Cooling system for processing chamber
US-2024393018-A1 · Nov 28, 2024 · US
US12558734B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-12558734-B2 |
| Application number | US-202318347662-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jul 6, 2023 |
| Priority date | Nov 30, 2011 |
| Publication date | Feb 24, 2026 |
| Grant date | Feb 24, 2026 |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
An electrostatic chuck includes a ceramic top plate layer made of a beryllium oxide material, a ceramic bottom plate layer made of a beryllium oxide material, a ceramic middle plate layer disposed between the ceramic top plate layer and the ceramic bottom plate layer, an electrode layer disposed between the ceramic top plate layer and the ceramic middle plate layer, and a heater layer disposed between the ceramic middle plate layer and the ceramic bottom plate layer. The electrode layer joins and hermetically seals the ceramic top plate layer to the ceramic middle plate layer, and the heater layer joins and hermetically seals the ceramic middle plate layer to the ceramic bottom plate layer.
Opening claim text (preview).
What is claimed is: 1 . An electrostatic chuck comprising: a ceramic top plate layer comprising a beryllium oxide material; a ceramic bottom plate layer comprising a beryllium oxide material; a ceramic middle plate layer disposed between the ceramic top plate layer and the ceramic bottom plate layer; an electrode layer disposed between the ceramic top plate layer and the ceramic middle plate layer; and a heater layer disposed between the ceramic middle plate layer and the ceramic bottom plate layer. 2 . The electrostatic chuck according to claim 1 , further comprising: a shaft comprising a beryllium oxide material, the shaft joined to a lower surface of the ceramic bottom plate layer; and a joining layer disposed between the shaft and the ceramic bottom plate layer, wherein the joining layer joins and hermetically seals the shaft to the ceramic bottom plate layer. 3 . The electrostatic chuck according to claim 2 , wherein an upper surface of the shaft comprises a plurality of mesas. 4 . The electrostatic chuck according to claim 1 , further comprising a labyrinth disposed around a periphery of the ceramic top plate layer and the ceramic middle plate layer. 5 . The electrostatic chuck according to claim 1 , further comprising a standoff disposed between the ceramic top plate layer and the ceramic middle plate layer. 6 . The electrostatic chuck according to claim 1 , further comprising a standoff disposed between the ceramic middle plate layer and the ceramic bottom plate layer. 7 . The electrostatic chuck according to claim 1 , further comprising an annular joining layer disposed radially outward from the heater layer, wherein the annular joining layer further joins and hermetically seals the ceramic middle plate layer to the ceramic bottom plate layer. 8 . The electrostatic chuck according to claim 1 , wherein at least one of the ceramic top plate layer, the ceramic middle plate layer, and the ceramic bottom plate layer comprise doped beryllium oxide. 9 . A ceramic heater assembly comprising: a ceramic top plate layer comprising a beryllium oxide material; a ceramic bottom plate layer comprising a beryllium oxide material; a heater layer disposed between the ceramic top plate layer and the ceramic bottom plate layer; and an annular joining layer disposed radially outward from the heater layer, wherein the annular joining layer further joins and hermetically seals the ceramic top plate layer to the ceramic bottom plate layer. 10 . The ceramic heater assembly according to claim 9 , further comprising: a shaft comprising a beryllium oxide material, the shaft joined to a lower surface of the ceramic bottom plate layer; and a joining layer disposed between the shaft and the ceramic bottom plate layer, wherein the joining layer joins and hermetically seals the shaft to the ceramic bottom plate layer. 11 . The ceramic heater assembly according to claim 10 , wherein an upper surface of the shaft comprises a plurality of mesas. 12 . The ceramic heater assembly according to claim 9 , further comprising a standoff disposed between the ceramic top plate layer and the ceramic bottom plate layer. 13 . The ceramic heater assembly according to claim 9 , wherein at least one of the ceramic top plate layer and the ceramic bottom plate layer comprise doped beryllium oxide. 14 . An electrostatic chuck comprising: a ceramic top plate layer comprising a beryllium oxide material; a ceramic bottom plate layer comprising a beryllium oxide material; a ceramic middle plate layer disposed between the ceramic top plate layer and the ceramic bottom plate layer; an electrode layer disposed between the ceramic top plate layer and the ceramic middle plate layer; a heater layer disposed between the ceramic middle plate layer and the ceramic bottom plate layer; a shaft comprising a beryllium oxide material, the shaft joined to a lower surface of the ceramic bottom plate layer; and a joining layer disposed between the shaft and the ceramic bottom plate layer. 15 . The electrostatic chuck according to claim 14 , wherein an upper surface of the shaft comprises a plurality of mesas. 16 . The electrostatic chuck according to claim 14 , further comprising an annular joining layer disposed radially outward from the heater layer, wherein the annular joining layer further joins and hermetically seals the ceramic middle plate layer to the ceramic bottom plate layer. 17 . The electrostatic chuck according to claim 14 , further comprising an annular joining layer disposed radially outward from the electrode layer, wherein the annular joining layer further joins and hermetically seals the ceramic top plate layer to the ceramic middle plate layer. 18 . The electrostatic chuck according to claim 14 , wherein at least one of the ceramic top plate layer, the ceramic middle plate layer, and the ceramic bottom plate layer comprise doped beryllium oxide. 19 . The electrostatic chuck according to claim 14 , further comprising a labyrinth disposed around a periphery of the ceramic top plate layer and the ceramic middle plate layer. 20 . A ceramic heater assembly comprising: a ceramic top plate layer comprising a beryllium oxide material; a ceramic bottom plate layer comprising a beryllium oxide material; a heater layer disposed between the ceramic top plate layer and the ceramic bottom plate layer; a shaft comprising a beryllium oxide material, the shaft joined to a lower surface of the ceramic bottom plate layer; and a joining layer disposed between the shaft and the ceramic bottom plate layer, wherein the joining layer joins and hermetically seals the shaft to the ceramic bottom plate layer.
characterised by the mechanical construction of the susceptor, stage or support · CPC title
characterised by a coating, a hardness or a material · CPC title
Details of electrostatic chucks · CPC title
mainly by conduction · CPC title
using electrostatic chucks · CPC title
Related publications grouped by family.
Answers are generated from the same data shown on this page.