Resolve path optical sampling architectures

US12332173B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-12332173-B2
Application numberUS-202318108416-A
CountryUS
Kind codeB2
Filing dateFeb 10, 2023
Priority dateSep 29, 2017
Publication dateJun 17, 2025
Grant dateJun 17, 2025

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  1. Title

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  2. Abstract

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  4. Key dates

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  5. First independent claim

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Abstract

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Described here are optical sampling architectures and methods for operation thereof. An optical sampling architecture can be capable of emitting a launch sheet light beam towards a launch region and receiving a detection sheet light beam from a detection region. The launch region can have one dimension that is elongated relative to another dimension. The detection region can also have one dimension elongated relative to another dimension such that the system can selectively accept light having one or more properties (e.g., angle of incidence, beam size, beam shape, etc.). In some examples, the elongated dimension of the detection region can be greater than the elongated dimension of the launch region. In some examples, the system can include an outcoupler array and associated components for creating a launch sheet light beam having light rays with different in-plane launch positions and/or in-plane launch angles.

First claim

Opening claim text (preview).

The invention claimed is: 1. A system comprising: one or more light sources; a plurality of waveguides; at least one outcoupler comprising an outcoupler; a phase control network; a detector; a first reflector; and a system interface including a launch region and a detection region, wherein: the plurality of waveguides are configured to route light generated by the one or more light sources to the at least one outcoupler; the phase control network is configured to control a relative phase of a portion of the light routed by at least one of the plurality of waveguides; the plurality of waveguides terminate at a free propagation region; the first reflector is configured to redirect the light from the plurality of waveguides to the outcoupler; the outcoupler is configured to redirect the light to form a launch beam that exits the system via the launch region; and the detector is positioned to detect a portion of the launch beam that is returned to the system via the detection region. 2. The system of claim 1 , wherein: the first reflector is configured to collimate corresponding portions of the light from each of the plurality of waveguides. 3. The system of claim 1 , comprising: a second reflector configured to redirect the light from the plurality of waveguides to the first reflector. 4. The system of claim 1 , comprising: optics positioned between the at least one outcoupler and the system interface. 5. The system of claim 1 , wherein: the phase control network comprises a plurality of phase shifters. 6. The system of claim 1 , wherein: the phase control network introduces different group delays between different outputs of the plurality of waveguides. 7. The system of claim 1 , wherein: the detection region is a first detection region and the detector is a first detector; the system interface comprises a second detection region; and a second detector is positioned to detect an additional portion of the launch beam that is returned to the system via the second detection region. 8. A method of determining one or more sample properties of a sample using a system, comprising: emitting a launch beam into the sample via a launch region of a system interface of the system, wherein emitting the launch beam comprises: routing light generated by one or more light sources to at least one outcoupler using a plurality of waveguides, wherein a phase control network controls a relative phase of a portion of the light routed by at least one of the plurality of waveguides; and redirecting the light to form the launch beam; receiving a portion of the launch beam that is returned to the system via a detection region of the system interface; measuring the received portion of the launch beam using a detector to generate one or more signals; and determining the one or more sample properties using the one or more signals, wherein emitting the launch beam, wherein: the at least one outcoupler comprises an outcoupler: the plurality of waveguides terminate at a free propagation region; and a first reflector is positioned to redirect the light from the plurality of waveguides to the outcoupler. 9. The method of claim 8 , wherein: the first reflector is configured to collimate corresponding portions of the light from each of the plurality of waveguides. 10. The method of claim 8 , wherein: a second reflector is positioned to redirect the light from the plurality of waveguides to the first reflector. 11. The method of claim 8 , wherein: emitting the launch beam comprises passing the launch beam through optics positioned between the at least one outcoupler and the system interface. 12. The method of claim 8 , wherein: the phase control network comprises a plurality of phase shifters. 13. The method of claim 8 , wherein: the phase control network introduces different group delays between different outputs of the plurality of waveguides. 14. The method of claim 8 , wherein: the detection region is a first detection region and the detector is a first detector; the system interface comprises a second detection region; and a second detector is positioned to detect an additional portion of the launch beam that is returned to the system via the second detection region.

Assignees

Inventors

Classifications

  • Arrangements or apparatus for facilitating the optical investigation · CPC title

  • Modifiable path; multiple paths in one sample · CPC title

  • Optics, miscellaneous · CPC title

  • Multiangle measurement · CPC title

  • G01N21/49Primary

    within a body or fluid · CPC title

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What does patent US12332173B2 cover?
Described here are optical sampling architectures and methods for operation thereof. An optical sampling architecture can be capable of emitting a launch sheet light beam towards a launch region and receiving a detection sheet light beam from a detection region. The launch region can have one dimension that is elongated relative to another dimension. The detection region can also have one dimen…
Who is the assignee on this patent?
Apple Inc
What technology area does this patent fall under?
Primary CPC classification G01N21/49. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Jun 17 2025 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 12 related publications on this page (citations in our corpus or others sharing the same primary CPC).