Flatness testing for cathodes

Patent metadata

Field	Value
Publication number	US-12504266-B2
Application number	US-202318214863-A
Country	US
Kind code	B2
Filing date	Jun 27, 2023
Priority date	Jun 27, 2023
Publication date	Dec 23, 2025
Grant date	Dec 23, 2025

Abstract

An apparatus for testing flatness includes a main fixture defining a longitudinal axis along a direction between a base of the main fixture and a testing end of the main fixture. A gimbal is slidingly engaged to the main fixture to slide in a direction along the longitudinal axis. A biasing member is axially between the base and the gimbal. Three rotating arms are mounted to the testing end of the main fixture. The rotating arms and gimbal are configured to affix a test article in the testing end of the main fixture flat with respect to the three rotating arms to establish a datum plane for flatness testing of the test article.

First claim

What is claimed is:

1 . An apparatus for testing flatness comprising:
a main fixture defining a longitudinal axis along a direction between a base of the main fixture and a testing end of the main fixture; a gimbal slidingly engaged to the main fixture to slide in a direction along the longitudinal axis; a biasing member axially between the base and the gimbal; and three rotating arms mounted to the testing end of the main fixture, wherein the rotating arms and gimbal are configured to affix a test article in the testing end of the main fixture flat with respect to the three rotating arms to establish a datum plane for flatness testing of the test article.

2 . The apparatus as recited in claim 1 , wherein the test article is a cathode for a triode, wherein the test article includes:
an annular circumferential body with a top surface defining the datum plane with the three rotating arms; and a cathode body supported within the annular circumferential body.

3 . The apparatus as recited in claim 1 , wherein the base includes a threaded element that engages with threads in a bore of the main fixture that houses the biasing member.

4 . The apparatus as recited in claim 3 , wherein the three rotating arms are circumferentially equidistant from one another relative to the longitudinal axis.

5 . The apparatus as recited in claim 4 , further comprising a collar around the testing end of the main fixture, configured to slide relative to the main fixture between a first position for receiving the test article into the testing end of the main fixture, and a second position for securing the test article in the testing end of the main fixture axially between the three rotating arms and the gimbal, wherein the collar is configured to rotate the three rotating arms into contact with the test article as the collar transitions from the first position to the second position.

6 . The apparatus as recited in claim 5 , further comprising three set screws including one set screw for each of the three rotating arms, wherein each of the three set screws is threaded into the collar and is configured to tighten against a respective one of the three rotating arms to lock the respective one of the rotating arms in place against the test article.

7 . The apparatus as recited in claim 1 , wherein the gimbal includes:
a cylinder engaged to the biasing member; a tooling ball extending axially from the cylinder with a ball surface extending axially away from the cylinder; and a test article holder engaged to the ball surface, extending axially away from the cylinder and configured to receive the test article and press the test article axially against the three rotating arms.

8 . The apparatus as recited in claim 7 , further comprising a spring plunger extending radially through the main fixture into contact with the cylinder to lock the cylinder in place within the main fixture.

9 . The apparatus as recited in claim 7 , further comprising a handle extending radially through the main fixture through an oversized bore into contact with the cylinder to allow manipulation of the cylinder within the main fixture.

10 . The apparatus as recited in claim 1 , further comprising a granite base with a vice engaged to the base of the main fixture.

11 . The apparatus as recited in claim 10 , further comprising a visual indicator on the main fixture configured for visual alignment of the main fixture with the vice of the granite base.

12 . The apparatus as recited in claim 10 , further comprising a micrometer affixed to the granite base, wherein the micrometer includes a probe configured to contact the test article in the testing end of the main fixture for determination of flatness of a surface of the test article.

13 . The apparatus as recited in claim 12 , wherein the micrometer is analog or digital.

14 . A method of testing flatness comprising:
placing a test article on a gimbal that is slidingly engaged to a main fixture; rotating three rotating arms into contact with a datum surface of the test article axially opposite from the gimbal across the test article; and making multiple micrometer measurements of a test surface of the test article relative to the datum surface to determine whether flatness of the test surface is within one or more tolerable specifications or not.

15 . The method as recited in claim 14 , further comprising spraying a coating onto the test surface of the test article and repeating the placing, rotating, and making multiple micrometer measurements on the test article after the spraying.

Assignees

• Raytheon Co

Inventors

• Bento Joaquim A
• Beaulieu Mark J

Classifications

• G01B5/285

  for controlling eveness · CPC title

• G01B5/28 Primary

  for measuring roughness or irregularity of surfaces · CPC title