Substrate cleaning device, abnormality determination method of substrate cleaning device, storage medium

US2022258217A1 · US · A1

Patent metadata
FieldValue
Publication numberUS-2022258217-A1
Application numberUS-202217670522-A
CountryUS
Kind codeA1
Filing dateFeb 14, 2022
Priority dateFeb 15, 2021
Publication dateAug 18, 2022
Grant date

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  1. Title

    What the patent document calls the invention.

  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

Provided is a substrate cleaning device, an abnormality determination method of a substrate cleaning device, and an abnormality determination program of a substrate cleaning device for determining whether there is an abnormality in a roll cleaning member that is attached. A substrate cleaning device includes: a holder to which a roll cleaning member for cleaning a substrate is attached in a detachable manner; a rotation device which makes the roll cleaning member attached to the holder rotate; a sensor which measures information concerning a vibration of the roll cleaning member during rotation; and a control device which determines, based on a measurement result of the sensor, whether there is an abnormality in the roll cleaning member attached to the holder.

First claim

Opening claim text (preview).

What is claimed is: 1 . A substrate cleaning device, comprising: a holder to which a roll cleaning member for cleaning a substrate is attached in a detachable manner; a rotation device which makes the roll cleaning member attached to the holder rotate; a sensor which measures information concerning a vibration of the roll cleaning member during rotation; and a control device which determines, based on a measurement result of the sensor, whether there is an abnormality in the roll cleaning member attached to the holder. 2 . The substrate cleaning device according to claim 1 , wherein the control device determines, based on an amplitude of the roll cleaning member during rotation, whether there is an abnormality in the roll cleaning member attached to the holder. 3 . The substrate cleaning device according to claim 1 , wherein the control device makes the roll cleaning member rotate by the rotation device in a state that the roll cleaning member is moistened, and determines whether there is an abnormality in the roll cleaning member attached to the holder. 4 . The substrate cleaning device according to claim 1 , wherein the control device makes the roll cleaning member rotate by the rotation device and determines whether there is an abnormality in the roll cleaning member attached to the holder at least after the roll cleaning member is attached to the holder and before the substrate is cleaned. 5 . The substrate cleaning device according to claim 1 , wherein the sensor is a load cell installed on the holder. 6 . The substrate cleaning device according to claim 1 , wherein the roll cleaning member has a plurality of protrusion portions on a peripheral surface. 7 . The substrate cleaning device according to claim 1 , wherein the control device makes the roll cleaning member rotate by the rotation device in a state that a peripheral surface of the roll cleaning member is not in contact with an object, and determines whether there is an abnormality in the roll cleaning member attached to the holder. 8 . An abnormality determination method of a substrate cleaning device, wherein the substrate cleaning device comprises: a holder to which a roll cleaning member for cleaning a substrate is attached in a detachable manner; a rotation device which makes the roll cleaning member attached to the holder rotate; and a sensor which measures information concerning a vibration of the roll cleaning member during rotation, and the abnormality determination method of the substrate cleaning device determines, based on a measurement result of the sensor, whether there is an abnormality in the roll cleaning member attached to the holder. 9 . A non-transitory computer readable storage medium, storing an abnormality determination program of a substrate cleaning device, wherein the substrate cleaning device comprises: a holder to which a roll cleaning member for cleaning a substrate is attached in a detachable manner; a rotation device which makes the roll cleaning member attached to the holder rotate; and a sensor which measures information concerning a vibration of the roll cleaning member during rotation, and the abnormality determination program of the substrate cleaning device causes a computer of the substrate cleaning device to determine, based on a measurement result of the sensor, whether there is an abnormality in the roll cleaning member attached to the holder.

Assignees

Inventors

Classifications

  • using mainly scrubbing means, e.g. brushes · CPC title

  • rotating about an axis parallel to the surface · CPC title

  • B08B13/00Primary

    Accessories or details of general applicability for machines or apparatus for cleaning · CPC title

  • Vibration-testing of structures; Shock-testing of structures (G01M9/00 takes precedence) · CPC title

  • Force sensors associated with manufacturing machines (G01L5/0066, G01L5/0071 and B23Q17/09 take precedence; for the specific machine or operation involved see relevant class, e.g. B21 - B42) · CPC title

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What does patent US2022258217A1 cover?
Provided is a substrate cleaning device, an abnormality determination method of a substrate cleaning device, and an abnormality determination program of a substrate cleaning device for determining whether there is an abnormality in a roll cleaning member that is attached. A substrate cleaning device includes: a holder to which a roll cleaning member for cleaning a substrate is attached in a det…
Who is the assignee on this patent?
Ebara Corp
What technology area does this patent fall under?
Primary CPC classification H10P72/0412. Mapped technology areas include Electricity.
When was this patent published?
Publication date Thu Aug 18 2022 00:00:00 GMT+0000 (Coordinated Universal Time) (A1). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 1 related publication on this page (citations in our corpus or others sharing the same primary CPC).