Raw material for forming thin film by atomic layer deposition method and method for producing thin film

US2021155638A1 · US · A1

Patent metadata
FieldValue
Publication numberUS-2021155638-A1
Application numberUS-201917048360-A
CountryUS
Kind codeA1
Filing dateApr 8, 2019
Priority dateApr 20, 2018
Publication dateMay 27, 2021
Grant date

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  1. Title

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  2. Abstract

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Abstract

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where R1 represents an isopropyl group, a sec-butyl group, or a tert-butyl group. A thin-film containing a magnesium atom is produced on a surface of a substrate with high productivity through use of the raw material.

First claim

Opening claim text (preview).

1 . A thin-film forming raw material, which is used in an atomic layer deposition method, comprising a magnesium compound represented by the following general formula (1): where R 1 represents an isopropyl group, a sec-butyl group, or a tert-butyl group. 2 . A method of producing a thin-film containing a magnesium atom on a surface of a substrate, the method comprising the steps of: vaporizing the thin-film forming raw material of claim 1 , which is used in an atomic layer deposition method and depositing the thin-film forming raw material, which is used in an atomic layer deposition method on the surface of the substrate, to thereby form a precursor thin-film; and subjecting the precursor thin-film to a reaction with a reactive gas, to thereby form the thin-film containing a magnesium atom on the surface of the substrate. 3 . The method of producing a thin-film according to claim 2 , wherein the reactive gas is an oxidizing gas, and wherein the thin-film is magnesium oxide. 4 . The method of producing a thin-film according to claim 3 , wherein the oxidizing gas is a gas containing ozone or water vapor. 5 . The method of producing a thin-film according to claim 3 , wherein the step of subjecting the precursor thin-film to a reaction with the reactive gas is performed at a temperature within a range of from 200° C. to 400° C. 6 . The method of producing a thin-film according to claim 4 , wherein the step of subjecting the precursor thin-film to a reaction with the reactive gas is performed at a temperature within a range of from 200° C. to 400° C.

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Classifications

  • Coating compositions, e.g. paints, varnishes or lacquers, based on inorganic substances · CPC title

  • C23C16/403Primary

    of aluminium, magnesium or beryllium · CPC title

  • characterized by the use of precursors specially adapted for ALD · CPC title

  • by bubbling of carrier gas through liquid source material · CPC title

  • Metallocenes · CPC title

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What does patent US2021155638A1 cover?
where R1 represents an isopropyl group, a sec-butyl group, or a tert-butyl group. A thin-film containing a magnesium atom is produced on a surface of a substrate with high productivity through use of the raw material.
Who is the assignee on this patent?
Adeka Corp
What technology area does this patent fall under?
Primary CPC classification C23C16/403. Mapped technology areas include Chemistry & Metallurgy.
When was this patent published?
Publication date Thu May 27 2021 00:00:00 GMT+0000 (Coordinated Universal Time) (A1). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).