Plasma activated conformal film deposition

Patent metadata

Field	Value
Publication number	US-9230800-B2
Application number	US-201414231554-A
Country	US
Kind code	B2
Filing date	Mar 31, 2014
Priority date	Apr 15, 2010
Publication date	Jan 5, 2016
Grant date	Jan 5, 2016

Abstract

Methods of depositing a film on a substrate surface include surface mediated reactions in which a film is grown over one or more cycles of reactant adsorption and reaction. In one aspect, the method is characterized by the following operations: (a) exposing the substrate surface to a first reactant in vapor phase under conditions allowing the first reactant to adsorb onto the substrate surface; (b) exposing the substrate surface to a second reactant in vapor phase while the first reactant is adsorbed on the substrate surface; and (c) exposing the substrate surface to plasma to drive a reaction between the first and second reactants adsorbed on the substrate surface to form the film.

First claim

What is claimed is:

1. A method of depositing a film on a substrate surface, the method comprising:
(a) providing a substrate in a reaction chamber;
(b) introducing a first reactant in vapor phase into the reaction chamber under conditions allowing the first reactant to adsorb onto the substrate surface;
(c) introducing a second reactant in vapor phase into the reaction chamber while the first reactant is adsorbed on the substrate surface, wherein the second reactant is introduced without first sweeping the first reactant out of the reaction chamber;
(d) exposing the substrate surface to plasma to drive a surface reaction between the first and second reactants on the substrate surface to form the film; and
(e) introducing the first reactant in vapor phase and second reactant in vapor phase into the reaction chamber concurrently to thereby deposit additional film by a chemical vapor deposition non-surface gas phase reaction directly on the film formed in (d), wherein there is a transition phase between operations (d) and (e) in which the surface reaction between the first and second reactants and the chemical vapor deposition non-surface gas phase reaction take place concurrently, and wherein the substrate is exposed to plasma during the transition phase.

2. The method of claim 1 , wherein a plasma is ignited while at least one of the reactants is in a gas phase while being exposed to the substrate.

3. The method of claim 1 , further comprising a sweep phase to sweep out the second reactant in vapor phase prior to (d), and further comprising repeating (a)-(d) at least once before performing (e).

4. The method of claim 1 , further comprising exposing the substrate to ultraviolet radiation in the reaction chamber during formation of the film.

5. The method of claim 1 , further comprising, prior to (d) introducing a third reactant into the reaction chamber under conditions allowing the third reactant to adsorb onto the substrate surface, and wherein the plasma in (d) drives a reaction between the first, second, and third reactants.

6. The method of claim 1 , wherein the film formed in (d) forms a conformal structure selected from the group consisting of shallow trench isolation, a through silicon via liner, an interlayer dielectric, a gate spacer, and an intermetal dielectric.

7. The method of claim 1 , further comprising:
(f) etching the film at an entrance of a recessed feature; and
(g) depositing an additional portion of the film on the etched film.

8. The method of claim 7 , wherein (f) comprises selectively etching the film at the entrance of the recessed feature.

9. The method of claim 1 , further comprising exposing the substrate to ultraviolet radiation in the reaction chamber after formation of at least a portion of the film.

10. The method of claim 1 , further comprising:
(f) repeating (b)-(d) at least once;
(g) introducing a third reactant, not introduced during (b)- (f), into the reaction chamber under conditions allowing the third reactant to adsorb onto the substrate surface;
(h) reacting the third reactant to produce a dopant for the film; and
(i) repeating (b)-(d).

11. The method of claim 1 , wherein the first reactant comprises tertbutylamine and the silicon-containing reactant comprises chlorosilane and/or dichlorosilane.

12. The method of claim 1 , further comprising exposing the substrate to intermittent pulses of plasma during the transition phase, the pulsing occurring at a frequency between about 10-150 Hz.

13. The method of claim 1 , wherein the first reactant comprises tertbutylamine, and wherein the second reactant comprises chlorosilane and/or dichlorosilane.

14. The method of claim 1 , wherein the transition phase comprises: (i) introducing the first reactant in vapor phase and the second reactant in vapor phase into the reaction chamber and allowing the first and second reactants to adsorb onto the substrate surface while no plasma is present in the reaction chamber; and (ii) after (i), introducing the first reactant in vapor phase and the second reactant in vapor phase into the reaction chamber concurrently while exposing the substrate to plasma to drive both the surface reaction between the first reactant and the second reactant on the substrate surface, and the concurrent chemical vapor deposition gas phase reaction between the first and second reactants, to thereby deposit the additional film.

15. The method of claim 14 , wherein the first and second reactants substantially do not react with one another in the transition phase until exposure to plasma in (ii).

16. A method of depositing a film on a substrate surface, the method comprising:
(a) performing a conformal film deposition phase comprising:
(i) introducing a first reactant in vapor phase into the reaction chamber and allowing the first reactant to adsorb onto the substrate surface;
(ii) introducing a second reactant in vapor phase into the reaction chamber while the first reactant is adsorbed on the substrate surface, wherein the second reactant is introduced without first sweeping the first reactant out of the reaction chamber; and
(iii) exposing the substrate surface to plasma after the second reactant ceases flowing into the reaction chamber to drive a surface reaction between the first and second reactants on the substrate surface to form the film, wherein the first and second reactants substantially do not react with one another until exposure to plasma in (a)(iii);

(b) performing a transition phase comprising:
(i) introducing the first reactant in vapor phase and the second reactant in vapor phase into the reaction chamber and allowing the first and second reactants to adsorb onto the substrate surface while no plasma is present in the reaction chamber;
(ii) after (b)(i), introducing the first reactant in vapor phase and the second reactant in vapor phase into the reaction chamber concurrently while exposing the substrate to plasma to drive both a surface reaction between the first reactant and the second reactant on the substrate surface, and a concurrent chemical vapor deposition gas phase reaction between the first and second reactants, to thereby deposit additional film directly on the film formed in (a)(iii), wherein the first and second reactants substantially do not react with one another in the transition phase until exposure to plasma in (b)(ii); and

(c) performing a chemical vapor deposition phase comprising:
(i) introducing the first and second reactants to the reaction chamber concurrently while exposing the substrate surface to plasma to drive a chemical vapor deposition gas phase reaction to deposit more film directly on the additional film formed in (b)(ii).

17. An apparatus for depositing a film on a substrate surface, the apparatus comprising:
a reaction chamber;
an inlet port for delivering gas phase reactants to the reaction chamber;
a plasma generator for providing plasma to the reaction chamber; and
a controller comprising instructions for:
(a) performing a conformal film deposition phase comprising:
(i) introducing a first reactant in vapor phase into the reaction chamber and allowing the first reactant to adsorb onto the substrate surface;
(ii) introducing a second reactant in vapor phase into the reaction chamber while the first reactant is adsorbed on the substrate surface, wherein the second reactant is introduced without first sweeping the first reactant out of the reaction chamber; and
(iii) exposing the substrate surface to plasma after the second reactant ceases flowing into the reaction chamber to drive a surface reaction

Assignees

• Novellus Systems Inc

Inventors

• Lavoie Adrien
• Swaminathan Shankar
• Kang Hu
• Chandrasekharan Ramesh
• Dorsh Tom
• Hausmann Dennis M
• Henri Jon
• Jewell Thomas
• Li Ming
• Schlief Bryan
• Xavier Antonio
• Mountsier Thomas W
• Van Schravendijk Bart J
• Srinivasan Easwar
• Sriram Mandyam

Classifications

• H10P72/0466

  characterised by the construction of the load-lock chamber · CPC title

• H10P72/0462

  characterised by the construction of the processing chambers, e.g. modular processing chambers · CPC title

• H10P72/0402

  Apparatus for fluid treatment (H10P72/0441, H10P72/0448 take precedence) · CPC title

• H10P14/69433 Primary

  the material being a silicon nitride not containing oxygen, e.g. SixNy or SixByNz · CPC title

• H10P14/69215

  the material being a silicon oxide, e.g. SiO2 · CPC title