Apparatus and method for time correlated signal acquisition and viewing

US2017030945A1 · US · A1

Patent metadata
FieldValue
Publication numberUS-2017030945-A1
Application numberUS-201615294522-A
CountryUS
Kind codeA1
Filing dateOct 14, 2016
Priority dateAug 19, 2011
Publication dateFeb 2, 2017
Grant date

How to read this patent

A practical reading order for non-experts. Skip the full description unless you need deep technical detail.

  1. Title

    What the patent document calls the invention.

  2. Abstract

    A short plain-language summary of the technical disclosure.

  3. Assignees and inventors

    Who owns or filed the patent and who is credited as inventor.

  4. Key dates

    Filing, priority, publication, and grant dates set the timeline.

  5. First independent claim

    The legal scope of protection — read this for what is actually claimed.

  6. CPC / IPC classifications

    Technology tags used to group this patent with similar filings.

  7. Citations and related patents

    Prior art links and similar publications in this corpus.

Abstract

Official abstract text for this publication.

A test and measurement instrument and method are disclosed. The test and measurement instrument includes a display having a time domain graticule and a frequency domain graticule. A processor is configured to sample an input signal to generate a time domain waveform for display in the time domain graticule. The processor is also configured to generate a frequency domain waveform for display in the frequency domain graticule, the frequency domain waveform being correlated to a selected time period of the time domain graticule. The processor is also configured to generate a spectrum time indicator configured to graphically illustrate a location and the selected time period of the time domain graticule with respect to the frequency domain waveform.

First claim

Opening claim text (preview).

What is claimed is: 1 . A test and measurement instrument, comprising: a display having a time domain graticule and a frequency domain graticule; a processor configured to process an input signal to generate a time domain waveform for display in the time domain graticule, the input signal being correlated to a time base, the processor being configured to process a second input signal and generate a frequency domain waveform for display in the frequency domain graticule, the second input signal being correlated to the time base, the frequency domain waveform being correlated to a selected time period of the time base; the processor being configured to generate a spectrum time indicator configured to graphically illustrate a location and the selected time period in the time domain graticule with respect to the frequency domain waveform. 2 . The test and measurement instrument of claim 1 , wherein the first input signal and the second input signal are the same signal. 3 . The test and measurement instrument of claim 1 , wherein the spectrum time indicator has a width that indicates the selected time period of the time domain graticule with respect to the frequency domain waveform. 4 . The test and measurement instrument of claim 1 further comprising a pan input configured to move the spectrum time indicator to a second location, the processor being configured to update the frequency domain waveform based on the second location. 5 . The test and measurement instrument of claim 1 , further comprising a zoom input configured to increase a zoom level and magnify the time domain waveform to create a zoomed view. 6 . The test and measurement instrument of claim 5 , wherein the processor is configured to center the spectrum time indicator in the zoomed view as the zoom level is increased. 7 . The test and measurement instrument of claim 5 , wherein the processor is configured to center the spectrum time indicator in the zoomed view as the magnified time domain waveform is panned. 8 . The test and measurement instrument of claim 1 , further comprising an input configured to receive the input signal. 9 . The test and measurement instrument of claim 1 , further comprising a plurality of user controls. 10 . A method of providing a test and measurement instrument the method comprising: providing a display having a time domain graticule and a frequency domain graticule; providing a processor configured to sample an input signal to generate a time domain waveform for display in the time domain graticule and a frequency domain waveform for display in the frequency domain graticule, the frequency domain waveform being correlated to a selected time period of the time domain graticule; the processor being configured to generate a spectrum time indicator configured to graphically illustrate a location and the selected time period of the time domain graticule with respect to the frequency domain waveform. 11 . The method of claim 10 , wherein the first input signal and the second input signal are the same signal. 12 . The method of claim 10 , wherein the spectrum time indicator has a width that indicates the selected time period of the time domain graticule with respect to the frequency domain waveform. 13 . The method of claim 10 , wherein the processor is configured to receive a pan input, move the spectrum time indicator to a second location and update the frequency domain waveform based on the second location. 14 . The method of claim 10 , wherein the processor is configured to receive a zoom input to increase a zoom level and magnify the time domain waveform to create a zoomed view. 15 . The method of claim 14 , wherein the spectrum time indicator is centered in the zoomed view as the zoom level is increased. 16 . The method of claim 14 , wherein the spectrum time indicator is centered in the zoomed view as the magnified time domain waveform is panned. 17 . A computer readable medium having stored thereon a computer program for execution by a processor configured to perform test and measurement, the method comprising: processing an input signal; generating a time domain waveform for display in a time domain graticule, the input signal being correlated to a time base; processing a second input signal; generating a frequency domain waveform for display in a frequency domain graticule, the second input signal being correlated to the time base, the frequency domain waveform being correlated to a selected time period of the time domain graticule with respect to the frequency domain waveform; and generating a spectrum time indicator configured to graphically illustrate a location and the selected time period of the time domain graticule with respect to the frequency domain waveform. 18 . The computer readable medium of claim 17 , wherein the first input signal and the second input signal are the same signal. 19 . The computer readable medium of claim 17 , wherein the spectrum time indicator has a width that indicates the selected time period of the time domain graticule with respect to the frequency domain waveform. 20 . The computer readable medium of claim 17 , further comprising receiving a pan input, moving the spectrum time indicator to a second location and updating the frequency domain waveform based on the second location.

Assignees

Inventors

Classifications

  • Software therefor · CPC title

  • for presentation of more than one variable · CPC title

Patent family

Related publications grouped by family.

External sources

Frequently asked questions

Answers are generated from the same data shown on this page.

What does patent US2017030945A1 cover?
A test and measurement instrument and method are disclosed. The test and measurement instrument includes a display having a time domain graticule and a frequency domain graticule. A processor is configured to sample an input signal to generate a time domain waveform for display in the time domain graticule. The processor is also configured to generate a frequency domain waveform for display in …
Who is the assignee on this patent?
Tektronix Inc
What technology area does this patent fall under?
Primary CPC classification G01R13/0236. Mapped technology areas include Physics.
When was this patent published?
Publication date Thu Feb 02 2017 00:00:00 GMT+0000 (Coordinated Universal Time) (A1). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).