Substrate polishing apparatus with contact extension or adjustable stop
US-11904429-B2 · Feb 20, 2024 · US
US2016129549A1 · US · A1
| Field | Value |
|---|---|
| Publication number | US-2016129549-A1 |
| Application number | US-201614988367-A |
| Country | US |
| Kind code | A1 |
| Filing date | Jan 5, 2016 |
| Priority date | Feb 19, 2013 |
| Publication date | May 12, 2016 |
| Grant date | — |
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A chemical mechanical polishing machine includes a polishing head assembly including a polishing head body and a membrane disposed at a bottom of the polishing head body. The bottom surface of the membrane includes a hydrophobic area and a hydrophilic area.
Opening claim text (preview).
What is claimed is: 1 . A polishing head assembly comprising: a polishing head body; and a membrane disposed on a bottom surface of the polishing head body, wherein a bottom surface of the membrane comprises a hydrophobic area and a hydrophilic area. 2 . The polishing head assembly of claim 1 , wherein the membrane further comprises a plurality of holes passing through the membrane. 3 . The polishing head assembly of claim 2 , wherein the polishing head body comprising a gas pipe passing through the polishing head body, and wherein the gas pipe is connected with the plurality of the holes. 4 . The polishing head assembly of claim 3 , further comprising a central shaft on the polishing head body, and wherein the gas pipe extends through the central shaft. 5 . The polishing head assembly of claim 2 , wherein the plurality of holes are disposed in the hydrophilic area. 6 . The polishing head assembly of claim 1 , further comprising a fixing ring disposed between an external side of the membrane, and wherein the fixing ring is directly in contact with the external side of the membrane. 7 . The polishing head assembly of claim 1 , wherein the hydrophobic area locates on an outer portion of the bottom surface of the membrane and the hydrophilic area locates on an inner portion of the bottom surface of the membrane. 8 . The polishing head assembly of claim 7 , wherein the membrane further comprises a hydrophobic center region located at a center portion of the bottom surface of the membrane. 9 . The polishing head assembly of claim 1 , wherein the hydrophilic area locates on an outer portion of the bottom surface of the membrane and the hydrophobic area locates on an inner portion of the bottom surface of the membrane. 10 . The polishing head assembly of claim 1 , wherein the hydrophobic area and the hydrophilic area are arranged in a fan-like form. 11 . The polishing head assembly of claim 1 , wherein the bottom surface of the membrane is directly in contact with a backside of a wafer. 12 . A polishing head assembly comprising: a central shaft; a polishing head body disposed at a bottom of the central shaft, the polishing head body having a gas pipe passing though the polishing head body; and a membrane disposed on a bottom surface of the polishing head body, the membrane having a hole passing through the membrane to be connected with the gas pipe, wherein a bottom surface of the membrane comprises a hydrophobic area and a hydrophilic area. 13 . The polishing head assembly of claim 12 , wherein the polishing head body further comprises a groove in the bottom surface of the polishing head body, and wherein the membrane is disposed in the groove. 14 . The polishing head assembly of claim 13 , further comprising a fixing ring disposed between the polishing head body and the membrane. 15 . The polishing head assembly of claim 14 , wherein the fixing ring disposed between an external side of the membrane and an inner side of the groove. 16 . The polishing head assembly of claim 12 , wherein the hole is disposed in the hydrophilic area. 17 . The polishing head assembly of claim 16 , wherein the hydrophobic area surrounds the hydrophilic area. 18 . A chemical mechanical polishing machine comprising: a turntable; a polishing pad disposed on the turntable, the polishing pad configured to be in contact with a front side of a wafer and polish the wafer; and a polishing head assembly configured to be in contact with a backside of the wafer and fix the wafer, wherein the polishing head assembly comprising: a polishing head body; and a membrane disposed on a bottom surface of the polishing head body, wherein a bottom surface of the membrane comprises a hydrophobic area and a hydrophilic area. 19 . The chemical mechanical polishing machine of claim 18 , wherein the membrane further comprises a plurality of holes passing through the membrane, and wherein the plurality of holes are disposed in the hydrophilic area. 20 . The chemical mechanical polishing machine of claim 19 , wherein the polishing head body comprises a gas pipe passing through the polishing head body, and wherein the gas pipe is connected with the plurality of holes.
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