Cationically photopolymerizable composition, bonding method, electronic device, method for manufacturing electronic device, display device and method for manufacturing display device
US-2017218236-A1 · Aug 3, 2017 · US
US12568843B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-12568843-B2 |
| Application number | US-202418618843-A |
| Country | US |
| Kind code | B2 |
| Filing date | Mar 27, 2024 |
| Priority date | Dec 9, 2020 |
| Publication date | Mar 3, 2026 |
| Grant date | Mar 3, 2026 |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
In some examples, a sensor package includes a semiconductor die having a sensor; a mold compound covering a portion of the semiconductor die; and a cavity formed in a top surface of the mold compound, the sensor being in the cavity. The sensor package includes an adhesive abutting the top surface of the mold compound, and a semi-permeable film abutting the adhesive and covering the cavity. The semi-permeable film is approximately flush with at least four edges of the top surface of the mold compound.
Opening claim text (preview).
What is claimed is: 1 . A semiconductor package, comprising: a semiconductor die including a sensor; a mold compound covering a portion of the semiconductor die; a cavity formed through the mold compound over the sensor; an adhesive layer disposed over the mold compound; and a film disposed over the adhesive layer, wherein the film includes an orifice at a corner of a top surface of the semiconductor package. 2 . The semiconductor package of claim 1 , wherein the adhesive layer includes at least one edge that is flush with at least one edge of the mold compound. 3 . The semiconductor package of claim 1 , further comprising: a second cavity formed through the adhesive layer over the sensor. 4 . The semiconductor package of claim 1 , further comprising: a second cavity formed through the adhesive layer, wherein the second cavity is aligned with the cavity. 5 . The semiconductor package of claim 1 , wherein a corner of a top surface of the adhesive layer is exposed to an exterior of the semiconductor package. 6 . The semiconductor package of claim 1 , wherein the film includes at least one edge that is flush with at least one edge of the mold compound. 7 . The semiconductor package of claim 1 , wherein the film is a semi-permeable film. 8 . The semiconductor package of claim 7 , wherein the semi-permeable film covers the cavity. 9 . The semiconductor package of claim 1 , wherein the semiconductor package is a quad flat no-lead (QFN) style sensor package. 10 . A semiconductor package, comprising: a semiconductor die including a sensor; a mold compound covering at least a portion of the semiconductor die; a first cavity extending through the mold compound over the sensor; an adhesive layer disposed over the mold compound; a second cavity extending through the adhesive layer, the second cavity is aligned with the first cavity; and a film disposed over the adhesive layer, wherein the film includes an orifice at a corner of a top surface of the semiconductor package. 11 . The semiconductor package of claim 10 , wherein the adhesive layer includes at least one edge that is flush with at least one edge of the mold compound. 12 . The semiconductor package of claim 10 , wherein a corner of a top surface of the adhesive layer is exposed to an exterior of the semiconductor package. 13 . The semiconductor package of claim 10 , wherein the film includes at least one edge that is flush with at least one edge of the mold compound. 14 . The semiconductor package of claim 10 , wherein the film is a semi-permeable film that covers the first cavity and the second cavity. 15 . The semiconductor package of claim 10 , wherein the semiconductor package is a quad flat no-lead (QFN) style sensor package.
Package configurations · CPC title
comprising organic materials, e.g. plastics or resins · CPC title
using moulds · CPC title
being on a metallic substrate, e.g. insulated metal substrates [IMS] · CPC title
Arrangements for protection of devices (arrangements for thermal protection H10W40/00) · CPC title
Related publications grouped by family.
Answers are generated from the same data shown on this page.