Test arrangement and test method

Patent metadata

Field	Value
Publication number	US-2019064262-A1
Application number	US-201715687820-A
Country	US
Kind code	A1
Filing date	Aug 28, 2017
Priority date	Aug 28, 2017
Publication date	Feb 28, 2019
Grant date	—

Abstract

Summarizing, the present invention relates to a test arrangement in the test method for acquiring test data in the surrounding of a device under test. At least two measurement devices are arranged in the surrounding of the device under test, wherein the two measurement devices are communicatively coupled for phase locking. At least one of the measurement devices can be moved around the device under test for acquiring measurement data, wherein the measurement devices comprise a measurement antenna and the vectorial measurement receiver. Accordingly, during the measurements, the at least one vectorial measurement receiver is moved around together with the measurement antenna, wherein the spatial relationship between the measurement antenna and the vectorial measurement receiver is remained constant during the movement.

First claim

1 . A test arrangement for testing a device under test, the test arrangement comprising:
a first measurement device comprising a first measurement antenna for measuring first signals emitted by the device under test and a first vectorial measurement receiver for vectorially analysing the measured first signals; a second measurement device comprising a second measurement antenna for measuring second signals emitted by the antenna under test and a second vectorial measurement receiver for vectorially analysing the measured second signals, wherein the second measurement device is communicatively coupled to the first measurement device for exchanging phase information or phase synchronisation or phase locking; and a mechanical positioning structure that carries the first measurement device and controllably moves the first measurement antenna and the first vectorial measurement receiver of the first measurement device around the device under test.

2 . The test arrangement of claim 1 , wherein the spatial alignment between the first measurement antenna and the first vectorial measurement receiver of the first measurement device remains constant when the first measurement device is moved by the mechanical positioning structure.

3 . The test arrangement of claim 1 , wherein the first measurement antenna is directly connected to the first vectorial measurement receiver of the first measurement device.

4 . The test arrangement of claim 1 , wherein the first measurement antenna and the first vectorial measurement receiver of the first measurement device are arranged on a same printed circuit board.

5 . The test arrangement of claim 1 , comprising a further the mechanical positioning structure that carries the second measurement device and controllably moves the second measurement antenna and the second vectorial measurement receiver of the second measurement device around the device under test.

6 . The test arrangement according to claim 1 , wherein the mechanical positioning structure moves the first measurement device around the device under test on a predetermined measurement area.

7 . The test arrangement of claim 6 , wherein the second measurement device is located outside the predetermined measurement area.

8 . The test arrangement of claim 1 , wherein the first measurement device and the second measurement device are arranged in a near-field distance of the device under test.

9 . The test arrangement of claim 8 , comprising a transformation processor that is coupled to the first measurement device and the second measurement device and performs a near-field to far-field transformation based on the signals received from the device under test and outputs respective transformed signals.

10 . The test arrangement of claim 1 , comprising a measurement chamber that accommodates the first measurement device, the second measurement device, the mechanical positioning structure and the device under test.

11 . A test method for testing a device under test, the test method comprising:
measuring, by a first measurement antenna, first signals emitted by the device under test; vectorially analysing the measured first signals by a first vectorial measurement receiver; measuring, by a second measurement antenna, second signals emitted by the device under test; vectorially analysing the measured second signals by a second vectorial measurement receiver, wherein the vectorial measurement receiver is communicatively coupled to the first vectorial measurement receiver for exchanging phase information or phase synchronisation or phase locking; and controllably moving the first measurement antenna together with the first vectorial measurement receiver around the device under test by a mechanical positioning structure.

12 . The test method of claim 11 , wherein the spatial alignment between the first measurement antenna and the first vectorial measurement receiver of the first measurement device is kept constant when the first measurement antenna and the first vectorial measurement receiver are moved.

13 . The test method of claim 11 , wherein the first measurement antenna is directly connected to the first vectorial measurement receiver of the first measurement device.

14 . The test method of claim 11 , wherein the first measurement antenna and the first vectorial measurement receiver of the first measurement device are arranged on a same printed circuit board.

15 . The test arrangement of claim 11 , comprising controllably moving the second measurement antenna together with the second vectorial measurement receiver around the device under test.

16 . The test method according to claim 11 , comprising moving the first measurement antenna and the first vectorial measurement receiver around the device under test on a predetermined measurement area.

17 . The test method of claim 16 , wherein the second measurement antenna and the second vectorial measurement receiver are located outside the predetermined measurement area.

18 . The test method of claim 11 , wherein the first measurement antenna and the second measurement antenna are arranged in a near-field distance of the device under test.

19 . The test method of claim 11 , comprising performing a near-field to far-field transformation based on the signals received from the device under test and outputting respective transformed signals.

20 . The test method of claim 11 , comprising accommodating the first measurement antenna, the first vectorial measurement receiver, the second measurement antenna, the second vectorial measurement receiver, the mechanical positioning structure and the device under test in a measurement chamber.

Assignees

• Rohde & Schwarz

Inventors

• Schnattinger Georg
• Perndl Werner
• Katzer Michael
• Pfaffeneder Korbinian
• Braunstorfinger Thomas
• Thraenhardt Marcel

Classifications

• G01R31/3025 Primary

  Wireless interface with the DUT · CPC title

• G01R29/105 Primary

  using anechoic chambers; Chambers or open field sites used therefor (test sites used for measuring on other objects than aerials G01R29/0828; wave absorbing devices H01Q17/00) · CPC title