Film formation method

US12565714B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-12565714-B2
Application numberUS-202418603541-A
CountryUS
Kind codeB2
Filing dateMar 13, 2024
Priority dateMar 13, 2023
Publication dateMar 3, 2026
Grant dateMar 3, 2026

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  7. Citations and related patents

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Abstract

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A film formation method having an excellent mass productivity, whereby a time required for forming a film having a desired thickness is short. In the film formation method, at least one of a metal complex having two or more different ligands, and a metal complex having same ligands and substituents is used, and the method includes atomizing or dropletizing a liquid containing the metal complex, conveying resulting mist or droplets to a base by a carrier gas, and forming a metal oxide film on the base by thermally reacting the mist or droplets in the vicinity of the base.

First claim

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What is claimed is: 1 . A film formation method, the method comprising steps of: atomizing or dropletizing a liquid containing a metal complex, the metal complex being at least one of: a metal complex having two or more different ligands, and a metal complex having same ligands and substituents; conveying a resulting mist or droplets to a base by a carrier gas; and forming a metal oxide film on the base by thermally reacting the mist or droplets in the vicinity of the base, wherein the two or more different ligands include at least one ligand represented by following formula (1) and at least one ligand selected from a group consisting of a ligand derived from acetylacetonato, a ligand having a heterocyclic structure, and the ligand represented by following formula (1), and in following formula (1), the dotted line represents a coordinate bond, *1 represents a coordinate bond position with a metal, *2 represents a bond position with a metal, and each of R 1 and R 2 independently represents an alkyl group having 1 to 6 carbon atoms, the metal complex having the same ligands and substituents is represented by following formula (2), and in following formula (2), the dotted line represents a coordinate bond, each of R 3 and R 4 independently represents hydrogen atom, a halogen atom, an alkyl group having 1 to 6 carbon atoms, a phenyl group, or a tolyl group, R 5 represents a halogen atom, a formyl group, an acetoxy group, a sulfo group, a mesyl group, a nitro group, a nitroso group, a phosphoryl group, or an alkyl group having 1 to 6 carbon atoms, and X represents a central metal 2 . The film formation method according to claim 1 , wherein a central metal coordinated in the metal complex having the two or more different ligands, and the central metal represented by X in the metal complex represented by formula (2) are each, independently, a d-block metal or a Group 13 metal in the periodic table. 3 . The film formation method according to claim 2 , wherein the central metals contain a Group 9 metal in the d-blocker. 4 . The film formation method according to claim 2 , wherein the central metals are iridium. 5 . The film formation method according to claim 4 , wherein the metal complex having iridium as the central metal is represented by the following formula (3) or formula (4), in formula (3) and (4), the dotted line represents a coordinate bond, and in formula (4), R 5 represents a halogen atom, a formyl group, an acetoxy group, a sulfo group, a mesyl group, a nitro group, a nitroso group, a phosphoryl group, or an alkyl group having 1 to 6 carbon atoms 6 . The film formation method according to claim 1 , wherein a metal oxide film is formed using the metal complex as a raw material. 7 . The film formation method according to claim 6 , wherein the metal oxide film comprises a crystalline oxide semiconductor. 8 . The film formation method according to claim 1 , wherein the base has a corundum structure. 9 . The film formation method according to claim 8 , wherein at least a part of the base comprises a crystal growth plane containing gallium as a major component. 10 . The film formation method according to claim 1 , wherein the metal complex is contained in a liquid raw material, and the raw material further contains gallium. 11 . The film formation method according to claim 1 , wherein the metal complex is contained in the liquid raw material, and the raw material further contains a p type dopant. 12 . A film formation method, the method comprising a step of forming a metal oxide film on a base by applying a liquid containing a metal complex on the base, followed by drying, wherein the metal complex is at least one of: a metal complex having two or more different ligands, and a metal complex having same ligands and substituents, the two or more different ligands include at least one ligand represented by following formula (1) and at least one ligand selected from a group consisting of a ligand derived from acetylacetonato, a ligand having a heterocyclic structure, and the ligand represented by following formula (1), and in following formula (1), the dotted line represents a coordinate bond, *1 represents a coordinate bond position with a metal, *2 represents a bond position with a metal, and each of R 1 and R 2 independently represents an alkyl group having 1 to 6 carbon atoms, the metal complex having the same ligands and substituents is represented by following formula (2), and in following formula (2), the dotted line represents a coordinate bond, each of R 3 and R 4 independently represents hydrogen atom, a halogen atom, an alkyl group having 1 to 6 carbon atoms, a phenyl group, or a tolyl group, R′ represents a halogen atom, a formyl group, an acetoxy group, a sulfo group, a mesyl group, a nitro group, a nitroso group, a phosphoryl group, or an alkyl group having 1 to 6 carbon atoms, and X represents a central metal

Assignees

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Classifications

  • characterised by the substrate · CPC title

  • using chemical vapour deposition [CVD] · CPC title

  • P-type · CPC title

  • without a metal-carbon linkage · CPC title

  • by producing an aerosol and subsequent evaporation of the droplets or particles · CPC title

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What does patent US12565714B2 cover?
A film formation method having an excellent mass productivity, whereby a time required for forming a film having a desired thickness is short. In the film formation method, at least one of a metal complex having two or more different ligands, and a metal complex having same ligands and substituents is used, and the method includes atomizing or dropletizing a liquid containing the metal complex,…
Who is the assignee on this patent?
Flosfia Inc
What technology area does this patent fall under?
Primary CPC classification C23C16/40. Mapped technology areas include Chemistry & Metallurgy.
When was this patent published?
Publication date Tue Mar 03 2026 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 10 related publications on this page (citations in our corpus or others sharing the same primary CPC).