Gauge for installation of liners in substrate spin coating tools
US-2016282100-A1 · Sep 29, 2016 · US
US8959986B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-8959986-B2 |
| Application number | US-201113163128-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jun 17, 2011 |
| Priority date | Dec 19, 2008 |
| Publication date | Feb 24, 2015 |
| Grant date | Feb 24, 2015 |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
An apparatus having a roughness sensing system and a roughness measurement sensor, wherein a slide element and a probe tip come to operation, and method of use thereof. The slide element is arranged on an extreme end of a probe pin in the form of a scan-slide element. The probe tip is integrated into the probe pin, and the distance between the scan-slide element and the probe tip is predetermined. The roughness sensing system is a 1D-, 2D- or 3D-scanning system having a parallelogram configuration. The apparatus further has a serving device which enables moving the probe pin together with the scan-slide element and the probe tip jointly over a surface to be scanned.
Opening claim text (preview).
What is claimed is: 1. An apparatus, comprising: a roughness sensing system comprising a 1D-, 2D- or 3D-scanning system and having a parallelogram configuration; a roughness measurement sensor including a probe pin having a slide element comprising a scan-slide element located at an end of the probe pin and a probe tip integrated with the probe pin at a predetermined distance from the scan-slide element; and an advancing device adapted to jointly move the probe pin together wi…
Physics · mapped topic
Related publications grouped by family.
Free tools are coming soon. Tell us what you want to track and we'll notify you.
Answers are generated from the same data shown on this page.