Substrate processing apparatus and substrate monitoring method

US12500102B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-12500102-B2
Application numberUS-202318525785-A
CountryUS
Kind codeB2
Filing dateNov 30, 2023
Priority dateDec 5, 2022
Publication dateDec 16, 2025
Grant dateDec 16, 2025

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

Provided is a substrate processing apparatus including a chamber providing a processing space in which a process is performed on a substrate coated with an organic solvent using a fluid in a supercritical state, a tray unit supporting the substrate and provided to be inserted into the chamber and withdraw from the chamber through an opening of the chamber, and a detector configured to measure a resistance of the substrate.

First claim

Opening claim text (preview).

What is claimed is: 1 . A substrate processing apparatus comprising: a chamber providing a processing space in which a process is performed on a substrate coated with an organic solvent using a fluid in a supercritical state; a tray unit supporting the substrate and provided to be inserted into the chamber and withdrawn from the chamber through an opening of the chamber; and a detector configured to measure a resistance of the substrate, wherein the tray unit includes a tray supporting the substrate, and a cover provided at an end of the tray and sealing the opening, and the detector is connected to the cover. 2 . The substrate processing apparatus of claim 1 , wherein the detector detects at least one of a progress of the process for the substrate and an amount of the organic solvent on the substrate. 3 . The substrate processing apparatus of claim 1 , wherein the detector measures the resistance of the substrate with the tray unit. 4 . The substrate processing apparatus of claim 1 , wherein the detector includes an ammeter configured to measure a current and a voltmeter configured to measure a voltage. 5 . A substrate processing apparatus comprising: a chamber providing a processing space in which a process is performed on a substrate coated with an organic solvent using a fluid in a supercritical state; a tray unit supporting the substrate and provided to be inserted into the chamber and withdrawn from the chamber through an opening of the chamber; and a detector configured to measure a resistance of the substrate, wherein the tray unit includes a tray supporting the substrate, and a plurality of protruding terminals that protrude from an upper surface of the tray and are connected to the detector and on which the substrate is placed. 6 . The substrate processing apparatus of claim 5 , wherein the detector detects at least one of a progress of the process for the substrate and an amount of the organic solvent on the substrate. 7 . The substrate processing apparatus of claim 5 , wherein the detector measures the resistance of the substrate with the tray unit. 8 . The substrate processing apparatus of claim 5 , wherein the detector includes an ammeter configured to measure a current and a voltmeter configured to measure a voltage.

Assignees

Inventors

Classifications

  • for wet cleaning or washing · CPC title

  • Cleaning only by supercritical fluids · CPC title

  • characterised by the mechanical construction of the susceptor, stage or support · CPC title

  • characterised by lifting arrangements, e.g. lift pins · CPC title

  • for drying · CPC title

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Frequently asked questions

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What does patent US12500102B2 cover?
Provided is a substrate processing apparatus including a chamber providing a processing space in which a process is performed on a substrate coated with an organic solvent using a fluid in a supercritical state, a tray unit supporting the substrate and provided to be inserted into the chamber and withdraw from the chamber through an opening of the chamber, and a detector configured to measure a…
Who is the assignee on this patent?
Tes Co Ltd
What technology area does this patent fall under?
Primary CPC classification H10P72/0408. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Dec 16 2025 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 3 related publications on this page (citations in our corpus or others sharing the same primary CPC).