Line-field imaging systems and methods incorporating planar waveguides

US10113856B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10113856-B2
Application numberUS-201415025410-A
CountryUS
Kind codeB2
Filing dateOct 2, 2014
Priority dateOct 9, 2013
Publication dateOct 30, 2018
Grant dateOct 30, 2018

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  5. First independent claim

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Abstract

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Improved line-field imaging systems incorporating planar waveguides are presented. In one embodiment the optics of the system are configured such that a line of light on the light scattering object is imaged to the planar waveguide in at least one dimension. Embodiments where the waveguide incorporates a beamsplitter of an interferometer, where the beam divider and waveguide are referenced to one or more common surfaces, and wherein the source and waveguide are optically coupled, are also considered. In another embodiment, the planar waveguide is in contact or close proximity to the light scattering object.

First claim

Opening claim text (preview).

The invention claimed is: 1. An interferometric imaging system for imaging a light scattering object comprising: a light source for generating a beam of radiation; a beam divider for separating the beam into reference and sample arms, wherein the sample arm contains the light scattering object to be imaged; one or more lenses arranged to create and project a line of light from said beam of radiation to the light scattering object to be imaged; a linear detector array arranged to receive light scattered from the object and light from the reference arm and generate signals in response thereto; a processor for generating an image in response to signals generated by the detector; and a planar waveguide positioned such that the line of light on the light scattering object is imaged to said planar waveguide in at least one dimension, said planar waveguide for reducing transverse modes in said one dimension. 2. The interferometric imaging system as recited in claim 1 wherein the beam divider also functions to combine light scattered from the object and light from the reference arm. 3. The interferometric imaging system as recited in claim 2 wherein the planar waveguide is positioned between the beam divider and the linear detector array. 4. The interferometric imaging system as recited in claim 3 further including a second planar waveguide positioned between the beam divider and the scattering object. 5. The interferometric imaging system as recited in claim 2 wherein the planar waveguide is positioned between the beam divider and the scattering object. 6. The interferometric imaging system as recited in claim 2 wherein the planar waveguide is formed integrally with the beam divider. 7. The interferometric imaging system as recited in claim 2 , wherein the beam divider is formed by bonding together two planar waveguides. 8. The interferometric imaging system as recited in claim 2 , wherein the beam divider is a reflection surface within the planar waveguide. 9. The interferometric imaging system of claim 1 further including a beam combiner arranged to combine light scattered from the object and light from the reference arm. 10. The interferometric imaging system of claim 9 wherein the planar waveguide is positioned between the beam combiner and the linear detector array. 11. The interferometric imaging system of claim 10 further including a second planar waveguide positioned between the beam combiner and the scattering object. 12. The interferometric imaging system of claim 9 wherein the planar waveguide is positioned between the beam combiner and the scattering object. 13. The interferometric imaging system of claim 9 wherein the planar waveguide is formed integrally with the beam combiner. 14. The interferometric imaging system as recited in claim 9 , wherein the beam combiner is a reflection surface within the planar waveguide. 15. The interferometric imaging system as recited in claim 1 , wherein the planar waveguide is bonded to the detector array. 16. The interferometric imaging system as recited in claim 1 , wherein the light source is coupled into a single mode fiber and the planar waveguide is connected to said fiber. 17. An interferometric imaging system for imaging a light scattering object comprising: a light source for generating a beam of radiation; a beam divider for separating the beam into reference and sample arms, wherein the sample arm contains the light scattering object to be imaged, the beam divider also functioning to combine light scattered from the object and light from the reference arm; one or more lenses arranged to create and project a line of light from said beam of radiation to the light scattering object to be imaged; a linear detector array arranged to receive the combined light and generate signals in response thereto; a processor for generating an image in response to signals generated by the detector; and a planar waveguide positioned such that the line of light on the light scattering object is imaged to said planar waveguide in at least one dimension, said planar waveguide for reducing transverse modes in said one dimension, said planar waveguide being integrally formed with the beam divider. 18. The interferometric imaging system as recited in claim 17 wherein the planar waveguide is positioned between the beam divider and the linear detector array. 19. The interferometric imaging system as recited in claim 17 wherein the planar waveguide is positioned between the beam divider and the scattering object. 20. The interferometric imaging system as recited in claim 19 further including a second planar waveguide positioned between the beam divider and the detector array. 21. An interferometric imaging system for imaging a light scattering object comprising: a light source for generating a beam of radiation; a beam divider for separating the beam into reference and sample arms, wherein the sample arm contains the light scattering object to be imaged; one or more lenses arranged to create and project a line of light from said beam of radiation to the light scattering object to be imaged; a beam combiner arranged to combine light scattered from the object and light from the reference arm; a linear detector array arranged to receive the combined light and generate signals in response thereto; a processor for generating an image in response to signals generated by the detector; and a planar waveguide positioned such that the line of light on the light scattering object is imaged to said planar waveguide in at least one dimension, said planar waveguide for reducing transverse modes in said one dimension, said planar waveguide being integrally formed with the beam combiner. 22. The interferometric imaging system as recited in claim 21 wherein the planar waveguide is positioned between the beam combiner and the linear detector array. 23. The interferometric imaging system as recited in claim 21 wherein the planar waveguide is positioned between the beam combiner and the scattering object. 24. The interferometric imaging system as recited in claim 23 further including a second planar waveguide positioned between the beam combiner and the detector array.

Assignees

Inventors

Classifications

  • using lateral coupling between contiguous fibres to split or combine optical signals · CPC title

  • Tomographic interferometers, e.g. based on optical coherence · CPC title

  • Displaying the signal, e.g. for user interaction · CPC title

  • by generating a transverse line focus · CPC title

  • Bends, branchings or intersections · CPC title

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What does patent US10113856B2 cover?
Improved line-field imaging systems incorporating planar waveguides are presented. In one embodiment the optics of the system are configured such that a line of light on the light scattering object is imaged to the planar waveguide in at least one dimension. Embodiments where the waveguide incorporates a beamsplitter of an interferometer, where the beam divider and waveguide are referenced to o…
Who is the assignee on this patent?
Zeiss Carl Meditec Inc
What technology area does this patent fall under?
Primary CPC classification G01B9/02037. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Oct 30 2018 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 1 related publication on this page (citations in our corpus or others sharing the same primary CPC).