Method for measuring actual area of defect, and method and apparatus for testing display panel
US-12530762-B2 · Jan 20, 2026 · US
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Chai Dong patents
Chai Dong is listed as an inventor on 53 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Chai Dong |
| Total patents | 53 |
| First publication | Jul 6, 2017 |
| Latest publication | Jan 20, 2026 |
Notable patents
Publications ranked by popularity score, then publication date.
Data processing methods and apparatuses, electronic device and storage medium
US-12510887-B2 · Dec 30, 2025 · US
Method for processing product manufacturing messages, electronic device, and computer-readable storage medium
US-2025349158-A1 · Nov 13, 2025 · US
Method and device for processing product manufacturing messages, electronic device, and computer-readable storage medium
US-12400486-B2 · Aug 26, 2025 · US
Method and device for detecting defect, storage medium and electronic device
US-12347085-B2 · Jul 1, 2025 · US
Data processing methods and apparatuses, electronic device and storagfe medium
US-2025086652-A1 · Mar 13, 2025 · US
Inference computing apparatus, model training apparatus, inference computing system
US-12236362-B2 · Feb 25, 2025 · US
Detection method, electronic device and non-transitory computer-readable storage medium
US-12236580-B2 · Feb 25, 2025 · US
Image data classification method, device and system
US-12174914-B2 · Dec 24, 2024 · US
Image annotation method, device and system
US-12106465-B2 · Oct 1, 2024 · US
Recent patents
Latest publications not already listed above.
Creation method, information processing method, storage method, electronic device, and storage medium
US-2024303591-A1 · Sep 12, 2024 · US
Method and device for processing product manufacturing messages, electronic device, and computer-readable storage medium
US-2024304034-A1 · Sep 12, 2024 · US
Determining correlation degree, apparatus, electronic device, and computer-readable storage medium
US-2024296762-A1 · Sep 5, 2024 · US
Data processing methods, devices and non-transitory storage mediums
US-2024296163-A1 · Sep 5, 2024 · US
System and method for producing display panels based on nonlinear program model, and non-transitory computer-readable storage medium
US-12066805-B2 · Aug 20, 2024 · US
Computer-implemented method for defect analysis, computer-implemented method of evaluating likelihood of defect occurrence, apparatus for defect analysis, computer-program product, and intelligent defect analysis system
US-12061935-B2 · Aug 13, 2024 · US
Computer-implemented method for defect analysis, computer-implemented method of evaluating likelihood of defect occurrence, apparatus for defect analysis, computer-program product, and intelligent defect analysis system
US-12032364-B2 · Jul 9, 2024 · US
Method and device for processing product manufacturing messages, electronic device, and computer-readable storage medium
US-12020516-B2 · Jun 25, 2024 · US
Method and device for detecting defect, storage medium and electronic device
US-2024202893-A1 · Jun 20, 2024 · US
Data processing method and data processing apparatus
US-2024193460-A1 · Jun 13, 2024 · US
Methods and apparatuses for processing image, methods and apparatuses for training image recognition network and methods and apparatuses for recognizing image
US-12002182-B2 · Jun 4, 2024 · US
Defect detection task processing method, device, apparatus and storage medium
US-11982999-B2 · May 14, 2024 · US
Detection method, electronic device and non-transitory computer-readable storage medium
US-2024119584-A1 · Apr 11, 2024 · US
Detection device of display panel and detection method thereof, electronic device and readable medium
US-11900589-B2 · Feb 13, 2024 · US
Distributed computing system for product defect analysis
US-11880968-B2 · Jan 23, 2024 · US
Data processing method, and electronic device and storage medium
US-2024004375-A1 · Jan 4, 2024 · US
Method for measuring actual area of defect, and method and apparatus for testing display panel
US-2023401692-A1 · Dec 14, 2023 · US
Method and device of detecting fault in production
US-11809438-B2 · Nov 7, 2023 · US
System and method for recommending maximum quantity of work in process, and computer readable medium
US-11703837-B2 · Jul 18, 2023 · US
Method for detecting defect and method for training model
US-2023206420-A1 · Jun 29, 2023 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Boe Technology Group Co Ltd | 52 |
| Beijing Zhongxiangying Tech Co Ltd | 17 |
| Beijing Boe Technology Dev Co Ltd | 2 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G06T2207/20084 | 20 |
| G06T2207/20081 | 20 |
| G06T7/0004 | 18 |
| G06Q10/06395 | 16 |
| G06T7/001 | 14 |