Method for determining a position of an object in a beam apparatus, computer program product and beam apparatus for carrying out the method
US-2024258068-A1 · Aug 1, 2024 · US
US2021012483A1 · US · A1
| Field | Value |
|---|---|
| Publication number | US-2021012483-A1 |
| Application number | US-202016922490-A |
| Country | US |
| Kind code | A1 |
| Filing date | Jul 7, 2020 |
| Priority date | Jul 10, 2019 |
| Publication date | Jan 14, 2021 |
| Grant date | — |
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Provided is an analysis method for a crack rate of an electrode active material of an electrode, comprising the steps of: forming an electrode including an electrode active material, a binder, and a conductive material; impregnating the electrode with a resin and visualizing material regions including the electrode active material, the binder, and the conductive material which are included in the electrode, and a pore region; cutting the electrode and forming an electrode cross-section sample; photographing a cross section of the electrode cross-section sample using a scanning electron microscope and obtaining a cross-sectional image; performing primary image processing on the cross-sectional image and extracting total surface area pixels of the electrode active material; performing secondary image processing on the cross-sectional image and extracting total boundary pixels of the electrode active material; and calculating a crack rate of the electrode active material of the electrode in the cross-sectional image.
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1 . An analysis method for a crack rate of an electrode active material of an electrode for a secondary battery, comprising the steps of: forming an electrode including an electrode active material, a binder, and a conductive material; impregnating the electrode with a resin and visualizing material regions including the electrode active material, the binder, and the conductive material which are included in the electrode, and a pore region; cutting the electrode and forming an electrode cross-section sample; photographing a cross section of the electrode cross-section sample using a scanning electron microscope and obtaining a cross-sectional image; performing primary image processing on the cross-sectional image and extracting total surface area pixels of the electrode active material; performing secondary image processing on the cross-sectional image and extracting total boundary pixels of the electrode active material; and calculating a crack rate of the electrode active material of the electrode in the cross-sectional image using Equation 1, A crack rate (%) of an electrode active material={(total surface area pixels of the electrode active material which are extracted from a cross-sectional image/total boundary pixels of the electrode active material which are extracted from the cross-sectional image)×100}. [Equation 1] 2 . The analysis method of claim 1 , further comprising step of pressing the electrode and calculating a crack rate of the pressed electrode active material of the electrode in the cross-sectional image using Equation 1. 3 . The analysis method of claim 1 , wherein the resin includes an epoxy-based resin. 4 . The analysis method of claim 1 , wherein the cutting of the electrode in the is performed by irradiating the electrode with an argon ion beam of an ion milling device. 5 . The analysis method of claim 4 , wherein an ion beam current of the ion milling device ranges from 10 μA to 250 μA. 6 . An analysis method for a crack rate of an electrode active material of an electrode for a secondary battery, comprising the steps of: forming an electrode including an electrode active material, a binder, and a conductive material; impregnating the electrode with a resin and visualizing material regions including the electrode active material, the binder, and the conductive material which are included in the electrode, and a pore region; cutting the electrode and forming an electrode cross-section sample; photographing a cross section of the electrode cross-section sample using a scanning electron microscope and obtaining a cross-sectional image; performing primary image processing on the cross-sectional image and extracting total surface area pixels of the electrode active material; performing secondary image processing on the cross-sectional image and extracting total boundary pixels of the electrode active material; calculating a crack rate of the electrode active material of the electrode in the cross-sectional image using Equation 1 below, A crack rate (%) of an electrode active material={(total surface area pixels of the electrode active material which are extracted from a cross-sectional image/total boundary pixels of the electrode active material which are extracted from the cross-sectional image)×100}; [Equation 1] manufacturing a secondary battery including the electrode; and charging or discharging the secondary battery with a driving voltage of 3.0 to 4.2 V and then separating the electrode from the secondary battery, and calculating the crack rate of the electrode active material of the separated electrode according to Equation 1.
using incident electron beams, e.g. scanning electron microscopy [SEM] · CPC title
in the solid state, e.g. by cutting · CPC title
Li-accumulators · CPC title
Processes of manufacture · CPC title
of complete cells or cells stacks · CPC title
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