Mass spectrometry via frequency tagging

Patent metadata

Field	Value
Publication number	US-2024304434-A1
Application number	US-202418630314-A
Country	US
Kind code	A1
Filing date	Apr 9, 2024
Priority date	Oct 10, 2018
Publication date	Sep 12, 2024
Grant date	—

Abstract

The invention generally relates to mass spectrometry via frequency tagging.

First claim

What is claimed is:

1 . A system comprising:
a mass spectrometer comprising a single ion trap; and a central processing unit (CPU), and storage coupled to the CPU for storing instructions that when executed by the CPU cause the system to apply a plurality of scan functions to the single ion trap to fragment a precursor ion and simultaneously eject a product ion of the precursor ion in a manner that preserves in time a relationship of the precursor ion and the product ion.

2 . The system of claim 1 , wherein a value of a mass to charge ratio (m/z) of the precursor ion is directly correlated to fragmentation time.

3 . The system of claim 1 , wherein the product ion of the precursor ion is ejected by a scan function that comprises a broadband sum of sines.

4 . The system of claim 3 , wherein the broadband sum of sines comprises unevenly spaced frequencies that product unique beats in a waveform that affect ejection and thus modulate spectral peak shapes.

5 . The system of claim 4 , wherein the beat frequencies have a pre-programmed and calibrated relationship with ion secular frequency and hence product ion mass-to-charge.

6 . The system of claim 5 , wherein a value of a mass to charge ratio (m/z) of the product ion is generated by applying a Fourier transform of each mass spectral peak and then converting from beat frequency to product ion m/z.

7 . The system of claim 1 , wherein a secular or related frequency of the product ion is directly measured by a detector of the mass spectrometer.

8 . The system of claim 1 , wherein the precursor ion is mass-selectively excited via the system applying a nonlinear AC frequency sweep at a constant RF voltage to the single ion trap.

9 . The system of claim 1 , wherein the precursor ion is mass-selectively excited via the system applying a fixed AC frequency while the RF voltage is ramped linearly.

10 . The system of claim 1 , further comprising an ionization source that allows for high energy ionization of a sample to generate the precursor ion.

11 . A system comprising:
a mass spectrometer comprising a single ion trap; and a central processing unit (CPU), and storage coupled to the CPU for storing instructions that when executed by the CPU cause the system to apply a plurality of scan functions to the single ion trap to excite a precursor and eject a product ion exactly when the precursor is fragmented.

12 . A method for analyzing a sample, the method comprising:
introducing a precursor ion of a sample into a mass spectrometer comprising a single ion trap; and analyzing the sample via the mass spectrometer that applies a plurality of scan functions to the single ion trap to fragment the precursor ion and simultaneously eject a product ion of the precursor ion in a manner that preserves in time a relationship of the precursor ion and the product ion.

13 . The method of claim 12 , wherein a value of a mass to charge ratio (m/z) of the precursor ion is directly correlated to fragmentation time.

14 . The method of claim 12 , wherein the product ion of the precursor ion is ejected by a scan function that comprises a broadband sum of sines.

15 . The method of claim 14 , wherein the broadband sum of sines comprises unevenly spaced frequencies that product unique beats in a waveform that affect ejection and thus modulate spectral peak shapes.

16 . The method of claim 15 , wherein the beat frequencies have a pre-programmed and calibrated relationship with ion secular frequency and hence product ion mass-to-charge.

17 . The method of claim 16 , wherein a value of a mass to charge ratio (m/z) of the product ion is generated by applying a Fourier transform of each mass spectral peak and then converting from beat frequency to product ion m/z.

18 . The method of claim 12 , wherein a secular or related frequency of the product ion is directly measured by a detector of the mass spectrometer.

19 . The method of claim 2 wherein the sample is selected from the group consisting of a biological sample, an industrial sample, an environmental sample, and a pharmaceutical sample.

20 . The method of claim 19 , wherein the biological sample comprises a plurality of different components.

21 . The method of claim 12 , wherein the sample comprises a plurality of chemical products.

Assignees

• Purdue Research Foundation

Inventors

• Cooks Robert Graham
• Snyder Dalton

Classifications

• H01J49/429

  Scanning an electric parameter, e.g. voltage amplitude or frequency · CPC title

• H01J49/025

  Detectors specially adapted to particle spectrometers (data acquisition H01J49/0036; detectors per se G01T, e.g. G01T1/28, G01T1/29) · CPC title

• G01N33/6848

  Methods of protein analysis involving mass spectrometry · CPC title

• H01J49/427

  Ejection and selection methods · CPC title

• H01J49/4225 Primary

  Multipole linear ion traps, e.g. quadrupoles, hexapoles · CPC title