to indicate a location of center frequency in the frequency domain graticule.

11. The method of claim 9 , wherein the FFT window shape is Rectangular, Triangular, Hanning, Hamming, Poisson, Cauchy, or Kaiser-Bessel.

Assignees

• Waldo Gary J
• Dobyns Kenneth P
• Tektronix Inc

Inventors

• Waldo Gary J
• Dobyns Kenneth P

Classifications

• G01R13/0236 Primary

  for presentation of more than one variable · CPC title

• G01R13/029

  Software therefor · CPC title

• G01R23/02 Primary

  Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage · CPC title

• G01R13/20

  Cathode-ray oscilloscopes · CPC title