Mass spectrometry via frequency tagging

Patent metadata

Field	Value
Publication number	US-12347668-B2
Application number	US-202418630314-A
Country	US
Kind code	B2
Filing date	Apr 9, 2024
Priority date	Oct 10, 2018
Publication date	Jul 1, 2025
Grant date	Jul 1, 2025

Abstract

The invention generally relates to mass spectrometry via frequency tagging.

First claim

What is claimed is:

1. A system comprising:
a mass spectrometer comprising a single ion trap; and
a central processing unit (CPU), and storage coupled to the CPU for storing instructions that when executed by the CPU cause the system to apply a plurality of scan functions to the single ion trap to fragment a precursor ion and simultaneously eject a product ion of the precursor ion in a manner that preserves in time a relationship of the precursor ion and the product ion, wherein the plurality of scan functions comprise a nonlinear AC frequency sweep at constant RF voltage while, simultaneously, the product ion of the precursor ion is ejected from the single ion trap using a time-varying broadband waveform, and wherein fragmentation time of the precursor ion correlates with ejection time of the product ion, allowing the relationship in time to be correlated to the precursor ion mass-to-charge.

2. The system of claim 1 , wherein a value of a mass to charge ratio (m/z) of the precursor ion is directly correlated to fragmentation time.

3. The system of claim 1 , wherein the product ion of the precursor ion is ejected by a scan function that comprises a broadband sum of sines.

4. The system of claim 3 , wherein the broadband sum of sines comprises unevenly spaced frequencies that produce unique beats in a waveform that affect ejection and thus modulate spectral peak shapes.

5. The system of claim 1 , wherein a secular or related frequency of the product ion is directly measured by a detector of the mass spectrometer.

6. The system of claim 1 , wherein the precursor ion is mass-selectively excited via the system applying a nonlinear AC frequency sweep at a constant RF voltage to the single ion trap.

7. The system of claim 1 , wherein the precursor ion is mass-selectively excited via the system applying a fixed AC frequency while the RF voltage is ramped linearly.

8. The system of claim 1 , further comprising an ionization source that allows for high energy ionization of a sample to generate the precursor ion.

9. A system comprising:
a mass spectrometer comprising a single ion trap; and
a central processing unit (CPU), and storage coupled to the CPU for storing instructions that when executed by the CPU cause the system to apply a plurality of scan functions to the single ion trap to excite a precursor and eject a product ion exactly when the precursor is fragmented, wherein the plurality of scan functions comprise a nonlinear AC frequency sweep at constant RF voltage while, simultaneously, the product ion of the precursor ion is ejected from the single ion trap using a time-varying broadband waveform, and wherein fragmentation time of the precursor ion correlates with ejection time of the product ion, allowing the relationship in time to be correlated to the precursor ion mass-to-charge.

10. A method for analyzing a sample, the method comprising:
introducing a precursor ion of a sample into a mass spectrometer comprising a single ion trap; and
analyzing the sample via the mass spectrometer that applies a plurality of scan functions to the single ion trap to fragment the precursor ion and simultaneously eject a product ion of the precursor ion in a manner that preserves in time a relationship of the precursor ion and the product ion, wherein the plurality of scan functions comprise a nonlinear AC frequency sweep at constant RF voltage while, simultaneously, the product ion of the precursor ion is ejected from the single ion trap using a time-varying broadband waveform, and wherein fragmentation time of the precursor ion correlates with ejection time of the product ion, allowing the relationship in time to be correlated to the precursor ion mass-to-charge.

11. The method of claim 10 , wherein a value of a mass to charge ratio (m/z) of the precursor ion is directly correlated to fragmentation time.

12. The method of claim 10 , wherein the product ion of the precursor ion is ejected by a scan function that comprises a broadband sum of sines.

13. The method of claim 12 , wherein the broadband sum of sines comprises unevenly spaced frequencies that product unique beats in a waveform that affect ejection and thus modulate spectral peak shapes.

14. The method of claim 10 , wherein a secular or related frequency of the product ion is directly measured by a detector of the mass spectrometer.

15. The method of claim 10 wherein the sample is selected from the group consisting of a biological sample, an industrial sample, an environmental sample, and a pharmaceutical sample.

16. The method of claim 15 , wherein the biological sample comprises a plurality of different components.

17. The method of claim 10 , wherein the sample comprises a plurality of chemical products.

Assignees

• Purdue Research Foundation

Inventors

• Cooks Robert Graham
• Snyder Dalton

Classifications

• H01J49/429

  Scanning an electric parameter, e.g. voltage amplitude or frequency · CPC title

• H01J49/025

  Detectors specially adapted to particle spectrometers (data acquisition H01J49/0036; detectors per se G01T, e.g. G01T1/28, G01T1/29) · CPC title

• G01N33/6848

  Methods of protein analysis involving mass spectrometry · CPC title

• H01J49/427

  Ejection and selection methods · CPC title

• H01J49/4225 Primary

  Multipole linear ion traps, e.g. quadrupoles, hexapoles · CPC title