Tin compound, method of synthesizing the same, tin precursor compound for atomic layer deposition, and method of forming tin-containing material film

US2018155372A1 · US · A1

Patent metadata
FieldValue
Publication numberUS-2018155372-A1
Application numberUS-201715827317-A
CountryUS
Kind codeA1
Filing dateNov 30, 2017
Priority dateDec 2, 2016
Publication dateJun 7, 2018
Grant date

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A tin compound, tin precursor compound for atomic layer deposition (ALD), a method of forming a tin-containing material film, and a method of synthesizing a tin compound, the tin compound being represented by Chemical Formula (I): wherein R 1 , R 2 , Q 1 , Q 2 , Q 3 , and Q 4 are each independently a Cl to C4 linear or branched alkyl group.

First claim

Opening claim text (preview).

1 . A tin compound represented by Chemical Formula (I): wherein R 1 , R 2 , Q 1 , Q 2 , Q 3 , and Q 4 are each independently a C1 to C4 linear or branched alkyl group. 2 . The tin compound as claimed in claim 1 , wherein Q 1 , Q 2 , Q 3 , and Q 4 are each independently a methyl group, an ethyl group, a n-propyl group, or an isopropyl group. 3 . The tin compound as claimed in claim 1 , wherein Q 1 , Q 2 , Q 3 , and Q 4 are the same and are each a methyl group, an ethyl group, a n-propyl group, or an isopropyl group. 4 . The tin compound as claimed in claim 3 , wherein R 1 and R 2 are each independently a methyl group, an ethyl group, a n-propyl group, or an isopropyl group. 5 . The tin compound as claimed in claim 4 , wherein R 1 and R 2 are the same and are each a methyl group, an ethyl group, a n-propyl group, or an isopropyl group. 6 . The tin compound as claimed in claim 1 , wherein: R 1 and R 2 are each a methyl group, and Q 1 , Q 2 , Q 3 , and Q 4 are the same and are each a methyl group or an isopropyl group. 7 . The tin compound as claimed in claim 1 , wherein the tin compound is in a liquid state at 20° C. 8 . A tin precursor compound for atomic layer deposition (ALD), the tin precursor compound having a structure represented by Chemical Formula (I): wherein R 1 , R 2 , Q 1 , Q 2 , Q 3 , and Q 4 are each independently a C1 to C4 linear or branched alkyl group. 9 . The tin precursor compound as claimed in claim 8 , wherein R 1 and R 2 are each independently a methyl group, an ethyl group, a n-propyl group, or an isopropyl group. 10 . The tin precursor compound as claimed in claim 9 , wherein Q 1 , Q 2 , Q 3 , and Q 4 are the same and are each a methyl group, an ethyl group, a n-propyl group, or an isopropyl group. 11 .- 30 . (canceled) 31 . The tin precursor compound as claimed in claims 9 , R1 and R2 are the same and are each a methyl group, an ethyl group, a n-propyl group, or an isopropyl group. 32 . The tin precursor compound as claimed in claim 8 , wherein Q 1 , Q 2 , Q 3 , and Q 4 are each independently a methyl group, an ethyl group, a n-propyl group, or an isopropyl group. 33 . The tin precursor compound as claimed in claim 8 , wherein: R 1 and R 2 are each a methyl group, and Q 1 , Q 2 , Q 3 , and Q 4 are the same and are each a methyl group or an isopropyl group. 34 . The tin precursor compound as claimed in claim 8 , wherein the tin compound is in a liquid state at 20° C. 35 . A tin precursor compound for depositing tin-containing material film, the tin precursor compound having a structure represented by Chemical Formula (I): <Chemical Formula (I)> wherein R 1 , R 2 , Q 1 , Q 2 , Q 3 , and Q 4 are each independently a C1 to C4 linear or branched alkyl group. 36 . The tin precursor compound as claimed in claim 35 , wherein Q 1 , Q 2 , Q 3 , and Q 4 are the same and are each a methyl group, an ethyl group, a n-propyl group, or an isopropyl group. 37 . The tin precursor compound as claimed in claim 35 , wherein R 1 and R 2 are the same and are each a methyl group, an ethyl group, a n-propyl group, or an isopropyl group. 38 . The tin precursor compound as claimed in claim 35 , wherein the tin compound is in a liquid state at 20° C. 39 . The tin precursor compound as claimed in claim 35 , wherein the tin precursor compound is Sn[N( i Pr) 2 ] 2 Me 2 or Sn[N(Me) 2 ] 2 Me 2 . 40 . The tin precursor compound as claimed in claim 35 , wherein the tin precursor compound is synthesized by a method comprising: obtaining SnX 2 R 2 by reacting SnX 4 with SnR 4 according to Reaction Formula (I); and obtaining Sn(NQ 2 ) 2 R 2 by reacting SnX 2 R 2 with LiNQ 2 according to Reaction Formula (II), SnX 4 +SnR 4 →2SnX 2 R 2   <Reaction Formula (I)> SnX 2 R 2 +2LiNQ 2 →Sn(NQ 2 ) 2 R 2 +2LiX   <Reaction Formula (II)> wherein: X includes fluorine, chlorine, bromine, or iodine, and R and Q are each independently a C1 to C4 linear or branched alkyl group.

Assignees

Inventors

Classifications

  • characterized by the use of precursors specially adapted for ALD · CPC title

  • C07F7/2284Primary

    Compounds with one or more Sn-N linkages · CPC title

  • from metallo-organic compounds · CPC title

  • of zinc, germanium, cadmium, indium, tin, thallium or bismuth · CPC title

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What does patent US2018155372A1 cover?
A tin compound, tin precursor compound for atomic layer deposition (ALD), a method of forming a tin-containing material film, and a method of synthesizing a tin compound, the tin compound being represented by Chemical Formula (I): wherein R 1 , R 2 , Q 1 , Q 2 , Q 3 , an…
Who is the assignee on this patent?
Samsung Electronics Co Ltd, Dnf Co Ltd
What technology area does this patent fall under?
Primary CPC classification C23C16/45553. Mapped technology areas include Chemistry & Metallurgy.
When was this patent published?
Publication date Thu Jun 07 2018 00:00:00 GMT+0000 (Coordinated Universal Time) (A1). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).