Semiconductor chip, debug system, and synchronization method

US12346235B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-12346235-B2
Application numberUS-202318482241-A
CountryUS
Kind codeB2
Filing dateOct 6, 2023
Priority dateNov 21, 2022
Publication dateJul 1, 2025
Grant dateJul 1, 2025

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A semiconductor chip includes a first common marker generating circuit and a second common marker generating circuit. The first common marker generating circuit is configured to send a first request signal to the second common marker generating circuit, the first request signal requesting a common marker to be sent to a second trace memory, and to send the common marker to a first trace memory, when a second request signal is received from the second common marker generating circuit, the second request signal requesting the common marker to be sent to the first trace memory. The second common marker generating circuit is configured to send the common marker to the second trace memory and to send the second request signal to the first common marker generating circuit, if a second core is running a user program at a time when the first request signal is received.

First claim

Opening claim text (preview).

What is claimed is: 1. A semiconductor chip comprising: a first common marker generating circuit configured to send a common marker to a first trace memory, the first trace memory being configured to store trace data from a first core and the common marker; and a second common marker generating circuit configured to send the common marker to a second trace memory, the second trace memory being configured to store trace data from a second core and the common marker, the second core being different from the first core, wherein the common marker allows synchronization between the trace data from the first core with the trace data from the second core, wherein the first common marker generating circuit is configured to send, to the second common marker generating circuit, a first request signal while the first core is running a first user program, the first request signal requesting the second common marker generating circuit to send the common marker to the second trace memory, wherein, upon receiving the first request signal from the first common marker generating circuit while the second core is running a second user program, the second common marker generating circuit is configured to i) send the common marker to the second trace memory and ii) send a second request signal to the first common marker generating circuit, the second request signal requesting the first common marker generating circuit to send the common marker to the second trace memory, and wherein, upon receiving the second request signal from the second common marker generating circuit, the first common marker generating circuit is configured to send the common marker to the first trace memory. 2. The semiconductor chip according to claim 1 , wherein the first common marker generating circuit is configured to send the first request signal at regular intervals while the first core is running the first user program. 3. The semiconductor chip according to claim 2 , wherein the first common marker generating circuit includes: a first counter configured to start counting when the first core starts to run the first user program; and a counter setting register in which a counter value is set, and wherein the first common marker generating circuit is configured to send the first request signal when a counter value of the first counter matches a counter value set in the counter setting register. 4. The semiconductor chip according to claim 3 , further comprising a clock selection circuit configured to select a clock, which is to be input to the first counter, from among a plurality of clocks. 5. The semiconductor chip according to claim 3 , wherein a memory size of the first trace memory and a memory size of the second trace memory are different from each other. 6. A debug system comprising: the semiconductor chip according to claim 1 ; and a host computer configured to display the trace data from the first core and the trace data from the second core in synchronization based on the common marker. 7. The debug system according to claim 6 , wherein the host computer is configured to display a screen on which a first graph indicating running time of a function on the first core and a second graph indicating running time of a function on the second core are synchronized based on the common marker. 8. A synchronization method using a semiconductor chip which includes i) a first common marker generating circuit configured to send a common marker to a first trace memory and ii) a second common marker generating circuit configured to send the common marker to a second trace memory, wherein the first trace memory is configured to store trace data from a first core and the common marker, wherein the second trace memory is configured to store trace data from a second core, wherein the second core is different from the first core, and wherein the common marker allows synchronize between the trace data from the first core with the trace data from the second core, the synchronization method comprising: sending a first request signal from the first common marker generating circuit to the second common marker generating circuit while the first core is running a first user program, the first request signal requesting the second common marker generating circuit to send the common marker to the second trace memory; if upon receiving the first request signal at the second common marker generating circuit from the first common marker generating circuit while the second core is running a second user program, i) sending the common marker from the second common marker generating circuit to the second trace memory and ii) sending a second request signal from the second common marker generating circuit to the first common marker generating circuit, the second request signal requesting the first common marker generating circuit to send the common marker to the first trace memory; and upon receiving the second request signal from the second common marker generating circuit to the first common marker generating circuit-receives the second request signal, sending the common marker from the first common marker generating circuit to the first trace memory. 9. The synchronization method according to claim 8 , further comprising displaying the trace data from the first core and the trace data from the second core in synchronization based on the common marker.

Assignees

Inventors

Classifications

  • Data logging (G06F11/14, G06F11/2205 take precedence) · CPC title

  • G06F11/323Primary

    Visualisation of programs or trace data · CPC title

  • G06F11/348Primary

    Circuit details, i.e. tracer hardware · CPC title

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Frequently asked questions

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What does patent US12346235B2 cover?
A semiconductor chip includes a first common marker generating circuit and a second common marker generating circuit. The first common marker generating circuit is configured to send a first request signal to the second common marker generating circuit, the first request signal requesting a common marker to be sent to a second trace memory, and to send the common marker to a first trace memory,…
Who is the assignee on this patent?
Renesas Electronics Corp
What technology area does this patent fall under?
Primary CPC classification G06F11/323. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Jul 01 2025 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 2 related publications on this page (citations in our corpus or others sharing the same primary CPC).