Via structure, memory array structure, three-dimensional resistance memory and method of forming the same

Patent metadata

Field	Value
Publication number	US-9257641-B2
Application number	US-201414488300-A
Country	US
Kind code	B2
Filing date	Sep 17, 2014
Priority date	Nov 8, 2013
Publication date	Feb 9, 2016
Grant date	Feb 9, 2016

Abstract

Provided is a three-dimensional resistance memory including a stack of layers. The stack of layers is encapsulated in a dielectric layer and is adjacent to at least one opening in the encapsulating dielectric layer. At least one L-shaped variable resistance spacer is disposed on at least a portion of the sidewall of the opening adjacent to the stack of layers. An electrode layer fills the remaining portion of the opening.

First claim

What is claimed is:

1. A three-dimensional resistance memory, comprising:
a stack of layers, containing at least one conductive layer and at least one insulation layer, encapsulated in a dielectric layer and adjacent to at least one opening in the dielectric layer, wherein the opening penetrating through the stack of layers;
at least one L-shaped variable resistance spacer, disposed on at least a portion of a sidewall of the opening adjacent to the stack of layers; and
a first electrode layer, filling a remaining portion of the opening.

2. The three-dimensional resistance memory of claim 1 , wherein the variable resistance spacer comprises HfOx, TaOx, AlOx, TiOx, NbOx, LaOx, ZrOx, doped versions thereof, or a combination thereof, and x is greater than zero.

3. The three-dimensional resistance memory of claim 1 , further comprising an I-shaped protection spacer disposed between the at least one L-shaped variable resistance spacer and the first electrode layer.

4. The three-dimensional resistance memory of claim 3 , wherein the I-shaped protection spacer comprises Ta, Ti, TaN or TiN.

5. The three-dimensional resistance memory of claim 1 , wherein the stack of layers comprises a plurality of insulation layers and a plurality of conductive layers arranged alternately.

6. The three-dimensional resistance memory of claim 1 , wherein each conductive layer comprises W, TiN, Al, Ta, Cu, Ti or a combination thereof.

7. The three-dimensional resistance memory of claim 1 , wherein each conductive layer is a sandwich structure comprising a bottom barrier layer, a top barrier layer and a metal layer between the bottom barrier layer and the top barrier layer.

8. The three-dimensional resistance memory of claim 7 , further comprising a metal oxide layer disposed between the metal layer and the L-shaped variable resistance spacer.

9. The three-dimensional resistance memory of claim 1 , wherein the dielectric layer is in contact with the at least one L-shaped variable resistance spacer.

10. The three-dimensional resistance memory of claim 1 , wherein the stack of layers is disposed on a material layer, and an included angle between the material layer and one sidewall of the opening is equal to or more than about 90 degrees and equal to or less than about 110 degrees.

11. The three-dimensional resistance memory of claim 10 , wherein the material layer has a conductive plug therein, and the first electrode layer is electrically connected to the conductive plug.

12. A method of forming a three-dimensional resistance memory, comprising:
providing a stack of layers encapsulated in a dielectric layer and adjacent to at least one opening through the dielectric layer, wherein the opening penetrating through the stack of layers;
forming at least one L-shaped variable resistance spacer on at least a portion of a sidewall of the opening adjacent to the stack of layers; and
filling a remaining portion of the opening with a first electrode layer.

13. The method of claim 12 , wherein the variable resistance spacer comprises HfOx, TaOx, AlOx, TiOx, NbOx, LaOx, ZrOx, doped versions thereof, or a combination thereof, and x is greater than zero.

14. The method of claim 12 , wherein an I-shaped protection spacer is further formed between the at least one L-shaped variable resistance spacer and the first electrode layer during the step of forming the at least one L-shaped variable resistance spacer.

15. The method of claim 14 , wherein the I-shaped protection spacer comprises Ta, Ti, TaN or TiN.

16. The method of claim 12 , wherein the step of providing the stack of layers comprises:
forming a plurality of insulation layers and a plurality of conductive layers arranged alternately on a material layer; and
patterning the insulation layers and the conductive layers to form at least two stacked structures with the opening therebetween.

17. The method of claim 16 , wherein each conductive layer comprises W, TiN, Al, Ta, Cu, Ti or a combination thereof.

18. The method of claim 16 , wherein each conductive layer is a sandwich structure comprising a bottom barrier layer, a top barrier layer and a metal layer between the bottom barrier layer and the top barrier layer.

19. The method of claim 12 , wherein the dielectric layer is in contact with the at least one L-shaped variable resistance spacer.

20. The method of claim 12 , wherein the stack of layers is disposed on a material layer, and an included angle between the material layer and one sidewall of the opening is equal to or more than about 90 degrees and equal to or less than about 110 degrees.

21. A via structure, formed adjacent to a stack comprising at least one horizontal metal layer and at least one insulation layer, comprising at least one L-shaped oxide spacer covering a sidewall of an opening, a non L-shaped metallic spacer covering the L-shaped oxide spacer, and a conductive layer filling a remaining volume of the opening,
wherein the opening penetrating through the stack comprising the at least one horizontal metal layer and the at least one insulation layer.

22. The via structure of claim 21 , wherein the via structure lands on a tungsten contact.

23. The via structure of claim 22 , wherein the tungsten contact is connected to a diffusion region of a transistor.

24. The via structure of claim 21 , wherein the L-shaped oxide spacer comprises a first L-shaped oxide spacer disposed on the sidewall of the opening and a second L-shaped oxide layer disposed on the first L-shaped oxide spacer.

25. The via structure of claim 24 , wherein the first L-shaped oxide spacer comprises HfO 2 , HfOx, or doped HfOx the second L-shaped spacer comprises TaOx, and x is greater than zero.

26. The via structure of claim 21 , wherein the non L-shaped metallic spacer comprises Ta, Ti, TiN or TaN.

27. The via structure of claim 21 , wherein the conductive layer comprises TiN.

28. The via structure of claim 21 , wherein the L-shaped oxide spacer covers an entire sidewall of the opening.

29. The via structure of claim 21 , wherein the L-shaped oxide spacer covers a portion of the sidewall of the opening.

30. A memory array structure having the via structure of claim 21 , wherein there are two horizontal metal lines contacting the via structure at its sidewall, and the horizontal metal lines are in the same plane.

31. A memory array structure having the via structure of claim 21 , wherein there are at least two horizontal metal lines contacting the via structure at its sidewall, and the horizontal metal lines are stacked vertically and separated by one dielectric layer.

32. The memory array structure of claim 31 , wherein each of the horizontal metal lines comprises Al, W, or TiN.

33. The memory array structure of claim 31 , wherein each of the horizontal metal lines comprises laterally separated TiN and Cu.

34. The memory array structure of claim 31 , wherein the two horizontal metal lines are connected to Cu strap lines above an upmost horizontal metal line.

35. The memory array structure of claim 34 , wherein a width of an upper horizontal metal line is narrower than a width of a lower horizontal metal line.

36. The memory array structure of claim 34 , wherein an upper horizontal metal line is con

Assignees

• Ind Tech Res Inst

Inventors

• Chen Frederick T
• Wu Tai-Yuan
• Chen Yu-Sheng
• Chen Wei-Su
• Gu pei-yi
• Lin Yu-De

Classifications

• H01L45/145

  Electricity · mapped topic

• H01L45/1691

  Electricity · mapped topic

• H01L45/08

  Electricity · mapped topic

• H01L45/06

  Electricity · mapped topic

• H01L45/04

  Electricity · mapped topic