Ai embedding vector data base calibration architecture
US-2025370039-A1 · Dec 4, 2025 · US
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Circuits for simultaneous or sequential presentation of more than one variable
Circuits for simultaneous or sequential presentation of more than one variable · Cooperative Patent Classification (CPC)
Computing, optics, measurement, and control technologies.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | G01R13/28 |
| Official title | Circuits for simultaneous or sequential presentation of more than one variable |
| Display label | Circuits for simultaneous or sequential presentation of more than one variable |
| Total patents | 19 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is stable.
| Year | Patents |
|---|---|
| 2015 | 3 |
| 2017 | 1 |
| 2018 | 2 |
| 2019 | 3 |
| 2020 | 1 |
| 2021 | 3 |
| 2022 | 3 |
| 2024 | 2 |
| 2025 | 1 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Split-path multiplexing accessory for a test and measurement instrument
US-2024159824-A1 · May 16, 2024 · US
Multiprobe measurement device and method
US-11867724-B2 · Jan 9, 2024 · US
Electrical test and measurement device, measurement extension device as well as test and measurement system
US-11249115-B2 · Feb 15, 2022 · US
Measuring system and method
US-2022034941-A1 · Feb 3, 2022 · US
Automatic detection of logical path segments in a measurement population
US-11237190-B2 · Feb 1, 2022 · US
Measuring system and method
US-11169181-B2 · Nov 9, 2021 · US
Measuring system and method
US-11061053-B2 · Jul 13, 2021 · US
Measuring system and method
US-11047881-B2 · Jun 29, 2021 · US
Interactive instrument measurement analytics
US-2020233016-A1 · Jul 23, 2020 · US
Measuring system and method
US-2019324061-A1 · Oct 24, 2019 · US
Measuring system and method
US-2019113538-A1 · Apr 18, 2019 · US
Measuring system and method
US-2019113541-A1 · Apr 18, 2019 · US
Electrical test and measurement device, measurement extension device as well as test and measurement system
US-2018335453-A1 · Nov 22, 2018 · US
Multiple timebase sampling scope
US-10079639-B2 · Sep 18, 2018 · US
Multiple timebase sampling scope
US-2017346555-A1 · Nov 30, 2017 · US
Programmable interface-based validation and debug
US-9152520-B2 · Oct 6, 2015 · US
Programmable interface-based validation and debug
US-2015253387-A1 · Sep 10, 2015 · US
Programmable interface-based validation and debug
US-2015089289-A1 · Mar 26, 2015 · US