Method and device for processing product manufacturing messages, electronic device, and computer-readable storage medium

US12400486B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-12400486-B2
Application numberUS-202418666299-A
CountryUS
Kind codeB2
Filing dateMay 16, 2024
Priority dateDec 20, 2019
Publication dateAug 26, 2025
Grant dateAug 26, 2025

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  5. First independent claim

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Abstract

Official abstract text for this publication.

A method and a device for processing product manufacturing messages, and an electronic device are disclosed. The method for processing product manufacturing messages includes: monitoring a plurality of product manufacturing messages; establishing a product defect analysis task queue based on the plurality of product manufacturing messages; distributing product defect analysis tasks to product manufacturing assisting devices based on the product defect analysis task queue, wherein the product defect analysis tasks include a task of identifying product defect content based on a defect identification model; wherein the product defect content includes any one or more of: product defect type, product defect location, and product defect size.

First claim

Opening claim text (preview).

The invention claimed is: 1. A method for processing product manufacturing messages, comprising: monitoring, by a device for processing product manufacturing messages, a plurality of the product manufacturing messages; establishing, by the device for processing product manufacturing messages, a product defect analysis task queue comprising a plurality of product defect analysis tasks based on the plurality of the product manufacturing messages; generating, by the device for processing product manufacturing messages, a product defect analysis request message based on the product defect analysis task queue and the plurality of the product manufacturing messages; and sending, by the device for processing product manufacturing messages, the product defect analysis request message to a product manufacturing assisting device, wherein the product defect analysis request message indicates a product defect analysis distributed to the product manufacturing assisting device, wherein the product manufacturing assisting device comprises a first product manufacturing assisting device and a second product manufacturing assisting device, wherein the sending the product defect analysis request message to a product manufacturing assisting device further comprises: determining whether a defect identification model corresponding to the product type is present; sending a first product defect analysis request message to the first product manufacturing assisting device to configure a training task for the defect identification model in a case where the defect identification model corresponding to the product type is not present; sending a second product defect analysis request message to the second product manufacturing assisting device to detect a product defect by utilizing the defect identification model in a case where the defect identification model corresponding to the product type is present. 2. The method for processing product manufacturing messages according to claim 1 , wherein, the establishing a product defect analysis task queue comprising the plurality of product defect analysis tasks based on the plurality of product manufacturing messages comprises: establishing the product defect analysis task queue by sorting the plurality of the product defect analysis tasks based on any one or more of: the order in which the product manufacturing messages are received, priorities of products, and a product scheduling plan. 3. The method for processing product manufacturing messages according to claim 1 , wherein the product defect analysis tasks comprise a task of identifying product defect content based on a defect identification model, wherein the product defect content comprises any one or more of: product defect type, product defect location, and product defect size. 4. The method for processing product manufacturing messages according to claim 3 , wherein, the defect identification model comprises any one or more of: a feedforward neural network defect identification model, a convolutional neural network model, a recurrent neural network model, and a generative adversarial network model. 5. The method for processing product manufacturing messages according to claim 3 , further comprising: updating the defect identification model. 6. The method for processing product manufacturing messages according to claim 5 , wherein the updating the defect identification model further comprises: distributing a product defect analysis task for offline testing of a first defect identification model to obtain a first product defect analysis result; distributing a product defect analysis task for online testing of the first defect identification model to obtain a second product defect analysis result; in a case where the first defect analysis result and the second defect analysis result meet a predetermined criteria, distributing a product defect analysis task for replacing the second defect identification model in the product manufacturing assisting device with the first defect identification model. 7. The method for processing product manufacturing messages according to claim 1 , wherein, the generating a product defect analysis request message based on the product defect analysis task queue and the plurality of the product manufacturing messages comprises: obtaining a product type and a product defect analysis task type from the plurality of the product manufacturing messages; generating the product defect analysis request message based on the product type and the product defect analysis task type. 8. The method for processing product manufacturing messages according to claim 1 , wherein, the sending the product defect analysis request message to a product manufacturing assisting device comprises: performing message format verification on the product defect analysis request message; sending the product defect analysis request message after determining that a message format of the product defect analysis request message is qualified. 9. The method for processing product manufacturing messages according to claim 1 , wherein the first product defect analysis request message comprises the product type, a storage address of product images, a quantity of the plurality of product images, and a task identity for training the defect identification model, and the second product defect analysis request message comprises the product type, a storage address of the product images, and a quantity of the product images. 10. The method for processing product manufacturing messages according to claim 9 , wherein, the determining whether an defect identification model corresponding to the product type is present comprises: determining the product type based on the plurality of the product manufacturing messages; determining whether the defect identification model corresponding to the product type is present, based on the product type. 11. The method for processing product manufacturing messages according to claim 9 , wherein, the determining whether a defect identification model corresponding to the product type is present comprises: performing a prejudgment using the defect identification model to determine whether the defect identification model corresponding to the product type is present. 12. The method for processing product manufacturing messages according to claim 9 , wherein, the determining whether an defect identification model corresponding to the product type is present comprises: in response to the product type indicating a known product, determining the defect identification model corresponding to the product type is present; in response to the product type indicating an unknown product, determining the defect identification model corresponding to the product type is not present. 13. The method for processing product manufacturing messages according to claim 9 , wherein, the determining whether a defect identification model corresponding to the product type is present comprises: in response to the product type being a known product but no product defect content being identified based on the defect identification model corresponding to the product type, determining the defect identification model corresponding to the product type is not present; or in response to performance of the defect identification model being insufficient to satisfy the product defect analysis tasks corresponding to the product type, determining the defect identification model corresponding to the product type is not present. 14. The method for processing product manufacturing messages according to claim 9 , further comprising: receiving a first product defect analysis

Assignees

Inventors

Classifications

  • Monitoring of warpages, curvatures, damages, defects or the like · CPC title

  • Measuring, controlling or regulating {(measuring in general G01; controlling or regulating in general G05)} · CPC title

  • for test execution, e.g. scheduling of test suites · CPC title

  • using an image reference approach · CPC title

  • linear, e.g. hyperplane · CPC title

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What does patent US12400486B2 cover?
A method and a device for processing product manufacturing messages, and an electronic device are disclosed. The method for processing product manufacturing messages includes: monitoring a plurality of product manufacturing messages; establishing a product defect analysis task queue based on the plurality of product manufacturing messages; distributing product defect analysis tasks to product m…
Who is the assignee on this patent?
Boe Technology Group Co Ltd
What technology area does this patent fall under?
Primary CPC classification G06Q10/06395. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Aug 26 2025 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 12 related publications on this page (citations in our corpus or others sharing the same primary CPC).