Semiconductor device and manufacturing method of a semiconductor device

US12419052B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-12419052-B2
Application numberUS-202418614945-A
CountryUS
Kind codeB2
Filing dateMar 25, 2024
Priority dateAug 10, 2018
Publication dateSep 16, 2025
Grant dateSep 16, 2025

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  1. Title

    What the patent document calls the invention.

  2. Abstract

    A short plain-language summary of the technical disclosure.

  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

    Technology tags used to group this patent with similar filings.

  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A semiconductor device includes a stack structure, a channel layer passing through the stack structure, a memory layer enclosing the channel layer and including first and second openings which expose the channel layer, a well plate coupled to the channel layer through the first opening, and a source plate coupled to the channel layer through the second opening.

First claim

Opening claim text (preview).

What is claimed is: 1. A semiconductor device, comprising: a first well region; a second well region over the first well region; a source region over the second well region; a stack structure over the source region; a slit insulting structure separating the stack structure, the source region and the second well region into a first region and a second region; and a source connection structure passing through the stack structure in the second region, wherein the source connection structure is physically contacted with the source region. 2. The semiconductor device of claim 1 , further comprising a well connection structure passing through the stack structure, the source region and the second well region in the first region, wherein the well connection structure is coupled to the first well region. 3. The semiconductor device of claim 1 , further comprising a channel layer passing through the stack structure, the source region and the second well region. 4. The semiconductor device of claim 3 , wherein the channel layer is coupled to the source region and the second well region. 5. The semiconductor device of claim 1 , further comprising an insulating pattern insulating the source connection structure from the second well region.

Assignees

Inventors

Classifications

  • using masks for insulating materials · CPC title

  • using masks for conductive or resistive materials · CPC title

  • of Group IV semiconductors · CPC title

  • Silicon, silicon germanium or germanium · CPC title

  • using selective deposition, e.g. simultaneous growth of monocrystalline and non-monocrystalline semiconductor materials · CPC title

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Frequently asked questions

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What does patent US12419052B2 cover?
A semiconductor device includes a stack structure, a channel layer passing through the stack structure, a memory layer enclosing the channel layer and including first and second openings which expose the channel layer, a well plate coupled to the channel layer through the first opening, and a source plate coupled to the channel layer through the second opening.
Who is the assignee on this patent?
Sk Hynix Inc
What technology area does this patent fall under?
Primary CPC classification H10B41/27. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Sep 16 2025 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 5 related publications on this page (citations in our corpus or others sharing the same primary CPC).