Measurement device

US11859969B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11859969-B2
Application numberUS-202217976612-A
CountryUS
Kind codeB2
Filing dateOct 28, 2022
Priority dateApr 30, 2020
Publication dateJan 2, 2024
Grant dateJan 2, 2024

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A measurement device includes: a probe part including a probe configured to measure a surface of an object to be measured and is attached so as to swing around a swing center according to a shape of the surface of the object to be measured; a scale configured to measure displacement by swinging of the probe part; a scale head configured to read a scale mark of the scale; and an arm part to which the probe part is attached, the arm part is attached so as to swing around the swing center integrally with the probe part, and the scale is attached to the arm part. When thermal expansion coefficients of the probe part, the arm part and the scale are α, β and γ respectively, the measurement device satisfies a condition of (α+γ)−1/2α≤β≤(α+γ)+1/2α.

First claim

Opening claim text (preview).

What is claimed is: 1. A measurement device comprising: a probe part including a probe configured to measure a surface of an object to be measured and is attached so as to swing around a swing center according to a shape of the surface of the object to be measured; a scale configured to measure displacement by swinging of the probe part; a scale head configured to read a scale mark of the scale; and an arm part to which the probe part is attached, the arm part being attached so as to swing around the swing center integrally with the probe part, and the scale being attached to the arm part, wherein, when thermal expansion coefficients of the probe part, the arm part and the scale are α, β and γ respectively, the measurement device satisfies a condition of (α+γ)−1/2α≤β≤(α+γ)+1/2α. 2. The measurement device according to claim 1 , wherein the thermal expansion coefficients of the probe part, the arm part and the scale satisfy a condition of β=α+γ. 3. The measurement device according to claim 1 , wherein the scale is a circular arc scale formed in a circular arc shape along a swing direction of the arm part. 4. The measurement device according to claim 1 , wherein at least one of the probe part, the arm part and the scale is formed of a plurality of members having different thermal expansion coefficients, and materials and lengths of the plurality of members are adjusted so as to satisfy the condition. 5. A measurement device comprising: a probe part including a probe configured to measure a surface of an object to be measured and attached so as to swing around a swing center according to a shape of the surface of the object to be measured; a scale configured to measure displacement by swinging of the probe part; a scale head configured to read a scale mark of the scale; an arm part to which the probe part is attached, the arm part being attached so as to swing around the swing center integrally with the probe part, and the scale being attached to the arm part; a temperature sensor configured to measure an ambient temperature; and a controller configured to calculate actual displacement x T of a distal end part of the probe part by following expressions, when thermal expansion coefficients of the probe part, the arm part and the scale are α, β and γ respectively, a measured value of displacement of the distal end part of the probe part is x F , and a change amount of the ambient temperature when measuring the measured value x F is ΔT, x T =c XF c =(1+αΔ T )/{1+(β—γ)Δ T}.

Assignees

Inventors

Classifications

  • G01B5/0014Primary

    due to temperature (on machine tools B23Q11/0003) · CPC title

  • Scales; Graduations · CPC title

  • Protractors (for use in geodesy G01C1/00; protractor heads for drawing machines B43L13/08) · CPC title

  • for measuring distance or clearance between spaced objects or spaced apertures (G01B5/24 takes precedence) · CPC title

  • for measuring contours or curvatures · CPC title

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Frequently asked questions

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What does patent US11859969B2 cover?
A measurement device includes: a probe part including a probe configured to measure a surface of an object to be measured and is attached so as to swing around a swing center according to a shape of the surface of the object to be measured; a scale configured to measure displacement by swinging of the probe part; a scale head configured to read a scale mark of the scale; and an arm part to whic…
Who is the assignee on this patent?
Tokyo Seimitsu Co Ltd
What technology area does this patent fall under?
Primary CPC classification G01B5/0014. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Jan 02 2024 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 3 related publications on this page (citations in our corpus or others sharing the same primary CPC).