Gate-all-around integrated circuit structures including varactors

US2021305436A1 · US · A1

Patent metadata
FieldValue
Publication numberUS-2021305436-A1
Application numberUS-202016830112-A
CountryUS
Kind codeA1
Filing dateMar 25, 2020
Priority dateMar 25, 2020
Publication dateSep 30, 2021
Grant date

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  1. Title

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  5. First independent claim

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Abstract

Official abstract text for this publication.

Gate-all-around integrated circuit structures including varactors are described. For example, an integrated circuit structure includes a varactor structure on a semiconductor substrate. The varactor structure includes a plurality of discrete vertical arrangements of horizontal nanowires. A plurality of gate stacks is over and surrounding corresponding ones of the plurality of discrete vertical arrangements of horizontal nanowires. The integrated circuit structure also includes a tap structure adjacent to the varactor structure on the semiconductor substrate. The tap structure includes a plurality of merged vertical arrangements of horizontal nanowires. A plurality of semiconductor structures is over and surrounding corresponding ones of the plurality of merged vertical arrangements of horizontal nanowires.

First claim

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What is claimed is: 1 . An integrated circuit structure, comprising: a varactor structure on a semiconductor substrate, the varactor structure comprising a plurality of discrete vertical arrangements of horizontal nanowires, and a plurality of gate stacks over and surrounding corresponding ones of the plurality of discrete vertical arrangements of horizontal nanowires; and a tap structure adjacent to the varactor structure on the semiconductor substrate, the tap structure comprising a plurality of merged vertical arrangements of horizontal nanowires, and a plurality of semiconductor structures over and surrounding corresponding ones of the plurality of merged vertical arrangements of horizontal nanowires. 2 . The integrated circuit structure of claim 1 , wherein the plurality of discrete vertical arrangements of horizontal nanowires of the varactor structure is a plurality of discrete vertical arrangements of horizontal doped silicon nanowires, and wherein the plurality of merged vertical arrangements of horizontal nanowires of the tap structure is a plurality of merged vertical arrangements of horizontal silicon nanowires. 3 . The integrated circuit structure of claim 1 , wherein the plurality of discrete vertical arrangements of horizontal nanowires and the plurality of gate stacks of the varactor structure are on an insulating layer on the semiconductor substrate. 4 . The integrated circuit structure of claim 1 , wherein the plurality of merged vertical arrangements of horizontal nanowires and the plurality of semiconductor structures of the tap structure are on a semiconductor layer on the semiconductor substrate. 5 . The integrated circuit structure of claim 4 , wherein the plurality of merged vertical arrangements of horizontal nanowires is a plurality of merged vertical arrangements of horizontal silicon nanowires, wherein the plurality of semiconductor structures comprises silicon germanium, and wherein the semiconductor layer comprises silicon germanium. 6 . The integrated circuit structure of claim 1 , wherein individual ones of the plurality of merged vertical arrangements of horizontal nanowires are merged by epitaxial semiconductor structures. 7 . The integrated circuit structure of claim 1 , wherein the semiconductor substrate comprises an NWell region, and wherein the varactor structure and the tap structure are over the NWell region. 8 . The integrated circuit structure of claim 1 , wherein each of the plurality of gate stacks of the varactor structure comprises a high-k gate dielectric layer and a metal gate electrode. 9 . A computing device, comprising: a board; and a component coupled to the board, the component including an integrated circuit structure, comprising: a varactor structure on a semiconductor substrate, the varactor structure comprising a plurality of discrete vertical arrangements of horizontal nanowires, and a plurality of gate stacks over and surrounding corresponding ones of the plurality of discrete vertical arrangements of horizontal nanowires; and a tap structure adjacent to the varactor structure on the semiconductor substrate, the tap structure comprising a plurality of merged vertical arrangements of horizontal nanowires, and a plurality of semiconductor structures over and surrounding corresponding ones of the plurality of merged vertical arrangements of horizontal nanowires. 10 . The computing device of claim 9 , further comprising: a memory coupled to the board. 11 . The computing device of claim 9 , further comprising: a communication chip coupled to the board. 12 . The computing device of claim 9 , wherein the component is a packaged integrated circuit die. 13 . An integrated circuit structure, comprising: a varactor structure on a semiconductor island on a semiconductor substrate, the varactor structure comprising a plurality of discrete gate stacks on the semiconductor island; a tap structure adjacent to the varactor structure on the semiconductor island, the tap structure comprising a plurality of merged gate stacks on the semiconductor island; and a transistor structure on the semiconductor substrate, the transistor structure isolated from the semiconductor island, and the transistor structure comprising a plurality of merged vertical arrangements of horizontal nanowires, and a plurality of gate stacks over and surrounding corresponding ones of the plurality of merged vertical arrangements of horizontal nanowires. 14 . The integrated circuit structure of claim 13 , wherein the plurality of merged vertical arrangements of horizontal nanowires of the transistor structure is a plurality of merged vertical arrangements of horizontal silicon nanowires. 15 . The integrated circuit structure of claim 13 , wherein the plurality of merged vertical arrangements of horizontal nanowires and the plurality of gate stacks of the transistor structure are on an insulating layer on the semiconductor substrate. 16 . The integrated circuit structure of claim 13 , wherein individual ones of the plurality of merged vertical arrangements of horizontal nanowires of the transistor structure are merged by epitaxial semiconductor structures. 17 . The integrated circuit structure of claim 13 , wherein the semiconductor island comprises a first NWell region, and the varactor structure and the tap structure are over the first NWell region of the semiconductor island, and wherein the semiconductor substrate comprises a second NWell region, and the transistor structure is over the second NWell region. 18 . The integrated circuit structure of claim 13 , wherein each of the plurality of discrete gate stacks of the varactor structure comprises a high-k gate dielectric layer and a metal gate electrode, wherein each of the plurality of merged gate stacks of the tap structure comprises a high-k gate dielectric layer and a metal gate electrode, and wherein each of the plurality of gate stacks of the transistor structure comprises a high-k gate dielectric layer and a metal gate electrode. 19 . A computing device, comprising: a board; and a component coupled to the board, the component including an integrated circuit structure, comprising: a varactor structure on a semiconductor island on a semiconductor substrate, the varactor structure comprising a plurality of discrete gate stacks on the semiconductor island; a tap structure adjacent to the varactor structure on the semiconductor island, the tap structure comprising a plurality of merged gate stacks on the semiconductor island; and a transistor structure on the semiconductor substrate, the transistor structure isolated from the semiconductor island, and the transistor structure comprising a plurality of merged vertical arrangements of horizontal nanowires, and a plurality of gate stacks over and surrounding corresponding ones of the plurality of merged vertical arrangements of horizontal nanowires. 20 . The computing device of claim 19 , further comprising: a memory coupled to the board. 21 . The computing device of claim 19 , further comprising: a communication chip coupled to the board. 22 . The computing device of claim 19 , wherein the component is a packaged integrated circuit die.

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Classifications

  • Nanowires · CPC title

  • Silicon, silicon germanium or germanium · CPC title

  • oriented parallel to substrates · CPC title

  • of capacitors having potential barriers, e.g. varactors · CPC title

  • characterised by the structure of the channel, e.g. transverse or longitudinal shape or doping profile (TFTs having channel structures for preventing kink or snapback effects H10D30/6708; TFTs having lightly-doped source or drain extensions H10D30/6715) · CPC title

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What does patent US2021305436A1 cover?
Gate-all-around integrated circuit structures including varactors are described. For example, an integrated circuit structure includes a varactor structure on a semiconductor substrate. The varactor structure includes a plurality of discrete vertical arrangements of horizontal nanowires. A plurality of gate stacks is over and surrounding corresponding ones of the plurality of discrete vertical …
Who is the assignee on this patent?
Intel Corp
What technology area does this patent fall under?
Primary CPC classification H10D1/64. Mapped technology areas include Electricity.
When was this patent published?
Publication date Thu Sep 30 2021 00:00:00 GMT+0000 (Coordinated Universal Time) (A1). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).