Method of Forming Semiconductor Device
US-2024379727-A1 · Nov 14, 2024 · US
US12392029B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-12392029-B2 |
| Application number | US-202217661577-A |
| Country | US |
| Kind code | B2 |
| Filing date | May 2, 2022 |
| Priority date | May 10, 2021 |
| Publication date | Aug 19, 2025 |
| Grant date | Aug 19, 2025 |
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A method of forming a titanium nitride film includes: forming the titanium nitride film by alternately repeating supplying a raw material gas, which contains a titanium compound including chlorine and titanium, to a substrate accommodated in a processing container, and supplying a reaction gas, which contains a nitrogen compound including nitrogen and reacts with the titanium compound to form titanium nitride, to the substrate, wherein the forming the titanium nitride film is executed under a condition in which a pressure in the processing container is set within a range of 2.7 kPa to 12.6 kPa so that a specific resistance of the titanium nitride film becomes 57 micro-ohm-cm or less.
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What is claimed is: 1. A method of forming a titanium nitride film, comprising: adjusting an open degree of an APC (auto pressure controller) valve; and forming the titanium nitride film by alternately repeating supplying a raw material gas, which contains a titanium compound including chlorine and titanium, to a substrate accommodated in a processing container, and supplying a reaction gas, which contains a nitrogen compound including nitrogen and reacts with the titanium compound to form titanium nitride, to the substrate, wherein the forming the titanium nitride film is executed under a condition in which a pressure in the processing container is set within a range of 2.7 kPa to 12.6 kPa so that a specific resistance of the titanium nitride film becomes 57 micro-ohm-cm or less, and wherein the pressure in the processing container during the forming the titanium nitride film is about twice a pressure in the processing container during the adjusting the open degree of the APC valve. 2. The method of claim 1 , wherein the titanium compound is titanium tetrachloride. 3. The method of claim 2 , wherein the nitrogen compound is ammonia. 4. The method of claim 3 , wherein the forming the titanium nitride film further includes supplying an additive gas, which contains a silicon compound that reacts with chlorine contained in the titanium compound, during a period of supplying the raw material gas to the substrate. 5. The method of claim 4 , wherein a start timing of the supply of the additive gas is after the supply of the raw material gas is started. 6. The method of claim 5 , wherein the silicon compound is silane. 7. The method of claim 4 , wherein the silicon compound is silane. 8. The method of claim 1 , wherein the nitrogen compound is ammonia. 9. The method of claim 1 , wherein the forming the titanium nitride film further includes supplying an additive gas, which contains a silicon compound that reacts with chlorine contained in the titanium compound, during a period of supplying the raw material gas to the substrate. 10. The method of claim 1 , wherein the forming the titanium nitride film is executed under a condition that the substrate is heated to a temperature within a range of 400 degrees C. to 750 degrees C. 11. The method of claim 1 , wherein the forming the titanium nitride film is executed while supplying an inert gas into the processing container. 12. The method of claim 11 , wherein hydrogen gas is supplied together with the inert gas at a timing when the supply of the raw material gas and the supply of the reaction gas are switched.
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