Logical operations in mass spectrometry

Patent metadata

Field	Value
Publication number	US-2021013023-A1
Application number	US-201917040721-A
Country	US
Kind code	A1
Filing date	Mar 18, 2019
Priority date	Mar 23, 2018
Publication date	Jan 14, 2021
Grant date	—

Abstract

The invention generally relates to logical operations in mass spectrometry. The system comprising a mass spectrometer comprising one or more ion traps; and a central processing unit (CPU), and storage coupled to the CPU for storing instructions that when executed by the CPU cause the system to apply one or more scan functions to the one or more ion traps, the scan functions being combine together.

First claim

1 . A system comprising:
a mass spectrometer comprising one or more ion traps; and a central processing unit (CPU), and storage coupled to the CPU for storing instructions that when executed by the CPU cause the system to apply one or more scan functions to the one or more ion traps in order to accomplish the operations listed in Table 2B.

2 . (canceled)

3 . The system according to claim 1 , wherein the one or more scan functions comprise a broadband sum of sines for precursor ion excitation, followed by single frequencies to determine if selected product ions were formed.

4 . The system according to claim 3 , wherein the precursor ion excitation is performed without determining the precursor ion m/z values.

5 . The system according to claim 1 , wherein the one or more scan functions comprise an inverse q scan to excite precursor ions, wherein two frequencies are applied to x electrodes of the one or more ion traps to eject two selected product ions.

6 . The system according to claim 5 , wherein two beat frequencies are used at the product ion ejection frequencies to differentiate the two selected product ions.

7 . The system according to claim 1 , wherein the one or more scan functions comprise an inverse Mathieu q scan to excite precursor ions and a broadband waveform to eject all product ions.

8 . The system according to claim 7 , wherein the broadband waveform comprises a sum of a plurality of sines with frequency components that vary with time for ejection of the product ions, wherein the broadband waveform further comprises a notch to prevent the ejection of a selected product ion.

9 . The system according to claim 7 , wherein the broadband waveform comprises a plurality of notches.

10 . The system according to claim 1 , wherein the one or more scan functions comprise two inverse Mathieu q scans in the y dimension to excite precursor ions and subsequently neutralize product ions as they are formed.

11 . The system according to claim 8 , wherein frequency components of the broadband waveform vary so that the frequencies in the broadband waveform are higher than the inverse Mathieu q scan used for the precursor ion excitation.

12 . A system comprising:
a mass spectrometer comprising a single ion trap; and a central processing unit (CPU), and storage coupled to the CPU for storing instructions that when executed by the CPU cause the system to apply a plurality of scan functions to the single ion trap in a manner that the single ion trap conducts ion analysis that is conducted in a triple quadrupole mass spectrometer, wherein the plurality of scan functions comprise an inverse Mathieu q scan and at least one additional scan function.

13 . The system according to claim 12 , wherein the plurality of scan functions applied to the single ion trap cause the single ion trap to conduct a triple resonance precursor scan.

14 . The system according to claim 13 , wherein the triple resonance precursor scan comprises an inverse Mathieu q scan applied to the single ion trap in a y-dimension and an additional frequency applied to the single ion trap in the y-dimension corresponding to a particular MS 2 product ion's secular frequency.

15 . The system according to claim 13 , wherein the instructions, wherein executed by the CPU, further the system to apply a beat frequency in the triple resonance precursor scan.

16 . The system according to claim 15 , wherein the beat frequency is generated by summing two sine waves with frequencies different by a desired beat frequency with a lower frequency corresponding to a secular frequency of a product ion.

17 . The system according to claim 12 , wherein the plurality of scan functions applied to the single ion trap cause the single ion trap to conduct a neutral loss scan.

18 . The system according to claim 15 , wherein the neutral loss scan comprises applying two inverse Mathieu q scans on orthogonal electrodes of the single ion trap to excite precursor ions and then neutralize the precursor ions while triggering a broadband sum of sines to eject all product ions of the excited precursor ions.

19 . The system according to claim 18 , wherein a third inverse Mathieu q scan is applied to the orthogonal electrodes used for excitation so that particular product ions satisfying a selected neutral loss are removed before they are detected.

20 . The system according to claim 18 , wherein a plurality of additional inverse Mathieu q scans are applied to the orthogonal electrodes used for excitation so that at least two particular product ions satisfying selected neutral losses are removed before they are detected.

21 . The system according to claim 17 , wherein the instructions, wherein executed by the CPU, further cause the system to apply a beat frequency in the neutral loss scan.

22 . The system according to claim 21 , wherein the beat frequency is generated by summing two inverse Mathieu q scans with one of the inverse Mathieu q scans having a constant frequency offset corresponding to a desired beat frequency.

23 - 33 . (canceled)

Assignees

• Purdue Research Foundation

Inventors

• Cooks Robert Graham
• Snyder Dalton
• Szalwinski Lucas

Classifications

• H01J49/0081 Primary

  Tandem in time, i.e. using a single spectrometer · CPC title

• H01J49/4225 Primary

  Multipole linear ion traps, e.g. quadrupoles, hexapoles · CPC title

• H01J49/427

  Ejection and selection methods · CPC title

• H01J49/429

  Scanning an electric parameter, e.g. voltage amplitude or frequency · CPC title

• H01J49/428

  Applying a notched broadband signal · CPC title