Multi-user development system for system level device testing

Patent metadata

Field	Value
Publication number	US-2025102562-A1
Application number	US-202318372369-A
Country	US
Kind code	A1
Filing date	Sep 25, 2023
Priority date	Sep 25, 2023
Publication date	Mar 27, 2025
Grant date	—

Abstract

Embodiments of the present invention provide testing systems that perform advanced system level testing of multiple devices in parallel over a network connection that provides access to multiple development stations for improved efficiency and access to system level testing. A rack integrated computer (RIC) is coupled to multiple tester racks of single board computers (SBCs) and provides access to the SBCs as development workstations for use over a computer network (e.g., a customer network). SBCs can provide end level testing of devices like smartphones that include several different devices (DUTs). Access to the SBCs as development workstations can be enforced on an IP level under a development license, and the license may be used from any global location using a static IP address and/or virtual private network, for example.

First claim

What is claimed is:

1 . A system level test system, comprising:
a rack integrated computer (RIC) coupled to a network switch to provide a remote network connection to a plurality of single board computers (SBCs); and the network switch coupled to the plurality of SBCs, wherein the plurality of SBCs are operable to perform system level testing on a plurality of devices under test (DUTs), wherein the plurality of SBCs are operable to be coupled to the plurality of DUTs, and wherein the system level testing comprises testing a plurality of components of the plurality of DUTs according to a test program executed by the plurality of SBCs over the remote network connection.

2 . The system level test system of claim 1 , further comprising:
a tester rack, wherein the RIC is disposed in the tester rack; a power distribution board (PBD) disposed in a slot of the tester rack and coupled to the plurality of SBCs; and a test interface board (TIB) disposed in the slot of the tester rack and operable to be coupled to the plurality of DUTs.

3 . The system level test system of claim 1 , further comprising a lookup table stored in a memory of the RIC, wherein the lookup table comprises a designated IP address for accessing a first SBC of the plurality of SBCs, wherein further the first SBC is configured using the IP address, and wherein the first SBC is operable to be remotely accessed using the IP address to perform the system level testing.

4 . The system level test system of claim 3 , wherein the first SBC is accessed using a license file that enables a development mode that allows connection to the first SBC from any IP address.

5 . The test system of claim 1 , wherein the network switch comprises an ethernet switch.

6 . The test system of claim 1 , wherein the plurality of SBCs comprise 6 SBCs, and wherein the plurality of DUTs comprise 24 DUTs, and wherein each SBC of the plurality of SBCs is respectively coupled to 4 DUTs of the plurality of DUTs for performing the system level testing via the remote network connection.

7 . The test system of claim 1 , wherein the remote network connection provides communication between the plurality of SBCs and a remote computer system using at least one of: VNC; Remote Desktop Connection; and an integrated development environment (IDE).

8 . The test system of claim 1 , wherein the plurality of SBCs are operable to install a custom IDE via the remote network connection.

9 . The test system of claim 1 , wherein the plurality of SBCs are operable to install a custom software library via the remote network connection.

10 . The test system of claim 1 , further comprising a plurality of network switches coupled to a plurality of tester racks, wherein each tester rack comprises another plurality of SBCs operable to be coupled to another plurality of DUTs, and wherein the plurality of network switches are coupled to the RIC to coordinate remote access to the another plurality of SBCs for performing the system level testing on the another plurality of DUTs.

11 . A single board computer (SBC) for performing system level testing, the SBC comprising:
a processor; a memory; and a network interface, wherein the processor is operable to perform system level testing on a plurality of DUTs operable to be coupled to the processor, wherein the network interface is coupled to a network switch, and wherein the network switch is coupled to a rack integrated computer (RIC) that coordinates remote access between the networking interface and a remote computer system.

12 . The SBC of claim 11 , wherein the plurality of DUTs are operable to be coupled to the processor using a USB interface.

13 . The SBC of claim 11 , wherein the plurality of DUTs comprise 4 DUTs, and wherein the processor is operable to perform the system level testing on the 4 DUTs in parallel.

14 . The SBC of claim 11 , wherein the processor is operable to assign a designated IP address to the network interface for connecting to the remote network, and wherein the designated IP address is stored in a lookup table in a memory of the RIC.

15 . The SBC of claim 11 , wherein the network switch comprises an ethernet switch.

16 . A method of system level testing, comprising:
associating a single board computer (SBC) with a designated IP address; storing the designated IP address in a lookup table in a memory of a rack integrated computer (RIC), wherein RIC and the SBC are coupled to a network switch, and wherein further the SBC is accessible by a remote computer system at the designated IP address via the RIC; and the remote computer system causing the SBC to perform system level testing on a plurality of devices under test (DUTs) operable to be coupled to the SBC.

17 . The method of claim 16 , wherein the plurality of DUTs comprise 4 DUTs, and wherein the SBC is operable to perform the system level testing on the 4 DUTs in parallel.

18 . The method of claim 16 , wherein the system level testing comprises:
the SBC receiving test commands and data from the remote computer system; and the SBC returning test results to the remote computer system.

19 . The method of claim 16 , wherein the SBC executes an integrated development environment (IDE) controlled by the remote computer system.

20 . The method of claim 16 , further comprising storing port forwarding rules at the RIC in the lookup table, wherein the SBC is further accessible via the IP address in combination with a port number according to the port forwarding rules defined in the lookup table.

Assignees

• Advantest Test Solutions Inc

Inventors

• Gillespie Jess
• Subhedar Amey
• Williams Ian
• Ranganathan Karthik

Classifications

• G01R31/31908

  Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns · CPC title

• G06F11/2257

  using expert systems · CPC title

• G06F11/2294

  by remote test · CPC title

• G06F11/263

  Generation of test inputs, e.g. test vectors, patterns or sequences {; with adaptation of the tested hardware for testability with external testers} · CPC title

• G06F11/27

  Built-in tests · CPC title