Imaging using metamaterials

Patent metadata

Field	Value
Publication number	US-9448460-B2
Application number	US-201615046725-A
Country	US
Kind code	B2
Filing date	Feb 18, 2016
Priority date	Dec 20, 2011
Publication date	Sep 20, 2016
Grant date	Sep 20, 2016

Abstract

A system for imaging an object is provided. The system includes a light source configured to emit light having a predetermined wavelength towards the object. The system further includes a metalens including a metallic film having a plurality of slits defined therethrough, the plurality of slits having a width a and a periodicity d that are both less than the predetermined wavelength, wherein the object is positioned between the light source and the metalens. The system further includes a detector configured to acquire measurements indicative of light transmitted through the metalens, and a computing device communicatively coupled to the detector and configured to reconstruct an image of the object based on the acquired measurements.

First claim

What is claimed is:

1. A system for imaging an object, said system comprising:
a light source configured to emit light having a predetermined wavelength towards the object;
a metalens comprising a metallic film having a plurality of slits defined therethrough, the plurality of slits having a width a and a periodicity d that are both less than the predetermined wavelength, wherein the object is positioned between said light source and said metalens;
a detector configured to acquire measurements indicative of light transmitted through said metalens; and
a computing device communicatively coupled to said detector and configured to reconstruct an image of the object based on the acquired measurements.

2. A system in accordance with claim 1 , wherein said metalens further comprises a plurality of dielectric elements positioned within said plurality of slits.

3. A system in accordance with claim 2 , wherein said plurality of dielectric elements are substantially optically transparent.

4. A system in accordance with claim 1 , wherein said plurality of slits are unfilled.

5. A system in accordance with claim 1 , wherein said computing device is configured to reconstruct an image having a resolution at least a factor of two smaller than the predetermined wavelength.

6. A system in accordance with claim 1 , wherein said detector is positioned proximate a detection slit of said plurality of slits.

7. A system in accordance with claim 1 , further comprising a waveguide positioned between said metalens and said detector.

8. A system in accordance with claim 1 , wherein the object is positioned such that at least a portion of the object lies within evanescent bulges formed at ends of the plurality of slits.

9. A system in accordance with claim 1 , wherein the detector is a photodetector.

10. A system in accordance with claim 1 , wherein the detector further comprises one or more optical fibers to collect light passing through the metalens.

11. A system in accordance with claim 1 , wherein said detector comprises a plurality of detectors.

Assignees

• Univ Washington

Inventors

• Shen Jung-Tsung
• Shen Yuecheng
• Wang Lihong

Classifications

• H04N23/56

  provided with illuminating means · CPC title

• H04N5/2256

  Electricity · mapped topic

• G02F1/3501 Primary

  Constructional details or arrangements of non-linear optical devices, e.g. shape of non-linear crystals · CPC title

• G01Q60/22 Primary

  Probes, their manufacture, or their related instrumentation, e.g. holders · CPC title