Apparatus and method for time correlated signal acquisition and viewing

US9500676B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9500676-B2
Application numberUS-201213403319-A
CountryUS
Kind codeB2
Filing dateFeb 23, 2012
Priority dateAug 19, 2011
Publication dateNov 22, 2016
Grant dateNov 22, 2016

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  1. Title

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  5. First independent claim

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Abstract

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A test and measurement instrument includes a display having a time domain graticule and a frequency domain graticule. A processor is configured to sample an input signal to generate a time domain waveform for display in the time domain graticule. The processor is also configured to generate a frequency domain waveform for display in the frequency domain graticule, the frequency domain waveform being correlated to a selected time period of the time domain graticule. The processor is also configured to generate a spectrum time indicator configured to graphically illustrate a location and the selected time period of the time domain graticule with respect to the frequency domain waveform.

First claim

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What is claimed is: 1. A test and measurement instrument, comprising: a display having a time domain graticule and a frequency domain graticule; a processor configured to process an input signal to display a time domain waveform of the input signal in the time domain graticule, the input signal being correlated to a time base, the processor being configured to process the input signal and display a frequency domain waveform of the input signal in the frequency domain graticule, the frequency domain waveform being correlated to a selected time period of the time base; the processor being configured to generate a spectrum time indicator configured to graphically illustrate on the time domain graticule the selected time period associated with the frequency domain waveform; a zoom control to adjust a zoom level of the time domain waveform display in the time domain graticule; a pan control to adjust a position of the zoomed portion of the time domain waveform display in the time domain graticule; and the processor being configured to adjust a location of the spectrum time indicator on the time domain graticule to a panned location based on adjustments to the zoom and pan controls and to automatically update the frequency domain graticule to illustrate a portion of the frequency domain waveform indicating a spectrum of the input signal at the panned location of the spectrum time indicator on the time domain graticule, wherein the frequency domain waveform is a spectrum waveform. 2. The test and measurement instrument of claim 1 , wherein the spectrum time indicator has a width that indicates the selected time period of the time domain graticule with respect to the frequency domain waveform. 3. The test and measurement instrument of claim 1 , wherein the processor is configured to center the spectrum time indicator in the zoomed view as the zoom level is increased. 4. The test and measurement instrument of claim 1 , wherein the processor is configured to center the spectrum time indicator in the zoomed view as the magnified time domain waveform is panned. 5. The test and measurement instrument of claim 1 , further comprising an input configured to receive the input signal. 6. The test and measurement instrument of claim 1 , further comprising a plurality of user controls. 7. A method of providing a test and measurement instrument, the method comprising: providing a display having a time domain graticule and a frequency domain graticule; providing a processor configured to sample an input signal and display a time domain waveform of the input signal in the time domain graticule and a frequency domain waveform of the input signal in the frequency domain graticule, the frequency domain waveform being correlated to a selected time period of the time domain graticule; the processor being configured to generate a spectrum time indicator configured to graphically illustrate on the time domain graticule the selected time period associated with the frequency domain waveform; receiving, via a zoom control on the test and measurement instrument, a first adjustment to a zoom level of the time domain waveform display in the time domain graticule; receiving, via a pan control on the test and measurement instrument, a second adjustment to a position of the zoomed portion of the time domain waveform display in the time domain graticule; adjusting a location of the spectrum time indicator on the time domain graticule to a panned location based on the adjustments to the zoom and pan controls; and automatically updating the frequency domain graticule to illustrate a portion of the frequency domain waveform indicating a spectrum of the input signal at the panned location of the spectrum time indicator on the time domain graticule, wherein the frequency domain waveform is a spectrum waveform. 8. The method of claim 7 , wherein the spectrum time indicator has a width that indicates the selected time period of the time domain graticule with respect to the frequency domain waveform. 9. The method of claim 7 , wherein the spectrum time indicator is centered in the zoomed view as the zoom level is increased. 10. The method of claim 7 , wherein the spectrum time indicator is centered in the zoomed view as the magnified time domain waveform is panned. 11. A method implemented in a test and measurement instrument, the method comprising: receiving at least one input signal at the test and measurement instrument; storing the input signal in memory; displaying, on a time domain graticule, a time domain waveform for the input signal; displaying a spectrum time indicator on the time domain graticul adjacent to the time domain waveform, the time domain graticule graphically indicating a time range of the time domain waveform to be represented as a frequency domain waveform; applying, by a processor, a frequency domain transform to the input signal to obtain the frequency domain waveform; displaying, on a frequency domain graticule, a portion of the frequency domain waveform corresponding to the spectrum time indicator on the time domain graticul; receiving, via a zoom control, a zoom adjustment to a zoom level of the time domain waveform displayed in the time domain graticule; in response to receiving the zoom adjustment, adjusting a graphical size of the time domain waveform on the time domain graticule and centering the portion of the frequency domain waveform in the frequency domain graticule corresponding to the time domain waveform in the time domain graticule; receiving, via a pan control, a pan adjustment to a location of the spectrum time indicator displayed in the time domain graticule; and in response to receiving the pan adjustment, automatically updating the frequency domain graticule to illustrate a portion of the frequency domain waveform indicating a spectrum of the input signal at the panned location of the spectrum time indicator on the time domain graticule. 12. The method of claim 11 , wherein the spectrum time indicator has a width that indicates the time range of the time domain waveform to be represented as a frequency domain waveform in the frequency domain graticule. 13. The method of claim 11 , wherein the pan control is a pan control knob, and wherein the pan adjustment is received via the pan control knob allowing the user to simultaneously adjust the panned location of the spectrum time indicator displayed on the time domain graticule and the portion of the frequency domain waveform displayed on the frequency domain graticule by turning the knob.

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  • Software therefor · CPC title

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What does patent US9500676B2 cover?
A test and measurement instrument includes a display having a time domain graticule and a frequency domain graticule. A processor is configured to sample an input signal to generate a time domain waveform for display in the time domain graticule. The processor is also configured to generate a frequency domain waveform for display in the frequency domain graticule, the frequency domain waveform …
Who is the assignee on this patent?
Waldo Gary J, Tektronix Inc
What technology area does this patent fall under?
Primary CPC classification G01R13/0236. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Nov 22 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).