Improved line-field imaging systems and methods

Patent metadata

Field	Value
Publication number	US-2016209201-A1
Application number	US-201415025410-A
Country	US
Kind code	A1
Filing date	Oct 2, 2014
Priority date	Oct 9, 2013
Publication date	Jul 21, 2016
Grant date	—

Abstract

Improved line-field imaging systems incorporating planar waveguides are presented. In one embodiment the optics of the system are configured such that a line of light on the light scattering object is imaged to the planar waveguide in at least one dimension. Embodiments where the waveguide incorporates a beamsplitter of an interferometer, where the beam divider and waveguide are referenced to one or more common surfaces, and wherein the source and waveguide are optically coupled, are also considered. In another embodiment, the planar waveguide is in contact or close proximity to the light scattering object.

First claim

1 . An interferometric imaging system for imaging a light scattering object comprising:
a light source for generating a beam of radiation; a beam divider for separating the beam into reference and sample arms, wherein the sample arm contains the light scattering object to be imaged; illumination optics to deliver a line of light from said beam of radiation to the light scattering object to be imaged; a linear detector array; collection optics for combining light scattered from the object and light from the reference arm and directing the combined light towards the detector array; and a processor for generating an image in response to signals generated by the detector; wherein the apparatus includes a planar waveguide and wherein the optics are configured such that a line of light on the light scattering object is imaged to said planar waveguide in at least one dimension.

2 . An interferometric imaging system as recited in claim 1 , wherein the planar waveguide is included in the collection optics.

3 . An interferometric imaging system as recited in claim 1 , wherein the planar waveguide is located between the scattering object and the collection optics.

4 . An interferometric imaging system as recited in claim 1 , wherein the planar waveguide is included in both the illumination and collection optics.

5 . An interferometric imaging system as recited in claim 1 , wherein the planar waveguide is bonded to the detector array.

6 . An interferometric imaging system as recited in claim 1 , wherein the light source is coupled into a single mode fiber and the planar waveguide is connected to said fiber.

7 . An interferometric imaging system as recited in claim 1 , wherein the beam divider is incorporated within the planar waveguide.

8 . An interferometric imaging system as recited in claim 7 , wherein the beam divider is formed by bonding together two planar waveguides.

9 . An interferometric imaging system as recited in claim 7 , wherein the beam divider is a reflection surface within the planar waveguide.

10 . An interferometric imaging system as recited in claim 7 , wherein the beam divider is a coupling region between two parallel waveguiding layers.

11 . An interferometric imaging system as recited in claim 1 , wherein the beam divider and the waveguide are referenced to a common surface.

12 . An interferometric imaging system as recited in claim 1 , wherein the beam divider and the waveguide are referenced to two parallel surfaces.

13 . An interferometric imaging system as recited in claim 1 , wherein the source and the waveguide are on a single substrate.

14 . An interferometric imaging system as recited in claim 1 , wherein the source is optically coupled directly to the waveguide.

15 . An interferometric imaging system as recited in claim 1 , wherein the interferometric imaging system is one of optical coherence tomography, holoscopy, interferometric synthetic aperture microscopy, optical diffraction tomography, and digital interferometric holography, and holographic OCT.

16 . An interferometric imaging system as recited in claim 1 , wherein the reference arm comprises fiber optic elements.

17 . An interferometric imaging system as recited in claim 1 , wherein the reference arm comprises bulk optical elements.

18 . An interferometric imaging system as recited in claim 1 , wherein the numerical aperture in the collection optics is different along the two axes of the linear detector array.

19 . An interferometric imaging system as recited in claim 1 , wherein the numerical aperture in the collection optics is larger along the longer axis of the linear detector array.

20 . An interferometric imaging system as recited in claim 1 , wherein the axes of the optical system are rotated with respect to the object to be imaged.

21 . An interferometric imaging system as recited in claim 1 , wherein the system is polarization sensitive.

22 . An interferometric imaging system as recited in claim 1 , wherein the optics are configured such that a line of light on the light scattering object is imaged to said planar waveguide in two dimensions.

23 . (canceled)

24 . An interferometric imaging system for imaging a light scattering object comprising:
a light source for generating a beam of radiation; a beam divider for separating the beam into reference and sample arms, wherein the sample arm contains the light scattering object to be imaged; illumination optics to deliver a line of light from said beam of radiation to the light scattering object to be imaged; a linear detector array; collection optics including a beam combiner for collecting and combining light scattered from the object and light from the reference arm and directing the combined light towards the detector array; and a processor for generating an image in response to signals generated by the detector and wherein one of the beam divider or the beam combiner incorporates a planar waveguide configured such that a line of light on the light scattering object is imaged to said planar waveguide in at least one dimension.

25 . An interferometric imaging system as recited in claim 24 wherein the beam divider and the beam combiner are a single element.

26 . An interferometric imaging system as recited in claim 24 , wherein the planar waveguide is bonded to the detector array.

27 . An interferometric imaging system as recited in claim 24 , wherein the light source is coupled into a single mode fiber and the planar waveguide is connected to said fiber.

28 . An interferometric imaging system as recited in claim 24 , wherein planar waveguide is incorporated in the beam divider and wherein the beam divider is formed by bonding together two planar waveguides.

29 . An interferometric imaging system as recited in claim 24 , wherein planar waveguide is incorporated in the beam combiner and wherein the beam combiner is formed by bonding together two planar waveguides.

30 . An interferometric imaging system as recited in claim 24 , wherein the numerical aperture in the collection optics is different along the two axes of the linear detector array.

31 . An interferometric imaging system as recited in claim 24 , wherein the numerical aperture in the collection optics is larger along the longer axis of the linear detector array.

32 . An interferometric imaging system as recited in claim 24 , wherein the optics are configured such that a line of light on the light scattering object is imaged to said planar waveguide in two dimensions.

Assignees

• Zeiss Carl Meditec Inc

Inventors

• Everett Matthew J
• Schmoll Tilman
• Tumlinson Alexandre R

Classifications

• G02B6/2821

  using lateral coupling between contiguous fibres to split or combine optical signals · CPC title

• G02B6/125

  Bends, branchings or intersections · CPC title

• G01B9/02056

  Passive reduction of errors · CPC title

• G01B9/02004

  using frequency scans · CPC title

• G01B9/02091

  Tomographic interferometers, e.g. based on optical coherence · CPC title