Distance measurement method, distance measurement system, and substrate processing apparatus

US2025180381A1 · US · A1

Patent metadata
FieldValue
Publication numberUS-2025180381-A1
Application numberUS-202418962032-A
CountryUS
Kind codeA1
Filing dateNov 27, 2024
Priority dateDec 1, 2023
Publication dateJun 5, 2025
Grant date

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A distance measurement method includes: heating a processing container capable of accommodating a substrate; loading a jig of a substrate shape into the processing container in a state in which the processing container is heated; and measuring a distance from the jig to a ceiling surface of the processing container by using a distance sensor provided in the jig.

First claim

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What is claimed is: 1 . A distance measurement method, comprising: heating a processing container capable of accommodating a substrate; loading a jig of a substrate shape into the processing container in a state in which the processing container is heated; and measuring a distance from the jig to a ceiling surface of the processing container by using a distance sensor provided in the jig. 2 . The distance measurement method of claim 1 , wherein the measuring includes measuring the distance from the jig to the ceiling surface of the processing container by using the distance sensor in a state in which the jig loaded into the processing container is heated. 3 . The distance measurement method of claim 1 , wherein the distance sensor is a capacitance sensor and measures a capacitance according to the distance from the jig to the ceiling surface of the processing container. 4 . The distance measurement method of claim 1 , further comprising, before the measuring: accommodating the jig in a first accommodation container, which is capable of accommodating the jig, wherein a distance from the accommodated jig to a ceiling surface of the first accommodation container is a predetermined reference distance; and correcting a capacitance, measured by the distance sensor according to the distance from the jig to the ceiling surface of the first accommodation container, to a capacitance according to the reference distance. 5 . The distance measurement method of claim 1 , wherein the measuring further includes storing a measured value of the distance from the jig to the ceiling surface of the processing container, as measured by the distance sensor, in a memory provided in the jig, and wherein the distance measurement method further comprises, after the measuring: accommodating the jig in a second accommodation container, which is capable of accommodating the jig and includes a first connector connected to a reader; and reading the measured value from the memory into the reader in a state in which the jig is accommodated in the second accommodation container. 6 . The distance measurement method of claim 5 , wherein the second accommodation container includes a first pin that is capable of contacting a first pad provided in the accommodated jig and is electrically connected to the first connector; and wherein the reading the measured value includes reading the measured value from the memory into the reader via the first pad and the first pin. 7 . The distance measurement method of claim 5 , wherein the second accommodation container includes a second connector connected to an external power source, and wherein the distance measurement method further comprises: charging a battery provided in the jig from the external power source, in parallel with the reading the measured value. 8 . The distance measurement method of claim 7 , wherein the second accommodation container includes a second pin that is capable of contacting a second pad provided in the accommodated jig and is electrically connected to the second connector, and wherein the charging includes charging the battery from the external power source via the second pad and the second pin. 9 . A distance measurement system, comprising: a processing container which is capable of accommodating a substrate; a jig of a substrate shape which is loaded into the processing container, in a state in which the processing container is heated, and is provided with a distance sensor configured to measure a distance to a ceiling surface of the processing container and a memory configured to store a measured value from the distance sensor; and an accommodation container which is capable of accommodating the jig and includes a first connector connected to a reader configured to read the measured value from the memory. 10 . The distance measurement system of claim 9 , wherein the accommodation container includes a second connector connected to an external power source configured to charge a battery provided in the jig. 11 . A substrate processing apparatus, comprising: a processing container which is capable of accommodating a substrate; a transfer device which is configured to transfer a jig of a substrate shape to a delivery area adjacent to the processing container; and a controller, wherein the controller is configured to control the processing container and the transfer device to execute a distance measurement method including: heating the processing container; loading the jig into the processing container from the delivery area in a state in which the processing container is heated; and measuring a distance from the jig to a ceiling surface of the processing container by using a distance sensor provided in the jig.

Assignees

Inventors

Classifications

  • H10P72/50Primary

    for positioning, orientation or alignment · CPC title

  • into and out of processing chamber · CPC title

  • Position monitoring, e.g. misposition detection or presence detection · CPC title

  • for drying · CPC title

  • Mechanical parts of transfer devices · CPC title

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What does patent US2025180381A1 cover?
A distance measurement method includes: heating a processing container capable of accommodating a substrate; loading a jig of a substrate shape into the processing container in a state in which the processing container is heated; and measuring a distance from the jig to a ceiling surface of the processing container by using a distance sensor provided in the jig.
Who is the assignee on this patent?
Tokyo Electron Ltd
What technology area does this patent fall under?
Primary CPC classification H10P72/50. Mapped technology areas include Electricity.
When was this patent published?
Publication date Thu Jun 05 2025 00:00:00 GMT+0000 (Coordinated Universal Time) (A1). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).