Temperature measurement apparatus and method

US9304050B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9304050-B2
Application numberUS-201314070714-A
CountryUS
Kind codeB2
Filing dateNov 4, 2013
Priority dateMar 10, 2008
Publication dateApr 5, 2016
Grant dateApr 5, 2016

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  5. First independent claim

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Abstract

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A temperature measurement apparatus includes a light source; a first splitter that splits a light beam into a measurement beam and a reference beam; a reference beam reflector that reflects the reference beam; an optical path length adjustor; a second splitter that splits the reflected reference beam into a first reflected reference beam and a second reflected reference beam; a first photodetector that measures an interference between the first reflected reference beam and a reflected measurement beam obtained by the measurement beam reflected from a target object; a second photodetector that measures an intensity of the second reflected reference beam; and a temperature calculation unit. The temperature calculation unit calculates a location of the interference by subtracting an output signal of the second photodetector from an output signal of the first photodetector, and calculates a temperature of the target object from the calculated location of the interference.

First claim

Opening claim text (preview).

What is claimed is: 1. A temperature measurement method, comprising: splitting a low coherence light beam into a reference beam and a measurement beam; radiating the reference beam onto a reference beam reflector while radiating the measurement beam onto a target object; measuring an interference between the reference beam reflected from the reference beam reflector and the measurement beam reflected from the target object while changing an optical path length of the reflected…

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What does patent US9304050B2 cover?
A temperature measurement apparatus includes a light source; a first splitter that splits a light beam into a measurement beam and a reference beam; a reference beam reflector that reflects the reference beam; an optical path length adjustor; a second splitter that splits the reflected reference beam into a first reflected reference beam and a second reflected reference beam; a first photodetec…
Who is the assignee on this patent?
Tokyo Electron Ltd
What technology area does this patent fall under?
Primary CPC classification G01K11/00. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Apr 05 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).