Electrical test and measurement device, measurement extension device as well as test and measurement system

Patent metadata

Field	Value
Publication number	US-2018335453-A1
Application number	US-201815981531-A
Country	US
Kind code	A1
Filing date	May 16, 2018
Priority date	May 18, 2017
Publication date	Nov 22, 2018
Grant date	—

Abstract

An electrical test and measurement device is described that has at least one analog channel comprising an analog input, an attenuator circuit, an amplifier unit, and a digitizer. The electrical test and measurement device comprises another digitizer allocated to a digitizer input of the electrical test and measurement device. The digitizer input is configured to be connected to a measurement extension device. Further, a measurement extension device and a test and measurement system are described.

First claim

The embodiments of the invention in which an exclusive property or privilege is claimed are defined as follows:

1 . An electrical test and measurement device with at least one analog channel that comprises an analog input, an attenuator circuit, an amplifier unit, and a digitizer, the electrical test and measurement device comprising another digitizer allocated to a digitizer input of the electrical test and measurement device, the digitizer input being configured to be connected to a measurement extension device.

2 . The electrical test and measurement device according to claim 1 , wherein at least two analog channels are provided.

3 . The electrical test and measurement device according to claim 1 , wherein four analog channels are provided.

4 . The electrical test and measurement device according to claim 1 , wherein a signal processing unit is provided.

5 . The electrical test and measurement device according to claim 4 , wherein the signal processing unit has a predetermined maximum sample rate processing power.

6 . The electrical test and measurement device according to claim 4 , wherein the signal processing unit comprises at least one decimator configured to decimate the sample rate.

7 . The electrical test and measurement device according to claim 1 , wherein the electrical test and measurement device is an oscilloscope.

8 . A measurement extension device for being connected to an electrical test and measurement device, the measurement extension device having at least one analog channel comprising an analog input, an attenuator circuit and an amplifier unit, the measurement extension device having an analog output interface.

9 . The measurement extension device according to claim 8 , wherein the analog channel further comprises an isolating unit configured to isolate the analog output interface from at least one of the attenuator circuit and the amplifier unit.

10 . The measurement extension device according to claim 9 , wherein the isolating unit comprises an isolated control signal interface configured to control the amplifier unit.

11 . The measurement extension device according to claim 9 , wherein the isolating unit comprises a power supply interface.

12 . The measurement extension device according to claim 8 , wherein a time delay compensation unit is provided that is configured to compensate time delays introduced by the analog channel.

13 . The measurement extension device according to claim 12 , wherein the time delay compensation unit comprises a switch unit allocated to the analog input, the switch unit being configured to switch between a calibration signal interface and an input channel allocated to the analog input.

14 . The measurement extension device according to claim 8 , wherein the analog output interface is configured to be connected with a test and measurement device.

15 . The measurement extension device according to claim 8 , wherein the amplifier unit comprises a variable gain amplifier.

16 . The measurement extension device according to claim 8 , wherein at least two analog channels are provided.

17 . The measurement extension device according to claim 8 , wherein four analog channels are provided.

18 . A test and measurement system comprising:
a test and measurement device according to claim 1 ; and a measurement extension device having at least one analog channel comprising an analog input, an attenuator circuit and an amplifier unit, the measurement extension device having an analog output interface.

Assignees

• Rohde & Schwarz

Inventors

• Diegmann Philip

Classifications

• G01R13/28 Primary

  Circuits for simultaneous or sequential presentation of more than one variable · CPC title

• G01R13/00 Primary

  Arrangements for displaying electric variables or waveforms · CPC title

• G01R19/2509

  Details concerning sampling, digitizing or waveform capturing · CPC title

• G01R13/22 Primary

  Circuits therefor · CPC title