Optical system for reference switching

US12590837B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-12590837-B2
Application numberUS-202418655689-A
CountryUS
Kind codeB2
Filing dateMay 6, 2024
Priority dateApr 21, 2016
Publication dateMar 31, 2026
Grant dateMar 31, 2026

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

Systems and methods for determining one or more properties of a sample are disclosed. The systems and methods disclosed can be capable of measuring along multiple locations and can reimage and resolve multiple optical paths within the sample. The system can be configured with one-layer or two-layers of optics suitable for a compact system. The optics can be simplified to reduce the number and complexity of the coated optical surfaces, etalon effects, manufacturing tolerance stack-up problems, and interference-based spectroscopic errors. The size, number, and placement of the optics can enable multiple simultaneous or non-simultaneous measurements at various locations across and within the sample. Moreover, the systems can be configured with an optical spacer window located between the sample and the optics, and methods to account for changes in optical paths due to inclusion of the optical spacer window are disclosed.

First claim

Opening claim text (preview).

What is claimed is: 1 . A system for determining properties of a sample, the system comprising: one or more light sources that emit light; a detector array comprising detector pixels; a window; and an optics unit mechanically supported by the window and comprising: a first substrate; and a plurality of collection optics on the first substrate; wherein: light emitted from the one or more light sources is directed toward the sample through the window; the plurality of collection optics receive at least a portion of the light that is returned from the sample through the window; and each optic of the plurality of collection optics transmits a portion of the light to a respective plurality of detector pixels of the detector array. 2 . The system of claim 1 , further comprising an illumination optic; wherein: the illumination optic receives the light emitted from the one or more light sources and directs the light toward the window. 3 . The system of claim 2 , wherein the illumination optic is positioned on the first substrate. 4 . The system of claim 2 , further comprising an outcoupler configured to redirect the light emitted from the one or more light sources toward the illumination optic. 5 . The system of claim 4 , wherein: the illumination optic is positioned on a second substrate; and the second substrate is in contact with the outcoupler. 6 . The system of claim 4 , further comprising a waveguide coupled to the outcoupler; wherein the light emitted from the one or more light sources is directed by the waveguide of the outcoupler. 7 . The system of claim 6 , further comprising a second substrate; wherein: the waveguide is disposed on the second substrate; and the detector array is disposed on the second substrate. 8 . A system for determining properties of a sample, the system comprising: one or more light sources that emit light; a detector array comprising detector pixels; a window; an optics unit mechanically supported by the window and comprising: a first substrate; and a plurality of collection optics on the first substrate; and an aperture layer positioned above the optics unit; wherein: light emitted from the one or more light sources is directed toward the sample through the window; the plurality of collection optics receive at least a portion of the light that is returned from the sample through the window and the aperture layer; and each optic of the plurality of collection optics transmits a portion of the light to a respective detector pixel of the detector array. 9 . The system of claim 8 , wherein the aperture layer is positioned between the window and the optics unit. 10 . The system of claim 8 , wherein the aperture layer is positioned above the window. 11 . The system of claim 8 , wherein the aperture layer comprises metal. 12 . The system of claim 8 , wherein the window comprises sapphire. 13 . The system of claim 8 , wherein the one or more light sources includes a plurality of light sources. 14 . The system of claim 8 , further comprising an illumination optic; wherein: the illumination optic receives the light emitted from the one or more light sources and directs the light toward the window. 15 . A method for determining properties of a sample, comprising: emitting light using one or more light sources; directing the light toward the sample through a window; receiving at least a portion of a return of the light through the window at an optics unit, the optics unit mechanically supported by the window and comprising: a first substrate; a plurality of collection optics disposed on the first substrate; redirecting the light using the plurality of collection optics and towards a detector array comprising director pixels; and detecting light using the detector array, wherein: each optic of the plurality of collection optics transmits a portion of the light to a respective plurality of detector pixels of the detector array. 16 . The method of claim 15 , further comprising: directing the light from the one or more light sources to an outcoupler. 17 . The method of claim 16 , further comprising: redirecting the light from the outcoupler to an illumination optic. 18 . The method of claim 17 , further comprising: directing the light from the illumination optic to the window. 19 . The method of claim 17 , wherein: the illumination optic is positioned on a second substrate; and the second substrate is in contact with the outcoupler. 20 . The method of claim 17 , wherein the illumination optic is positioned on the first substrate.

Assignees

Inventors

Classifications

  • Arrangements of light sources specially adapted for spectrometry or colorimetry · CPC title

  • G01J3/0205Primary

    Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows · CPC title

  • within a body or fluid · CPC title

  • Multiangle measurement · CPC title

  • using light concentrators or collectors or condensers · CPC title

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What does patent US12590837B2 cover?
Systems and methods for determining one or more properties of a sample are disclosed. The systems and methods disclosed can be capable of measuring along multiple locations and can reimage and resolve multiple optical paths within the sample. The system can be configured with one-layer or two-layers of optics suitable for a compact system. The optics can be simplified to reduce the number and c…
Who is the assignee on this patent?
Apple Inc
What technology area does this patent fall under?
Primary CPC classification G01J3/0205. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Mar 31 2026 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 12 related publications on this page (citations in our corpus or others sharing the same primary CPC).