Titanium nitride film forming method and titanium nitride film forming apparatus

US12392029B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-12392029-B2
Application numberUS-202217661577-A
CountryUS
Kind codeB2
Filing dateMay 2, 2022
Priority dateMay 10, 2021
Publication dateAug 19, 2025
Grant dateAug 19, 2025

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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Abstract

Official abstract text for this publication.

A method of forming a titanium nitride film includes: forming the titanium nitride film by alternately repeating supplying a raw material gas, which contains a titanium compound including chlorine and titanium, to a substrate accommodated in a processing container, and supplying a reaction gas, which contains a nitrogen compound including nitrogen and reacts with the titanium compound to form titanium nitride, to the substrate, wherein the forming the titanium nitride film is executed under a condition in which a pressure in the processing container is set within a range of 2.7 kPa to 12.6 kPa so that a specific resistance of the titanium nitride film becomes 57 micro-ohm-cm or less.

First claim

Opening claim text (preview).

What is claimed is: 1. A method of forming a titanium nitride film, comprising: adjusting an open degree of an APC (auto pressure controller) valve; and forming the titanium nitride film by alternately repeating supplying a raw material gas, which contains a titanium compound including chlorine and titanium, to a substrate accommodated in a processing container, and supplying a reaction gas, which contains a nitrogen compound including nitrogen and reacts with the titanium compound to form titanium nitride, to the substrate, wherein the forming the titanium nitride film is executed under a condition in which a pressure in the processing container is set within a range of 2.7 kPa to 12.6 kPa so that a specific resistance of the titanium nitride film becomes 57 micro-ohm-cm or less, and wherein the pressure in the processing container during the forming the titanium nitride film is about twice a pressure in the processing container during the adjusting the open degree of the APC valve. 2. The method of claim 1 , wherein the titanium compound is titanium tetrachloride. 3. The method of claim 2 , wherein the nitrogen compound is ammonia. 4. The method of claim 3 , wherein the forming the titanium nitride film further includes supplying an additive gas, which contains a silicon compound that reacts with chlorine contained in the titanium compound, during a period of supplying the raw material gas to the substrate. 5. The method of claim 4 , wherein a start timing of the supply of the additive gas is after the supply of the raw material gas is started. 6. The method of claim 5 , wherein the silicon compound is silane. 7. The method of claim 4 , wherein the silicon compound is silane. 8. The method of claim 1 , wherein the nitrogen compound is ammonia. 9. The method of claim 1 , wherein the forming the titanium nitride film further includes supplying an additive gas, which contains a silicon compound that reacts with chlorine contained in the titanium compound, during a period of supplying the raw material gas to the substrate. 10. The method of claim 1 , wherein the forming the titanium nitride film is executed under a condition that the substrate is heated to a temperature within a range of 400 degrees C. to 750 degrees C. 11. The method of claim 1 , wherein the forming the titanium nitride film is executed while supplying an inert gas into the processing container. 12. The method of claim 11 , wherein hydrogen gas is supplied together with the inert gas at a timing when the supply of the raw material gas and the supply of the reaction gas are switched.

Assignees

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Classifications

  • the conductive layers comprising transition metals · CPC title

  • by filling conductive material into holes, grooves or trenches · CPC title

  • Refractory-metal alloys · CPC title

  • using selective deposition · CPC title

  • using chemical vapour deposition [CVD] · CPC title

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What does patent US12392029B2 cover?
A method of forming a titanium nitride film includes: forming the titanium nitride film by alternately repeating supplying a raw material gas, which contains a titanium compound including chlorine and titanium, to a substrate accommodated in a processing container, and supplying a reaction gas, which contains a nitrogen compound including nitrogen and reacts with the titanium compound to form t…
Who is the assignee on this patent?
Tokyo Electron Ltd
What technology area does this patent fall under?
Primary CPC classification H10P14/412. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Aug 19 2025 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).