Magnetic testing method and apparatus

US9291599B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9291599-B2
Application numberUS-201214238958-A
CountryUS
Kind codeB2
Filing dateAug 15, 2012
Priority dateAug 18, 2011
Publication dateMar 22, 2016
Grant dateMar 22, 2016

How to read this patent

A practical reading order for non-experts. Skip the full description unless you need deep technical detail.

  1. Title

    What the patent document calls the invention.

  2. Abstract

    A short plain-language summary of the technical disclosure.

  3. Assignees and inventors

    Who owns or filed the patent and who is credited as inventor.

  4. Key dates

    Filing, priority, publication, and grant dates set the timeline.

  5. First independent claim

    The legal scope of protection — read this for what is actually claimed.

  6. CPC / IPC classifications

    Technology tags used to group this patent with similar filings.

  7. Citations and related patents

    Prior art links and similar publications in this corpus.

Abstract

Official abstract text for this publication.

A magnetic testing apparatus 100 according to the present invention comprises: a first magnetizing device 1 for applying a DC bias magnetic field to a test object P in substantially parallel to the direction in which a flaw F to be detected extends; a second magnetizing device 2 for applying an AC magnetic field to the test object P substantially perpendicularly to the direction in which the flaw F to be detected extends; and a detecting device 3 for detecting leakage flux produced by the magnetization of the test object P accomplished by the first magnetizing device 1 and the second magnetizing device 2.

First claim

Opening claim text (preview).

The invention claimed is: 1. A magnetic testing method comprising: applying, to a test object, a rotating bias magnetic field which is excited by using an AC current as an exciting current; applying, to the test object, a rotating AC magnetic field which is excited by using a superimposed AC current in which a first AC current of the same frequency as that of the AC current that is the exciting current for the rotating bias magnetic field and a second AC current of a frequency higher than that of the first AC current are superimposed as an exciting current and which is 90 degrees out of phase with respect to the rotating bias magnetic field; and detecting a flaw based on leakage flux produced by the application of the magnetic fields. 2. A magnetic testing apparatus comprising: a first rotation magnetizing device for applying, to a test object, a rotating bias magnetic field which is excited by using an AC current as an exciting current; a second rotation magnetizing device for applying, to the test object, a rotating AC magnetic field which is excited by using an superimposed AC current in which a first AC current of the same frequency as that of the AC current that is the exciting current for the rotating bias magnetic field and a second AC current of a frequency higher than that of the first AC current are superimposed as an exciting current and which is 90 degrees out of phase with respect to the rotating bias magnetic field; and a detecting device for detecting leakage flux produced by the magnetization of the test object accomplished by the first rotation magnetizing device and the second rotation magnetizing device.

Assignees

Inventors

Classifications

  • G01N27/83Primary

    by investigating stray magnetic fields · CPC title

  • G01N27/82Primary

    for investigating the presence of flaws · CPC title

  • by moving the sensors · CPC title

Patent family

Related publications grouped by family.

External sources

Frequently asked questions

Answers are generated from the same data shown on this page.

What does patent US9291599B2 cover?
A magnetic testing apparatus 100 according to the present invention comprises: a first magnetizing device 1 for applying a DC bias magnetic field to a test object P in substantially parallel to the direction in which a flaw F to be detected extends; a second magnetizing device 2 for applying an AC magnetic field to the test object P substantially perpendicularly to the direction in which …
Who is the assignee on this patent?
Suzuma Toshiyuki, Nakao Yoshiyuki, Sakamoto Makoto, and 2 more
What technology area does this patent fall under?
Primary CPC classification G01N27/83. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Mar 22 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).